{"title":"直接测量标准电池与约瑟夫森结阵列电压标准","authors":"A. Katkov, J. Niemeyer, R. Behr","doi":"10.1109/CPEM.1998.700051","DOIUrl":null,"url":null,"abstract":"The dynamic parameters of standard cells in a circuit for the direct measurement of a standard cell with a Josephson junction array voltage standard were analysed. The parameters of the models of a null-detector and a standard cell were experimentally determined. It was found that it is possible to directly measure a standard cell with a voltage standard, with an uncertainty of about 0.001 ppm.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Direct measurement of standard cells with a Josephson junction array voltage standard\",\"authors\":\"A. Katkov, J. Niemeyer, R. Behr\",\"doi\":\"10.1109/CPEM.1998.700051\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The dynamic parameters of standard cells in a circuit for the direct measurement of a standard cell with a Josephson junction array voltage standard were analysed. The parameters of the models of a null-detector and a standard cell were experimentally determined. It was found that it is possible to directly measure a standard cell with a voltage standard, with an uncertainty of about 0.001 ppm.\",\"PeriodicalId\":239228,\"journal\":{\"name\":\"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)\",\"volume\":\"17 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-07-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CPEM.1998.700051\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.1998.700051","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Direct measurement of standard cells with a Josephson junction array voltage standard
The dynamic parameters of standard cells in a circuit for the direct measurement of a standard cell with a Josephson junction array voltage standard were analysed. The parameters of the models of a null-detector and a standard cell were experimentally determined. It was found that it is possible to directly measure a standard cell with a voltage standard, with an uncertainty of about 0.001 ppm.