候选粒子加速器电子学辐射诱导效应纲要

2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 1900-01-01 DOI:10.1109/redw.2013.6658187

P. Oser, G. Spiezia, M. Brugger, S. Danzeca, E. Fadakis, G. Foucard, R. G. Alía, R. Losito, A. Masi, J. Mekki, P. Peronnard, G. Ruggiero, R. Secondo, K. Stachyra, R. Gaillard

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引用次数: 2

摘要

在欧洲核子研究中心(CERN)“电子辐射(R2E)”项目的背景下，分析了粒子加速器电子器件的各种组件在单事件效应、总电离剂量和位移损伤下的脆弱性。测试部分包括模拟、线性、数字和混合器件，并对辐射测试结果进行了总结。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics

In the context of the CERN 'Radiation To Electronics (R2E)' project, the vulnerability of a variety of components for particle accelerators electronics to single event effects, total ionizing dose and displacement damage has been analysed. The tested parts include analog, linear, digital, and hybrid devices and a summary of radiation test results is provided in this paper.

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2014 IEEE Radiation Effects Data Workshop (REDW)

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