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1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)最新文献

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Characterisation of resistance and capacitance standards up to 1 MHz 表征电阻和电容标准高达1mhz
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699746
S. Awan, B. Kibble
{"title":"Characterisation of resistance and capacitance standards up to 1 MHz","authors":"S. Awan, B. Kibble","doi":"10.1109/CPEM.1998.699746","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699746","url":null,"abstract":"New four terminal-pair resistance and capacitance impedance standards are being fabricated for use at high frequencies ranging from 10 kHz to 1 MHz. The standards have been designed to ensure low frequency dependence of their impedance up to 1 MHz. A brief outline of the fabrication of the standards is described. A high frequency four terminal-pair impedance ratio bridge used to characterise these standards is also discussed.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122216654","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
AC high voltage standard of Ukraine 乌克兰交流高压标准
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699870
V. Kopshyn, V. Kikalo, V. Brjetzitsky
{"title":"AC high voltage standard of Ukraine","authors":"V. Kopshyn, V. Kikalo, V. Brjetzitsky","doi":"10.1109/CPEM.1998.699870","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699870","url":null,"abstract":"Herein the structure of AC high voltage standard and methods included in its basis are described. The important role of high harmonized components of voltage and their influence and the way of standard's error expression are considered herein.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128360266","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
A network for verifying AC resistance measuring instruments 用于验证交流电阻测量仪器的网络
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699999
K. Jones
{"title":"A network for verifying AC resistance measuring instruments","authors":"K. Jones","doi":"10.1109/CPEM.1998.699999","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699999","url":null,"abstract":"A resistance network for verifying the accuracy of resistance measuring instruments up described. The network has been instrument accuracies from 50 Hz to 1 MHz. Relative standard uncertainties of the method range from better than 1/spl times/10/sup -6/ at low frequency to 100/spl times/10/sup -6/ at 1 MHz.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126819777","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Test of a space cold atom clock prototype in absence of gravity 太空冷原子钟原型在无重力条件下的测试
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699815
P. Lemonde, P. Laurent, E. Simon, G. Santarelli, A. Clairon, C. Salomon, N. Dimarcq, P. Petit
{"title":"Test of a space cold atom clock prototype in absence of gravity","authors":"P. Lemonde, P. Laurent, E. Simon, G. Santarelli, A. Clairon, C. Salomon, N. Dimarcq, P. Petit","doi":"10.1109/CPEM.1998.699815","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699815","url":null,"abstract":"In space, thanks to micro-gravity conditions, a clock using laser cooled atoms is expected to have a better performance than on Earth. We have constructed a prototype of this space clock. It was tested in the absence of gravity of aircraft parabolic flights, yielding an atomic resonance with a width of 7 Hz, twice narrower than on Earth.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123569618","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
New methods for determining the vacancy and void content of single crystal silicon 测定单晶硅空位和空穴含量的新方法
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.700002
F. Spaepen
{"title":"New methods for determining the vacancy and void content of single crystal silicon","authors":"F. Spaepen","doi":"10.1109/CPEM.1998.700002","DOIUrl":"https://doi.org/10.1109/CPEM.1998.700002","url":null,"abstract":"Summary form only given. Our present understanding of the point defect concentration and atomic transport in pure silicon will be reviewed, with the emphasis on the loss of equilibrium as the temperature is lowered. Diffusion and trapping of \"fast\" impurities in silicon will be reviewed. Interstitial in- and out-diffusion at low temperature of impurities that may be trapped at vacancies and internal surfaces provides new opportunities for characterizing lattice defects.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123611631","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Calibration method for four-terminal-pair capacitance standards: Progress report 四端对电容标准的校准方法:进度报告
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699747
T. Aoki, K. Suzuki, K. Yokoi
{"title":"Calibration method for four-terminal-pair capacitance standards: Progress report","authors":"T. Aoki, K. Suzuki, K. Yokoi","doi":"10.1109/CPEM.1998.699747","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699747","url":null,"abstract":"The paper titled \"A New Universal Calibration Method for Four-Terminal-Pair Admittance Standards\" (1991) described briefly a calibration method for commercially available four-terminal-pair capacitance standards (4TP C STDs). Since we established an accurate calibration method for the 4TP C STDs using a network analyzer and a 1 kHz capacitance bridge, this paper describes the method for a 1000 pF air dielectric 4TP C STD at 10 MHz.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114075413","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Generalized kernels for reconstructing bandlimited functions and their Hilbert transform 重构带限函数的广义核及其希尔伯特变换
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699985
H. Boche, M. Protzmann
{"title":"Generalized kernels for reconstructing bandlimited functions and their Hilbert transform","authors":"H. Boche, M. Protzmann","doi":"10.1109/CPEM.1998.699985","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699985","url":null,"abstract":"This paper introduces generalized kernels to be used with the algorithm for reconstructing bandlimited functions from nonequidistant samples which was previously proposed by the authors. The new kernels turn out to be much more compatible with the requirements of numerical implementation, because they lead to matrices with a significantly reduced condition.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127714744","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A broadband microwave radiometer using correlation technique 采用相关技术的宽带微波辐射计
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.700073
H. Nakano, Y. Kato
{"title":"A broadband microwave radiometer using correlation technique","authors":"H. Nakano, Y. Kato","doi":"10.1109/CPEM.1998.700073","DOIUrl":"https://doi.org/10.1109/CPEM.1998.700073","url":null,"abstract":"A broadband microwave radiometer of the differential type has been designed by adopting a correlation scheme with a quadrature hybrid coupler and its usefulness experimentally evaluated over 6 to 12.4 GHz. The correlator offers in-phase and quadrature-phase outputs. The advantage of this correlator has been investigated.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126367868","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Zero-current voltage oscillations and non-linear transport in Quantum Hall GaAs-AlGaAs heterostructures 量子霍尔GaAs-AlGaAs异质结构中的零电流电压振荡和非线性输运
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699942
J. Sesé, A. Camón, C. Rillo, J. Blanchet, F. Piquernal, G. Genevès
{"title":"Zero-current voltage oscillations and non-linear transport in Quantum Hall GaAs-AlGaAs heterostructures","authors":"J. Sesé, A. Camón, C. Rillo, J. Blanchet, F. Piquernal, G. Genevès","doi":"10.1109/CPEM.1998.699942","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699942","url":null,"abstract":"Zero-current voltage oscillations in Quantum Hall samples have been reported in literature. Its origin is not yet understood. Here we propose a possible explanation based on a thermoelectric effect caused by noise input and local differences in the carrier density near the voltage contacts. Experiments on non-linear transport in GaAs-AlGaAs heterostructures are presented.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125255420","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Direct measurement of standard cells with a Josephson junction array voltage standard 直接测量标准电池与约瑟夫森结阵列电压标准
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.700051
A. Katkov, J. Niemeyer, R. Behr
{"title":"Direct measurement of standard cells with a Josephson junction array voltage standard","authors":"A. Katkov, J. Niemeyer, R. Behr","doi":"10.1109/CPEM.1998.700051","DOIUrl":"https://doi.org/10.1109/CPEM.1998.700051","url":null,"abstract":"The dynamic parameters of standard cells in a circuit for the direct measurement of a standard cell with a Josephson junction array voltage standard were analysed. The parameters of the models of a null-detector and a standard cell were experimentally determined. It was found that it is possible to directly measure a standard cell with a voltage standard, with an uncertainty of about 0.001 ppm.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125617812","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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