{"title":"多线TRL校准与一般去嵌入方法比较","authors":"M. Ferndahl, K. Andersson, C. Fager","doi":"10.1109/ARFTG.2009.5278070","DOIUrl":null,"url":null,"abstract":"A direct comparison between a newly proposed general equivalent-circuit-based de-embedding method and a multi-line TRL calibration is presented. It is shown that the de-embedding method yields corrected/ intrinsic S-parameters with good accuracy when compared to the calibration, even up to 100 GHz hence, validating the de-embedding method. Furthermore, in the de-embedding, different equivalent-circuit models with varying complexity for the embedding network are compared and evaluated.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Multi-line TRL calibration compared to a general de-embedding method\",\"authors\":\"M. Ferndahl, K. Andersson, C. Fager\",\"doi\":\"10.1109/ARFTG.2009.5278070\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A direct comparison between a newly proposed general equivalent-circuit-based de-embedding method and a multi-line TRL calibration is presented. It is shown that the de-embedding method yields corrected/ intrinsic S-parameters with good accuracy when compared to the calibration, even up to 100 GHz hence, validating the de-embedding method. Furthermore, in the de-embedding, different equivalent-circuit models with varying complexity for the embedding network are compared and evaluated.\",\"PeriodicalId\":253006,\"journal\":{\"name\":\"2009 73rd ARFTG Microwave Measurement Conference\",\"volume\":\"44 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-06-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 73rd ARFTG Microwave Measurement Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2009.5278070\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 73rd ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2009.5278070","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Multi-line TRL calibration compared to a general de-embedding method
A direct comparison between a newly proposed general equivalent-circuit-based de-embedding method and a multi-line TRL calibration is presented. It is shown that the de-embedding method yields corrected/ intrinsic S-parameters with good accuracy when compared to the calibration, even up to 100 GHz hence, validating the de-embedding method. Furthermore, in the de-embedding, different equivalent-circuit models with varying complexity for the embedding network are compared and evaluated.