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2014 IEEE Radiation Effects Data Workshop (REDW)最新文献

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Radiation Performance of Interline CCD Arrays 线间CCD阵列的辐射性能
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004583
D. A. Thompson, B. Fodness, Paul P. K. Lee
{"title":"Radiation Performance of Interline CCD Arrays","authors":"D. A. Thompson, B. Fodness, Paul P. K. Lee","doi":"10.1109/REDW.2014.7004583","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004583","url":null,"abstract":"Interline CCD arrays were irradiated to several total dose levels with protons at three different particle energies (12, 30 and 50 MeV), as well as several dose levels for gamma (γ) radiation, the latter intended to replicate the space environment for trapped electrons. Results are presented or summarized for dark current, noise electrons, charge transfer efficiencies, charge to voltage conversion and non-operational pixels.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127555971","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Roscosmos Test Facilities for Total Ionizing Dose Testing of Electronic Component 俄罗斯联邦航天局电子元件总电离剂量试验设备
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004585
A. S. Petrov, K. Tapero, V. N. Ulimov, V. Anashin, P. Chubunov
{"title":"Roscosmos Test Facilities for Total Ionizing Dose Testing of Electronic Component","authors":"A. S. Petrov, K. Tapero, V. N. Ulimov, V. Anashin, P. Chubunov","doi":"10.1109/REDW.2014.7004585","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004585","url":null,"abstract":"Roscosmos test facilities for total ionizing dose testing of electronic components intended for space application are addressed. Examples of the application of these test facilities for different test methods are examined.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"109 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133682824","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
SEE Test Results of Electronic Components Performed on Roscosmos Test Facilities 在俄罗斯联邦航天局测试设施上进行的电子元件测试结果
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004588
V. Anashin, A. Koziukov, Anatoly A. Kazyakin, A. Kuznetsov, L. Bakirov, V. S. Korolev, Kirill A. Artemyev, K. Z. Faradian
{"title":"SEE Test Results of Electronic Components Performed on Roscosmos Test Facilities","authors":"V. Anashin, A. Koziukov, Anatoly A. Kazyakin, A. Kuznetsov, L. Bakirov, V. S. Korolev, Kirill A. Artemyev, K. Z. Faradian","doi":"10.1109/REDW.2014.7004588","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004588","url":null,"abstract":"The paper presents SEE test results of electronic components foreseen to be used in the satellite equipment. They were provided to determine electronic components hardness level and also SETs studying and techniques to record them.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130691701","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Effect of D-T Fusion-Produced Neutron Irradiation on X-Ray Spectral Characteristics of PIPS Detectors D-T聚变产生的中子辐照对PIPS探测器x射线光谱特性的影响
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004565
Raja P. Vigneshwara, N. Narasimha Murty, C. Rao, M. Abhangi
{"title":"Effect of D-T Fusion-Produced Neutron Irradiation on X-Ray Spectral Characteristics of PIPS Detectors","authors":"Raja P. Vigneshwara, N. Narasimha Murty, C. Rao, M. Abhangi","doi":"10.1109/REDW.2014.7004565","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004565","url":null,"abstract":"D-T generator produced neutron irradiation induced changes in electrical and X-ray spectral characteristics of PIPS detectors are investigated. Changes in detector resolution and leakage current are analyzed. Partial recovery of detector characteristics is discussed.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"87 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116622837","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Compendium of TID Comparative Results under X-Ray, Gamma and LINAC Irradiation x射线、伽玛和LINAC照射下TID比较结果汇编
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI: 10.1109/REDW.2014.7004562
L. Kessarinskiy, D. Boychenko, A. Petrov, P. V. Nekrasov, A. Sogoyan, V. Anashin, P. Chubunov
{"title":"Compendium of TID Comparative Results under X-Ray, Gamma and LINAC Irradiation","authors":"L. Kessarinskiy, D. Boychenko, A. Petrov, P. V. Nekrasov, A. Sogoyan, V. Anashin, P. Chubunov","doi":"10.1109/REDW.2014.7004562","DOIUrl":"https://doi.org/10.1109/REDW.2014.7004562","url":null,"abstract":"Compendium of TID comparative results under X-ray, Gamma and LINAC irradiation is presented. The new joint method of X-ray and gamma irradiation employment for TID investigations is proposed. Experiment results successfully confirm the validity of the proposed TID testing approach.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129184217","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
Single Event Upset Characterization of the Kintex-7 Field Programmable Gate Array Using Proton Irradiation 质子辐照对Kintex-7现场可编程门阵列的单事件扰动表征
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 1900-01-01 DOI: 10.1109/redw.2014.7004593
D. Hiemstra, V. Kirischian
{"title":"Single Event Upset Characterization of the Kintex-7 Field Programmable Gate Array Using Proton Irradiation","authors":"D. Hiemstra, V. Kirischian","doi":"10.1109/redw.2014.7004593","DOIUrl":"https://doi.org/10.1109/redw.2014.7004593","url":null,"abstract":"Proton induced SEU cross-sections of the SRAM which stores the logic configuration and certain functional blocks of the Kintex-7 FPGA are presented. Upset rates in the space radiation environment are estimated.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"183 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121523958","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 26
Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics 候选粒子加速器电子学辐射诱导效应纲要
2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 1900-01-01 DOI: 10.1109/redw.2013.6658187
P. Oser, G. Spiezia, M. Brugger, S. Danzeca, E. Fadakis, G. Foucard, R. G. Alía, R. Losito, A. Masi, J. Mekki, P. Peronnard, G. Ruggiero, R. Secondo, K. Stachyra, R. Gaillard
{"title":"Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics","authors":"P. Oser, G. Spiezia, M. Brugger, S. Danzeca, E. Fadakis, G. Foucard, R. G. Alía, R. Losito, A. Masi, J. Mekki, P. Peronnard, G. Ruggiero, R. Secondo, K. Stachyra, R. Gaillard","doi":"10.1109/redw.2013.6658187","DOIUrl":"https://doi.org/10.1109/redw.2013.6658187","url":null,"abstract":"In the context of the CERN 'Radiation To Electronics (R2E)' project, the vulnerability of a variety of components for particle accelerators electronics to single event effects, total ionizing dose and displacement damage has been analysed. The tested parts include analog, linear, digital, and hybrid devices and a summary of radiation test results is provided in this paper.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116502566","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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