{"title":"质子辐照对Kintex-7现场可编程门阵列的单事件扰动表征","authors":"D. Hiemstra, V. Kirischian","doi":"10.1109/redw.2014.7004593","DOIUrl":null,"url":null,"abstract":"Proton induced SEU cross-sections of the SRAM which stores the logic configuration and certain functional blocks of the Kintex-7 FPGA are presented. Upset rates in the space radiation environment are estimated.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"183 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"26","resultStr":"{\"title\":\"Single Event Upset Characterization of the Kintex-7 Field Programmable Gate Array Using Proton Irradiation\",\"authors\":\"D. Hiemstra, V. Kirischian\",\"doi\":\"10.1109/redw.2014.7004593\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Proton induced SEU cross-sections of the SRAM which stores the logic configuration and certain functional blocks of the Kintex-7 FPGA are presented. Upset rates in the space radiation environment are estimated.\",\"PeriodicalId\":223557,\"journal\":{\"name\":\"2014 IEEE Radiation Effects Data Workshop (REDW)\",\"volume\":\"183 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"26\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 IEEE Radiation Effects Data Workshop (REDW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/redw.2014.7004593\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/redw.2014.7004593","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Single Event Upset Characterization of the Kintex-7 Field Programmable Gate Array Using Proton Irradiation
Proton induced SEU cross-sections of the SRAM which stores the logic configuration and certain functional blocks of the Kintex-7 FPGA are presented. Upset rates in the space radiation environment are estimated.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
