Multi-line TRL calibration compared to a general de-embedding method

M. Ferndahl, K. Andersson, C. Fager
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Abstract

A direct comparison between a newly proposed general equivalent-circuit-based de-embedding method and a multi-line TRL calibration is presented. It is shown that the de-embedding method yields corrected/ intrinsic S-parameters with good accuracy when compared to the calibration, even up to 100 GHz hence, validating the de-embedding method. Furthermore, in the de-embedding, different equivalent-circuit models with varying complexity for the embedding network are compared and evaluated.
多线TRL校准与一般去嵌入方法比较
将新提出的基于通用等效电路的去嵌入方法与多线TRL校准方法进行了直接比较。结果表明,与校准相比,去嵌入方法产生的校正/固有s参数具有良好的精度,甚至高达100 GHz,从而验证了去嵌入方法。在去嵌入过程中,对不同复杂度的等效电路模型进行了比较和评价。
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