商用发光二极管对质子辐射的敏感性:IEEE辐射效应数据研讨会记录

2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI:10.1109/REDW.2014.7004557

M. Boutillier, O. Gilard, G. Quadri, S. Lhuillier, L. S. How, S. Hernandez

{"title":"商用发光二极管对质子辐射的敏感性:IEEE辐射效应数据研讨会记录","authors":"M. Boutillier, O. Gilard, G. Quadri, S. Lhuillier, L. S. How, S. Hernandez","doi":"10.1109/REDW.2014.7004557","DOIUrl":null,"url":null,"abstract":"In this study, we report in protons radiations damages on Europeans manufactured Commercial Of The Shelf (COTS) Light Emitting Diodes (LED). The aim of this study was to assess the potentiality of such devices for space applications. In total, fifteen references coming from three different manufacturers have been tested. All devices have been stepirradiated with 50 MeV protons, up to a fluence of 2.5 1012 protons/cm2. Light output, I-V characteristics and emission spectra were measured.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Commercial Light Emitting Diodes Sensitivity to Protons Radiations: IEEE Radiation Effects Data Workshop Record\",\"authors\":\"M. Boutillier, O. Gilard, G. Quadri, S. Lhuillier, L. S. How, S. Hernandez\",\"doi\":\"10.1109/REDW.2014.7004557\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this study, we report in protons radiations damages on Europeans manufactured Commercial Of The Shelf (COTS) Light Emitting Diodes (LED). The aim of this study was to assess the potentiality of such devices for space applications. In total, fifteen references coming from three different manufacturers have been tested. All devices have been stepirradiated with 50 MeV protons, up to a fluence of 2.5 1012 protons/cm2. Light output, I-V characteristics and emission spectra were measured.\",\"PeriodicalId\":223557,\"journal\":{\"name\":\"2014 IEEE Radiation Effects Data Workshop (REDW)\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-07-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 IEEE Radiation Effects Data Workshop (REDW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/REDW.2014.7004557\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW.2014.7004557","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 3

摘要

在本研究中，我们报道了欧洲生产的商用货架(COTS)发光二极管(LED)的质子辐射损伤。这项研究的目的是评估这种装置在空间应用方面的潜力。总共有来自三家不同制造商的15个参考文献进行了测试。所有装置都用50 MeV的质子进行阶梯辐射，达到2.5 1012个质子/cm2。测量了光输出、I-V特性和发射光谱。

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Commercial Light Emitting Diodes Sensitivity to Protons Radiations: IEEE Radiation Effects Data Workshop Record

In this study, we report in protons radiations damages on Europeans manufactured Commercial Of The Shelf (COTS) Light Emitting Diodes (LED). The aim of this study was to assess the potentiality of such devices for space applications. In total, fifteen references coming from three different manufacturers have been tested. All devices have been stepirradiated with 50 MeV protons, up to a fluence of 2.5 1012 protons/cm2. Light output, I-V characteristics and emission spectra were measured.

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2014 IEEE Radiation Effects Data Workshop (REDW)

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