Single Event Effects Characterization of Texas Instruments ADC12D1600CCMLS, 12 Bit, 3.2 GSPS Analog-to-Digital Converter with Static and Dynamic Inputs

Abstract

Texas Instruments' ADC12D1600CCMLS is a dual channel, 12b Analog-to-Digital Converter that can support conversion rates up to 1.6 gigasamples per second (GSPS). The two channels can be seamlessly interleaved for conversion rates up to 3.2 GSPS. The device was put through heavy ion testing and was monitored for Single Event Latch-up, Single Event Functional Interrupt and Single Event Upset (SEU). Testing was done at two different ion energies and the impact of ion energy on SEU response is evaluated. SEU testing was performed with both static and dynamic inputs and the SEU signatures of each are compared.