德州仪器LM185的ELDRS特性，1.2V精度基准:逆行行为证明了为什么采取临时测试点是重要的

2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI:10.1109/REDW.2014.7004567

K. Kruckmeyer, T. Trinh

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引用次数: 1

摘要

LM185 1.2V参考电压通过总电离剂量辐射而下降，但在70 krad左右开始恢复。在高剂量率和低剂量率以及偏倚和无偏倚试验条件下，回收率曲线不同。

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ELDRS Characterization of Texas Instruments LM185, 1.2V Precision Reference: Retrograde Behavior Demonstrates Why Taking Interim Test Points Is Important

The LM185 1.2V reference voltage degraded through total ionizing dose radiation, but began to recover at around 70 krad. The recovery curve was different for high and low dose rates and biased and unbiased test conditions.

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来源期刊

2014 IEEE Radiation Effects Data Workshop (REDW)

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