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2014 IEEE Radiation Effects Data Workshop (REDW)最新文献

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Radiation Effects Characterization of a High Density SSRAM 高密度SSRAM的辐射效应表征
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004581
C. Hafer, J. Mabra, C. Mnich, M. Leslie, A. Jordan
{"title":"Radiation Effects Characterization of a High Density SSRAM","authors":"C. Hafer, J. Mabra, C. Mnich, M. Leslie, A. Jordan","doi":"10.1109/REDW.2014.7004581","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004581","url":null,"abstract":"A high density 64/80/96-Mbit SSRAM has been designed, manufactured, and characterized for radiation effects. The device is SEL immune, has an error rate less than 1x10-15 errors/bit-day, and is TID tolerant to 100 krad(Si).","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132745732","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analysis of Geostationary and Polar Orbit Space Environment Data Processed by the Russian Federal Space Agency (Roscosmos) Monitoring System 俄罗斯联邦航天局(Roscosmos)监测系统处理的地球静止和极轨空间环境数据分析
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004553
V. Anashin, G. Protopopov, P. Shatov, S. V. Tasenko
{"title":"Analysis of Geostationary and Polar Orbit Space Environment Data Processed by the Russian Federal Space Agency (Roscosmos) Monitoring System","authors":"V. Anashin, G. Protopopov, P. Shatov, S. V. Tasenko","doi":"10.1109/REDW.2014.7004553","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004553","url":null,"abstract":"Analysis of the flight data obtained with spectrometers placed on several spacecrafts are presented. Flight data are compared with trapped and solar particles space models including AX8, AX9, CRRESELE, JPL, Psychic, Rosenquist, Nymmik.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130077732","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
TID Test Results of Optical Materials and Photodiodes for SIS Instrument (Dreams Project) SIS仪器光学材料及光电二极管TID测试结果(梦想计划)
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004603
M. Álvarez, C. Hernando, J. J. Jiménez, F. J. Álvarez, I. Martín, D. Escribano
{"title":"TID Test Results of Optical Materials and Photodiodes for SIS Instrument (Dreams Project)","authors":"M. Álvarez, C. Hernando, J. J. Jiménez, F. J. Álvarez, I. Martín, D. Escribano","doi":"10.1109/REDW.2014.7004603","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004603","url":null,"abstract":"The sensitivity to total dose of optical materials and custom photodiodes candidates for EXOMARS 2016 is studied. Tested materials include: Teflon®, Delrin® and five different optical filter glasses from Schottt and Optics Balzers Jena.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130381856","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Swift Heavy Ion Irradiation Capabilities at the National Superconducting Cyclotron Laboratory at Michigan State University 密歇根州立大学国家超导回旋加速器实验室的快速重离子辐照能力
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004597
A. Stolz, G. Bollen, D. Leitner, W. Mittig, F. Pellemoine, R. Ronningen, M. Steiner
{"title":"Swift Heavy Ion Irradiation Capabilities at the National Superconducting Cyclotron Laboratory at Michigan State University","authors":"A. Stolz, G. Bollen, D. Leitner, W. Mittig, F. Pellemoine, R. Ronningen, M. Steiner","doi":"10.1109/REDW.2014.7004597","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004597","url":null,"abstract":"The irradiation capabilities at the National Superconducting Cyclotron Laboratory at Michigan State University with ions from hydrogen to uranium with energies of up to 170 MeV/u for material science and single-event effect testing are discussed.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129440574","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Radiation Effects in Thermal Image Sensors for Earth Observation Missions 地球观测任务用热像传感器的辐射效应
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004582
L. Gomez Rojas, T. Clatworthy, M. Skipper, Mark Chang, N. Nelms, A. Pérez Albiñana
{"title":"Radiation Effects in Thermal Image Sensors for Earth Observation Missions","authors":"L. Gomez Rojas, T. Clatworthy, M. Skipper, Mark Chang, N. Nelms, A. Pérez Albiñana","doi":"10.1109/REDW.2014.7004582","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004582","url":null,"abstract":"Cobalt60 and heavy ion irradiations of the ULIS UL03041 thermal infrared image sensor were performed to assess its reliability during ESA's EarthCARE mission. Devices were tested up to 10 krad(Si) and 40 MeV/mg/cm2 LET. The sensors have acceptable performance up to at least 10 krad(Si) and are susceptible to SEL down to a LETs of 15.9 MeV/mg/cm2 with an estimated threshold at 12.1 MeV/mg/cm2.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117010440","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Femtosecond Laser Simulation Facility for SEE IC Testing 用于SEE IC测试的飞秒激光模拟设备
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004570
A. N. Egorov, A. Chumakov, O. B. Mavritskiy, A. Pechenkin, D. Savchenkov, V. A. Telets, A. Yanenko
{"title":"Femtosecond Laser Simulation Facility for SEE IC Testing","authors":"A. N. Egorov, A. Chumakov, O. B. Mavritskiy, A. Pechenkin, D. Savchenkov, V. A. Telets, A. Yanenko","doi":"10.1109/REDW.2014.7004570","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004570","url":null,"abstract":"The new SEE laser simulation facility based on femtosecond laser source with tunable pulse duration is presented, and its most important features are discussed. The influence of laser pulse duration on simulation results is observed.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"14 8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122590144","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Total Ionizing Dose Characterization of 65 nm Flash-Based FPGA 基于65nm闪存的FPGA总电离剂量表征
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004606
N. Rezzak, Jih-Jong Wang, Chang-Kai Huang, V. Nguyen, G. Bakker
{"title":"Total Ionizing Dose Characterization of 65 nm Flash-Based FPGA","authors":"N. Rezzak, Jih-Jong Wang, Chang-Kai Huang, V. Nguyen, G. Bakker","doi":"10.1109/REDW.2014.7004606","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004606","url":null,"abstract":"New 65 nm flash-based field programmable gate array with system-on-chip capability is introduced. We present recent Total Ionizing Dose tests results on Smart Fusion 2 Flash-based FPGAs. TID effects at the device and product level are presented and discussed.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132513302","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 20
Commercial Light Emitting Diodes Sensitivity to Protons Radiations: IEEE Radiation Effects Data Workshop Record 商用发光二极管对质子辐射的敏感性:IEEE辐射效应数据研讨会记录
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004557
M. Boutillier, O. Gilard, G. Quadri, S. Lhuillier, L. S. How, S. Hernandez
{"title":"Commercial Light Emitting Diodes Sensitivity to Protons Radiations: IEEE Radiation Effects Data Workshop Record","authors":"M. Boutillier, O. Gilard, G. Quadri, S. Lhuillier, L. S. How, S. Hernandez","doi":"10.1109/REDW.2014.7004557","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004557","url":null,"abstract":"In this study, we report in protons radiations damages on Europeans manufactured Commercial Of The Shelf (COTS) Light Emitting Diodes (LED). The aim of this study was to assess the potentiality of such devices for space applications. In total, fifteen references coming from three different manufacturers have been tested. All devices have been stepirradiated with 50 MeV protons, up to a fluence of 2.5 1012 protons/cm2. Light output, I-V characteristics and emission spectra were measured.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126705770","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Altitude and Underground Real-Time SER Testing of SRAMs Manufactured in CMOS Bulk 130, 65 and 40 nm 130,65和40nm CMOS批量制造的sram的高空和地下实时SER测试
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004512
J. Autran, D. Munteanu, S. Sauze, G. Gasiot, P. Roche
{"title":"Altitude and Underground Real-Time SER Testing of SRAMs Manufactured in CMOS Bulk 130, 65 and 40 nm","authors":"J. Autran, D. Munteanu, S. Sauze, G. Gasiot, P. Roche","doi":"10.1109/REDW.2014.7004512","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004512","url":null,"abstract":"Real-time (life) testing of the soft-error rate (SER) is an experimental reliability technique to determine the soft error sensitivity of a given component, circuit or system from the monitoring of a population of devices subjected to natural radiation and operating under nominal conditions. We present here a survey of real-time testing results accumulated from 2006 at mountain altitude on the Altitude SEE Test European Platform (ASTEP) and underground at the Underground Laboratory of Modane (LSM). Radiation data concern three generations of SRAMs manufactured in CMOS 130, 65 and 40 nm technologies.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121489248","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Single-Event Effects in Low-Cost, Low-Power Microprocessors 低成本、低功耗微处理器中的单事件效应
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004596
H. Quinn, T. Fairbanks, J. Tripp, G. Duran, Beatrice Lopez
{"title":"Single-Event Effects in Low-Cost, Low-Power Microprocessors","authors":"H. Quinn, T. Fairbanks, J. Tripp, G. Duran, Beatrice Lopez","doi":"10.1109/REDW.2014.7004596","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004596","url":null,"abstract":"ARMs and microcontrollers are low-cost, low-power microprocessors that are frequently used in embedded computing. While not immune to the naturally occurring radiation environment in space, these microprocessors can be worthwhile replacements for space-grade microprocessors for non-mission-critical computational tasks. In this paper results from radiation testing for several available ARMs and microcontrollers are presented.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122104066","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 49
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