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2014 IEEE Radiation Effects Data Workshop (REDW)最新文献

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Single Event Effects in Power MOSFETs and IGBTs Due to 14 MeV and 25 meV Neutrons 14 MeV和25 MeV中子对功率mosfet和igbt的单事件效应
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004592
D. Lambert, F. Desnoyers, D. Thouvenot, B. Azais
{"title":"Single Event Effects in Power MOSFETs and IGBTs Due to 14 MeV and 25 meV Neutrons","authors":"D. Lambert, F. Desnoyers, D. Thouvenot, B. Azais","doi":"10.1109/REDW.2014.7004592","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004592","url":null,"abstract":"Single Event Effect (SEE) characterizations under 14 MeV and 25 meV neutrons are presented for various commercial power electronic components: power metal-oxide-semiconductor field effect transistors (MOSFET) and insulated gate bipolar transistors (IGBT).","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124258566","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Radiation Tolerance Assessment of Commercial ZigBee Wireless Modules 商用ZigBee无线模块的辐射容限评估
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004584
R. Gomaa, I. Adly, K. Sharshar, A. Safwat, H. Ragai
{"title":"Radiation Tolerance Assessment of Commercial ZigBee Wireless Modules","authors":"R. Gomaa, I. Adly, K. Sharshar, A. Safwat, H. Ragai","doi":"10.1109/REDW.2014.7004584","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004584","url":null,"abstract":"WSN deployment for monitoring nuclear environment has recently addressed as incremental and experimental networks. The work objective is to determine dose tolerance of commercially wireless Zigbee modules in nuclear embedded applications, with gamma irradiation fluxes.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"283 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116090939","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Single Event Effects Characterization of Texas Instruments ADC12D1600CCMLS, 12 Bit, 3.2 GSPS Analog-to-Digital Converter with Static and Dynamic Inputs 美国德州仪器ADC12D1600CCMLS, 12位，3.2 GSPS静态和动态输入模数转换器的单事件效应特性
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004591
K. Kruckmeyer, T. Trinh
{"title":"Single Event Effects Characterization of Texas Instruments ADC12D1600CCMLS, 12 Bit, 3.2 GSPS Analog-to-Digital Converter with Static and Dynamic Inputs","authors":"K. Kruckmeyer, T. Trinh","doi":"10.1109/REDW.2014.7004591","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004591","url":null,"abstract":"Texas Instruments' ADC12D1600CCMLS is a dual channel, 12b Analog-to-Digital Converter that can support conversion rates up to 1.6 gigasamples per second (GSPS). The two channels can be seamlessly interleaved for conversion rates up to 3.2 GSPS. The device was put through heavy ion testing and was monitored for Single Event Latch-up, Single Event Functional Interrupt and Single Event Upset (SEU). Testing was done at two different ion energies and the impact of ion energy on SEU response is evaluated. SEU testing was performed with both static and dynamic inputs and the SEU signatures of each are compared.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129420445","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Compendium of Ball Aerospace TID, DDD, and SEE Test Results 球航天TID, DDD和SEE测试结果汇编
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004558
R. Horton, T. Oldham, J. Lee, R. Davies, R. Koga, D. Chen
{"title":"Compendium of Ball Aerospace TID, DDD, and SEE Test Results","authors":"R. Horton, T. Oldham, J. Lee, R. Davies, R. Koga, D. Chen","doi":"10.1109/REDW.2014.7004558","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004558","url":null,"abstract":"We have conducted TID, DDD, and SEE test results on a variety of parts intended for application in different Ball Aerospace systems. Results and Discussion are presented.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128517839","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
First Successful SEE Measurements with Heavy Ions in Brazil 巴西首次用重离子成功测量SEE
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004571
N. Medina, M. Silveira, N. Added, V. Aguiar, R. Giacomini, E. Macchione, M. D. de Melo, R. Santos, L. Seixas
{"title":"First Successful SEE Measurements with Heavy Ions in Brazil","authors":"N. Medina, M. Silveira, N. Added, V. Aguiar, R. Giacomini, E. Macchione, M. D. de Melo, R. Santos, L. Seixas","doi":"10.1109/REDW.2014.7004571","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004571","url":null,"abstract":"In this work, the first successful SEE measurements with heavy ions in Brazil is reported. The heavy ions were produced at the São Paulo 8 UD Pelletron accelerator. <sup>12</sup>C, <sup>16</sup>O, <sup>19</sup>F, <sup>28</sup>Si, <sup>35</sup>Cl, <sup>63</sup>Cu and <sup>107</sup>Ag heavy ion beams were used to test a commercial off-the-shelf transistor. During irradiation, the response of a pMOS transistor was continuously monitored to measure the SEE events. In order to achieve a uniform low intensity beam the heavy ions were Rutherford scattered at 15<sup>0</sup> by a 275 μg/cm<sup>2</sup> gold foil.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114623573","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Single-Event Characterization of the 28 nm Xilinx Kintex-7 Field-Programmable Gate Array under Heavy Ion Irradiation 28nm Xilinx Kintex-7现场可编程门阵列在重离子辐照下的单事件表征
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004595
David Lee, M. Wirthlin, G. Swift, A. Le
{"title":"Single-Event Characterization of the 28 nm Xilinx Kintex-7 Field-Programmable Gate Array under Heavy Ion Irradiation","authors":"David Lee, M. Wirthlin, G. Swift, A. Le","doi":"10.1109/REDW.2014.7004595","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004595","url":null,"abstract":"This study examines the single-event response of the Xilinx 28 nm Kintex-7 FPGA irradiated with heavy ions. Results for single-event effects on configuration SRAM cells, user-accessible Flip-Flop cells, and BlockRAM™ memory are provided. This study also describes an unconventional single event latch-up signature observed during testing.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121651298","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 79
FEAST2: A Radiation and Magnetic Field Tolerant Point-of-Load Buck DC/DC Converter FEAST2:一种辐射和磁场容忍负载点降压DC/DC变换器
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004569
F. Faccio, G. Blanchot, C. Fuentes, S. Michelis, S. Orlandi, S. Saggini, I. Troyano
{"title":"FEAST2: A Radiation and Magnetic Field Tolerant Point-of-Load Buck DC/DC Converter","authors":"F. Faccio, G. Blanchot, C. Fuentes, S. Michelis, S. Orlandi, S. Saggini, I. Troyano","doi":"10.1109/REDW.2014.7004569","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004569","url":null,"abstract":"In view of application in upgraded particles detectors at the LHC accelerator, CERN has developed a radiation and magnetic field tolerant 10W Point-Of-Load (POL) buck DC/DC converter. The DCDC is based on FEAST2, an ASIC designed using 'Hardness-By- Design' (HBD) techniques in a selected commercial high voltage CMOS technology. The main features of the circuit, together with electrical characterization as well as radiation data for TID, Displacement Damage (DD) and SEEs are presented. FEAST2 meets all the requirements of the LHC experiments and is also a possible good candidate for applications in Space.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128002961","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 23
Effects of gamma-Ray Radiation on Magnetic Properties of NdFeB and SmCo Permanent Magnets for Space Applications 伽玛射线辐射对空间用钕铁硼和钐钴永磁体磁性能的影响
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004566
J. Mesa, Ana B. Fernández, C. Hernando, M. McHenry, C. Aroca, M. T. Alvarez, M. Díaz-Michelena
{"title":"Effects of gamma-Ray Radiation on Magnetic Properties of NdFeB and SmCo Permanent Magnets for Space Applications","authors":"J. Mesa, Ana B. Fernández, C. Hernando, M. McHenry, C. Aroca, M. T. Alvarez, M. Díaz-Michelena","doi":"10.1109/REDW.2014.7004566","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004566","url":null,"abstract":"Several samples of NdFeB and SmCo permanent magnets have been irradiated with gamma rays up to different total irradiation doses until 1Mrad(Si). Magnetic properties of the samples have been measured at different temperatures before and after irradiation. The modifications of the magnetic parameters are presented. From these results it is highlighted which permanent magnets show more resistance to radiation and are more suitable to be included in devices for space applications or high radiation environments.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"109 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114771315","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
ELDRS Characterization of Texas Instruments LM185, 1.2V Precision Reference: Retrograde Behavior Demonstrates Why Taking Interim Test Points Is Important 德州仪器LM185的ELDRS特性，1.2V精度基准:逆行行为证明了为什么采取临时测试点是重要的
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004567
K. Kruckmeyer, T. Trinh
{"title":"ELDRS Characterization of Texas Instruments LM185, 1.2V Precision Reference: Retrograde Behavior Demonstrates Why Taking Interim Test Points Is Important","authors":"K. Kruckmeyer, T. Trinh","doi":"10.1109/REDW.2014.7004567","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004567","url":null,"abstract":"The LM185 1.2V reference voltage degraded through total ionizing dose radiation, but began to recover at around 70 krad. The recovery curve was different for high and low dose rates and biased and unbiased test conditions.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115100116","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
The Behavior of SEE Sensitivity at Various TID Levels 不同TID水平下SEE灵敏度的行为
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004599
A. A. Novikov, A. Pechenkin, A. Chumakov
{"title":"The Behavior of SEE Sensitivity at Various TID Levels","authors":"A. A. Novikov, A. Pechenkin, A. Chumakov","doi":"10.1109/REDW.2014.7004599","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004599","url":null,"abstract":"SEU, SEL and SET sensitivity estimation results using laser technique in dependency of TID effects are presented and discussed.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129810812","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
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