2006 15th Asian Test Symposium最新文献_第2页

Zero Cost Test Point Insertion Technique to Reduce Test Set Size and Test Generation Time for Structured ASICs 零成本测试点插入技术减少结构化asic的测试集大小和测试生成时间

2006 15th Asian Test Symposium Pub Date : 2006-11-20 DOI: 10.1109/ATS.2006.88

R. Sethuram, Seongmoon Wang, S. Chakradhar, M. Bushnell

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