1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)最新文献

筛选
英文 中文
An AC voltage standard based on a 1-bit DAC 基于1位DAC的交流电压标准
P. Wright, J. Pickering
{"title":"An AC voltage standard based on a 1-bit DAC","authors":"P. Wright, J. Pickering","doi":"10.1109/CPEM.1998.699844","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699844","url":null,"abstract":"The principle of digitally synthesised AC voltage standards is well established. This paper describes a new AC voltage standard which uses a traceable DC voltage standard as an input and produces an AC output at an equivalent r.m.s. voltage to 1 ppm uncertainty. The system works using digital synthesis with a so called 1-bit digital to analogue convertor (DAC).","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125933511","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Measurement of the 2/sup 3/P/sub 0/-2/sup 3/P/sub 1/ helium fine structure interval 测量2/sup 3/P/sub 0/-2/sup 3/P/sub 1/氦精细结构区间
F. Minardi, G. Blanchini, S. Busoni, P. Concio, G. Giusfredi, F. Pavone, M. Inguscio
{"title":"Measurement of the 2/sup 3/P/sub 0/-2/sup 3/P/sub 1/ helium fine structure interval","authors":"F. Minardi, G. Blanchini, S. Busoni, P. Concio, G. Giusfredi, F. Pavone, M. Inguscio","doi":"10.1109/CPEM.1998.700112","DOIUrl":"https://doi.org/10.1109/CPEM.1998.700112","url":null,"abstract":"In this paper we describe a measurement of the helium 2/sup 3/P/sub 0/-/sup 2/3P/sub 1/ interval, obtained from a full optical approach in an atomic beam of metastable He. Direct frequency determination and control of systematic effects leads to an accuracy of 3 kHz. By comparison with a precise atomic theory, a 50 ppb accurate determination of the fine structure constant /spl alpha/ will be possible.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123312830","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Results from a detailed calculation of the sensitivity of a cryogenic current comparator 对低温电流比较器灵敏度的详细计算结果
M. Early, M. A. V. Dam
{"title":"Results from a detailed calculation of the sensitivity of a cryogenic current comparator","authors":"M. Early, M. A. V. Dam","doi":"10.1109/CPEM.1998.699840","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699840","url":null,"abstract":"A detailed calculation of the sensitivity of a cryogenic current comparator (CCC) has been completed. The model accounts for the current distribution on the closed external shield and the overlapped shield around the windings. Additional refinements to the model lead to excellent agreement with sensitivity measurements for a range of CCC geometries.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123432968","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
A high-frequency thermal power comparator 高频热功率比较器
I. Budovsky, A. Gibbes, D. Arthur
{"title":"A high-frequency thermal power comparator","authors":"I. Budovsky, A. Gibbes, D. Arthur","doi":"10.1109/CPEM.1998.700047","DOIUrl":"https://doi.org/10.1109/CPEM.1998.700047","url":null,"abstract":"A new thermal power comparator (TPC) is described that covers a frequency range from power frequencies to 200 kHz. The TPC features a resistive voltage divider and shunts, and a thermal multiplier with two differential high-impedance inputs. It incorporates novel developments in the method of reducing LF and HF errors in the power comparison.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"74 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125444305","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 41
A cryogenic current comparator bridge for resistance measurements at currents of up to 100 A 一种低温电流比较电桥,用于高达100a电流下的电阻测量
Jonathan M. Williams, P. Kleinschmidt
{"title":"A cryogenic current comparator bridge for resistance measurements at currents of up to 100 A","authors":"Jonathan M. Williams, P. Kleinschmidt","doi":"10.1109/CPEM.1998.699838","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699838","url":null,"abstract":"The use of cryogenic current comparators at NPL has been limited so far to currents of 100 mA. A new current comparator with a maximum current capacity of 100 A has been developed and will form the basis of a resistance ratio bridge for low value resistors with a relative uncertainty of 10/sup -7/ or better.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125569017","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 16
BIPM activities related to realization of the definition of the metre 与实现米制定义相关的BIPM活动
J. Chartier, A. Chartier, R. Felder, R. Goebel, J. Labot, S. Picard, L. Robertsson, L. Vitushkin, A. Zarka
{"title":"BIPM activities related to realization of the definition of the metre","authors":"J. Chartier, A. Chartier, R. Felder, R. Goebel, J. Labot, S. Picard, L. Robertsson, L. Vitushkin, A. Zarka","doi":"10.1109/CPEM.1998.699914","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699914","url":null,"abstract":"The results are presented of frequency comparisons of laser radiations at /spl lambda//spl ap/3.39 /spl mu/m, /spl lambda//spl ap/633 nm, and /spl lambda//spl ap/515 nm used for the realization of the metre. Work on lasers at /spl lambda/=532 nm, recently recommended by the CIPM, and on iodine-stabilized extended-cavity diode laser at 633 nm are described. Activities in gravimetry and in nanometrology are also presented.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126734591","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Monolithic cw optical parametric oscillators for optical frequency measurement 用于光学频率测量的单片连续波参量振荡器
T. Ikegami, S. Slyusarev, S. Ohshima
{"title":"Monolithic cw optical parametric oscillators for optical frequency measurement","authors":"T. Ikegami, S. Slyusarev, S. Ohshima","doi":"10.1109/CPEM.1998.700009","DOIUrl":"https://doi.org/10.1109/CPEM.1998.700009","url":null,"abstract":"In order to use as a light source for optical frequency measurement, we developed a doubly resonant, monolithic cw optical parametric oscillator, which is characterized by a low threshold and a capability of stable long term operation.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114886950","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Behavior of the Kramers-Kronig relation for measurement noise 测量噪声的Kramers-Kronig关系的行为
H. Boche, M. Protzmann, H. Schreiber
{"title":"Behavior of the Kramers-Kronig relation for measurement noise","authors":"H. Boche, M. Protzmann, H. Schreiber","doi":"10.1109/CPEM.1998.699781","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699781","url":null,"abstract":"In this paper the behavior of Kramers-Kronig relation is investigated. In practice measurements are used to calculate the Kramers-Kronig integral. Several integration procedures to solve this integral are discussed in the literature. However, the results of such procedures are often quite sensitive to the form of the measurement noise. It is the aim of this paper to clarify the influence of the measurement noise.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115472155","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A first attempt to realize (multiple-QHE devices)-series array resistance standards 首次尝试实现(多qhe器件)串联阵列电阻标准
F. Piquemal, J. Blanchet, G. Genevès, J. André
{"title":"A first attempt to realize (multiple-QHE devices)-series array resistance standards","authors":"F. Piquemal, J. Blanchet, G. Genevès, J. André","doi":"10.1109/CPEM.1998.699977","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699977","url":null,"abstract":"This paper shows that the possibility exists to fabricate a single chip of 7.5/spl times/5.5 mm/sup 2/ composed of several QHE devices having the same density and mobility. Metrological characteristics of some samples with devices placed in series are described.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"78 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115579242","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 37
Equivalence of calibration certificates between EUROMET and NIST EUROMET和NIST之间的校准证书等效
H. Simonsen, K. Carneiro, S. Carpenter, L. Erard, A. Henson, R. Kaarls, V. Kose, T. Quinn, M. Vidigal, A. Wallard
{"title":"Equivalence of calibration certificates between EUROMET and NIST","authors":"H. Simonsen, K. Carneiro, S. Carpenter, L. Erard, A. Henson, R. Kaarls, V. Kose, T. Quinn, M. Vidigal, A. Wallard","doi":"10.1109/CPEM.1998.699886","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699886","url":null,"abstract":"The present status of a database based on comparison projects performed under EUROMET, as well as results for comparisons between NIST and EUROMET members, will be presented. The database is the result of a project to establish and validate a framework within which calibration certificates from NMIs in EU and NIST could be regarded as mutually equivalent. This equivalence would be accepted by regulatory bodies in the EU and USA for purposes of traceability requirements in regulation trade etc. based on comparisons between NMI's.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114383522","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信