An Optimum ORA BIST for Multiple Fault FPGA Look-Up Table Testing

Armin Alaghi, Mahnaz Sadoughi Yarandi, Z. Navabi
{"title":"An Optimum ORA BIST for Multiple Fault FPGA Look-Up Table Testing","authors":"Armin Alaghi, Mahnaz Sadoughi Yarandi, Z. Navabi","doi":"10.1109/ATS.2006.25","DOIUrl":null,"url":null,"abstract":"This paper presents BIST architecture for FPGA look-up table testing using a minimum number of logic elements for its ORA. The propagation of faults in the TPGs and CUTs is formulated so that the ORA can detect multiple faults by monitoring a single signal. At the cost of using more cells for the ORA, the granularity of error detection can be reduced to as low as one fault per five LUTs. The increase in the ORA overhead, and thus the untested FPGA areas, can be compensated by more configurations. We will show that 100% test coverage and a maximum granularity can be achieved simultaneously by a reasonable number of FPGA configurations","PeriodicalId":242530,"journal":{"name":"2006 15th Asian Test Symposium","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 15th Asian Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2006.25","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 17

Abstract

This paper presents BIST architecture for FPGA look-up table testing using a minimum number of logic elements for its ORA. The propagation of faults in the TPGs and CUTs is formulated so that the ORA can detect multiple faults by monitoring a single signal. At the cost of using more cells for the ORA, the granularity of error detection can be reduced to as low as one fault per five LUTs. The increase in the ORA overhead, and thus the untested FPGA areas, can be compensated by more configurations. We will show that 100% test coverage and a maximum granularity can be achieved simultaneously by a reasonable number of FPGA configurations
多故障FPGA查找表测试的最佳ORA BIST
本文提出了一种基于BIST架构的FPGA查找表测试方法,该方法使用了最少数量的ORA逻辑元素。提出了故障在TPGs和CUTs中的传播方式,使ORA可以通过监测单个信号来检测多个故障。在为ORA使用更多单元的代价下,错误检测的粒度可以降低到每5个lut中有一个错误。ORA开销的增加,以及未测试的FPGA区域,可以通过更多的配置来补偿。我们将展示100%的测试覆盖率和最大粒度可以通过合理数量的FPGA配置同时实现
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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