{"title":"任意载荷x参数和基于测量的器件模型的非线性验证","authors":"D. Gunyan, J. Horn, Jianjun Xu, D. Root","doi":"10.1109/ARFTG.2009.5278063","DOIUrl":null,"url":null,"abstract":"X-parameters are the mathematically correct supersets of S-parameters valid for nonlinear (and linear) components under large-signal (and small-signal) conditions. This paper compares a PHD model generated from arbitrary load-dependent measured X-parameters and a measurement-based non-quasi-static device model and validates them against tuned-load measurements. CW, IMD, and ACPR swept-power measurements are compared. The models agree on the simulated device behavior and compare well to validation measurements..","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"78 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"19","resultStr":"{\"title\":\"Nonlinear validation of arbitrary load X-parameter and measurement-based device models\",\"authors\":\"D. Gunyan, J. Horn, Jianjun Xu, D. Root\",\"doi\":\"10.1109/ARFTG.2009.5278063\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"X-parameters are the mathematically correct supersets of S-parameters valid for nonlinear (and linear) components under large-signal (and small-signal) conditions. This paper compares a PHD model generated from arbitrary load-dependent measured X-parameters and a measurement-based non-quasi-static device model and validates them against tuned-load measurements. CW, IMD, and ACPR swept-power measurements are compared. The models agree on the simulated device behavior and compare well to validation measurements..\",\"PeriodicalId\":253006,\"journal\":{\"name\":\"2009 73rd ARFTG Microwave Measurement Conference\",\"volume\":\"78 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-06-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"19\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 73rd ARFTG Microwave Measurement Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2009.5278063\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 73rd ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2009.5278063","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Nonlinear validation of arbitrary load X-parameter and measurement-based device models
X-parameters are the mathematically correct supersets of S-parameters valid for nonlinear (and linear) components under large-signal (and small-signal) conditions. This paper compares a PHD model generated from arbitrary load-dependent measured X-parameters and a measurement-based non-quasi-static device model and validates them against tuned-load measurements. CW, IMD, and ACPR swept-power measurements are compared. The models agree on the simulated device behavior and compare well to validation measurements..
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
