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1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)最新文献

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Calibration comparison for vector network analyzers with switching errors 具有切换误差的矢量网络分析仪的校准比较
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.700020
R. Marks
{"title":"Calibration comparison for vector network analyzers with switching errors","authors":"R. Marks","doi":"10.1109/CPEM.1998.700020","DOIUrl":"https://doi.org/10.1109/CPEM.1998.700020","url":null,"abstract":"This paper demonstrates a method for comparing vector network analyzer calibrations in which each parameter in the error model, including the switch terms, may vary. This extends earlier calibration comparison methods that assume the switch terms to be fixed. The method is therefore applicable even to common methods that do not measure the switch terms directly and may therefore determine them erroneously.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"195 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134398313","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Compact frequency standard at 192.6 THz (1556 nm) based on the 5S-5D two-photon transition in rubidium at 778 nm 基于778 nm铷中5S-5D双光子跃迁的192.6 THz (1556 nm)紧凑频率标准
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699918
M. Poulin, C. Latrasse, D. Touahri, M. Tetu, P. Tremblay
{"title":"Compact frequency standard at 192.6 THz (1556 nm) based on the 5S-5D two-photon transition in rubidium at 778 nm","authors":"M. Poulin, C. Latrasse, D. Touahri, M. Tetu, P. Tremblay","doi":"10.1109/CPEM.1998.699918","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699918","url":null,"abstract":"We present our recent results toward the realization of an absolute frequency standard at 1556 nm based on the two-photon transition in rubidium at 778 nm. A compact transportable absolute frequency standard is described. Emphasis is put on the design of a periodically poled lithium niobate waveguide for efficient second-harmonic generation.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"100 5 Pt 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134438688","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Temperature compensated cryogenic whispering gallery mode resonator for microwave frequency standard applications 温度补偿低温低语走廊模式谐振器微波频率标准应用
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699777
L. Hao, N. Klein, J. Gallop, W. Radcliffe, I. Ghosh
{"title":"Temperature compensated cryogenic whispering gallery mode resonator for microwave frequency standard applications","authors":"L. Hao, N. Klein, J. Gallop, W. Radcliffe, I. Ghosh","doi":"10.1109/CPEM.1998.699777","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699777","url":null,"abstract":"We have investigated a miniature composite dielectric resonator employing a sapphire puck and a single crystalline platelet of rutile, excited in a whispering gallery mode. We have achieved values of the Allan variance as low as 4/spl times/10/sup -12/ for an integration time of 1000 seconds with the prototype system.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133275699","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 20
Critical aspects of scanning X-ray/optical interferometry 扫描x射线/光学干涉测量的关键方面
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699962
A. Bergamin, G. Cavagnero, G. Mana, G. Zosi
{"title":"Critical aspects of scanning X-ray/optical interferometry","authors":"A. Bergamin, G. Cavagnero, G. Mana, G. Zosi","doi":"10.1109/CPEM.1998.699962","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699962","url":null,"abstract":"We are presently developing and testing an X-ray and optical interferometer capable of millimeter scans. Our goal is to reduce the relative uncertainty in the measurement of the (220) lattice spacing of a silicon crystal to a few parts in 10/sup 9/. In a new series of measurements, the value obtained with our previous experimental set-up is confirmed and the bounds to the measurement uncertainty are investigated.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133415617","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Interference effects on the spectroscopic measurement of radiation temperature 辐射温度光谱测量中的干扰效应
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699936
S. Uǧur, S. Oguz
{"title":"Interference effects on the spectroscopic measurement of radiation temperature","authors":"S. Uǧur, S. Oguz","doi":"10.1109/CPEM.1998.699936","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699936","url":null,"abstract":"An earlier work investigation of a photodiode spectroscopic system for radiation temperature measurements has revealed interference patterns in the radiometric data. This work will report the results of radiometric measurements, demonstrate the interference effects, investigate their origin and discuss the uncertainty introduced to the temperature determined due to the interference fringes.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"143 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133928123","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Towards a cheaper, simpler quantized Hall resistance standard 朝着更便宜，更简单的量子化霍尔电阻标准
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699939
A. D. Inglis
{"title":"Towards a cheaper, simpler quantized Hall resistance standard","authors":"A. D. Inglis","doi":"10.1109/CPEM.1998.699939","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699939","url":null,"abstract":"We have produced and characterised devices suitable for accurate quantum Hall resistor (QHR) measurements at fields below 8 T, and temperatures of 1.2-1.5 K. We have made accurate comparisons of QHR devices with wirewound resistors using commercially available room-temperature dc current-comparator bridges. These two results imply that it is possible to assemble an accurate, but relatively cheap and simple to operate, QHR standard.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123911900","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A frequency standard based on a continuous beam of laser cooled atoms 一种基于激光冷却原子的连续光束的频率标准
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699817
P. Berthoud, A. Joyet, P. Thomann, G. Dudle
{"title":"A frequency standard based on a continuous beam of laser cooled atoms","authors":"P. Berthoud, A. Joyet, P. Thomann, G. Dudle","doi":"10.1109/CPEM.1998.699817","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699817","url":null,"abstract":"A frequency standard based on a continuous beam of laser cooled atoms as an alternative to a pulsed scheme of an atomic fountain is currently investigated. A general overview of such a device and its main parts are presented. Two mechanisms of continuous extraction of atoms from an anisotropic magneto-optical trap are experimentally demonstrated. Stability and accuracy issues are discussed.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"130 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115895083","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A system for the measurement of complex voltage ratios at industrial frequencies 一种在工业频率上测量复杂电压比的系统
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699866
U. Pogliano, G. Bosco, G. La Paglia
{"title":"A system for the measurement of complex voltage ratios at industrial frequencies","authors":"U. Pogliano, G. Bosco, G. La Paglia","doi":"10.1109/CPEM.1998.699866","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699866","url":null,"abstract":"A system for the measurement of complex voltage ratios has been set up. It consists of two synchronised sampling voltmeters and a suitable software program that performs the acquisition and the determination of the two voltages and the phase difference. The results show that the system can be satisfactorily used in many types of precision measurement at industrial frequency.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"134 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116338290","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
AC and DC voltage source using quantized pulses 交流和直流电压源采用量化脉冲
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.699991
S. P. Benz, C. Hamilton, C. Burroughs, L. Christian, T. Harvey
{"title":"AC and DC voltage source using quantized pulses","authors":"S. P. Benz, C. Hamilton, C. Burroughs, L. Christian, T. Harvey","doi":"10.1109/CPEM.1998.699991","DOIUrl":"https://doi.org/10.1109/CPEM.1998.699991","url":null,"abstract":"We have developed an accurate synthesized voltage source for AC and DC metrology, based on the quantized pulses of Josephson junctions. We demonstrated this technique in experiments with arrays of junctions clocked at 6 Gbit/s and synthesized sine waves with millivolt amplitudes at frequencies up to 1 MHz.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"90 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116825213","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Effect of substrate thickness and permittivity on the characteristics of rectangular microstrip antenna 衬底厚度和介电常数对矩形微带天线特性的影响
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI: 10.1109/CPEM.1998.700074
S. Fatima Farida, P. Hadalgi, P. Hunagund, S. Rafath Ara
{"title":"Effect of substrate thickness and permittivity on the characteristics of rectangular microstrip antenna","authors":"S. Fatima Farida, P. Hadalgi, P. Hunagund, S. Rafath Ara","doi":"10.1109/CPEM.1998.700074","DOIUrl":"https://doi.org/10.1109/CPEM.1998.700074","url":null,"abstract":"The most important factors in design of microstrip circuit and antenna are choice of the best substrate thickness and the dielectric constant to have low losses. Most of the work on microstrip antenna in the past, employed electrically thin and low permittivity substrates. In this case an attempt has been made by selecting various dielectric constants and thicknesses to study various parameters. For this, a rectangular microstrip antenna (RMSA) is designed in X-band at 9.2 GHz and fabricated on different substrates ranging dielectric constant between 2.20 to 10.20 and thickness ranging 0.635 mm to 1.574 mm. The return loss of of the order of -43 dB is also observed at the designed frequency. The bandwidth in between 4% to 20% was observed.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117060113","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
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