{"title":"Subthreshold passive RFID tag's baseband processor core design with custom modules and cells","authors":"Weiwei Shi, Zhao Guangdong, O. Choy","doi":"10.1109/ISVLSI.2016.82","DOIUrl":"https://doi.org/10.1109/ISVLSI.2016.82","url":null,"abstract":"Subthreshold ultra-low-power passive RFID tag's baseband processor core design with custom logic cells is presented in this paper, based on EPC C1G2 protocol. To deal with the critical timing and wide-range-PVT variation problems of the processor at very low power supply, and for the consideration of limited availability of RF power, power-aware ideas are applied to the processor, including data link portions. Importantly, a novel custom ratioed logic style is adopted in key modules to fundamentally solve the speed problem at ultra-low-voltage. The proposed baseband processor was fabricated in 90 nm CMOS as well as the regular design with the same function. In measurement the proposed design indicates good robustness and much more competent for subthreshold operation. It can operate at minimum 0.28 V supply with power consumption of 129 nW.","PeriodicalId":215448,"journal":{"name":"2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS)","volume":"88 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133199359","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Analysis and design of Network on Chip under high process variation","authors":"Rabab Ezz-Eldin, M. El-Moursy, H. Hamed","doi":"10.1109/ICECS.2015.7440364","DOIUrl":"https://doi.org/10.1109/ICECS.2015.7440364","url":null,"abstract":"Asynchronous router is proposed as a vigorous design to alleviate the impact of process variation in Network on Chip (NoC). The impact of process variation on the network throughput is evaluated by implementing asynchronous and synchronous network on chip designs. Many Network on Chip topologies are used to evaluate the influence of process variation. Circuit analysis is used to evaluate the impact of process variation on both synchronous and asynchronous designs. The delay, throughput and leakage power variation for different NoC topologies are evaluated with taking into consideration NoC interconnects and clock distribution network under process variation with advanced technology. In advanced technologies, process variation crumbles the performance of routing algorithms. For different traffic patterns, the performance of many routing algorithms is determined. Adaptive routing algorithm should be aware of the process variation. To avert the influence of process variation and congestion for asynchronous NoC design, a novel routing algorithm is presented. Process variation Delay and Congestion aware Routing (PDCR) is proposed as adaptive, low cost and scalable routing algorithm. The performance of different routing algorithms is determined and compared to PDCR with process variation under various traffic patterns. Saturation throughput and average message delay are used to evaluate the different routing algorithms. PDCR achieves high performance as compared to different adaptive routing algorithms under various traffic patterns.","PeriodicalId":215448,"journal":{"name":"2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129570191","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
G. Madalozzo, Marcelo G. Mandelli, Luciano Ost, F. Moraes
{"title":"A platform-based design framework to boost many-core software development","authors":"G. Madalozzo, Marcelo G. Mandelli, Luciano Ost, F. Moraes","doi":"10.1109/ICECS.2015.7440313","DOIUrl":"https://doi.org/10.1109/ICECS.2015.7440313","url":null,"abstract":"Embedded software engineers are dealing with complex and large software codes, which will continue to grow. To achieve a cost-effective design, concomitant hardware and software development is required during early design phases. This paper presents an open-source platform based design framework that combines different ADLs and simulators aiming at improving embedded software productivity, targeting future many-core embedded systems. The proposed approach adopts three models: RTL-VHDL level; RTL-SystemC coupled to ISSs; PBD (Platform Based Design) using OVP. The software (operating system and user applications) is the same for both models. Therefore, the OVP modeling allows fast software validation and debuggability. With the SystemC-ISS, it is possible to accurate estimate performance and energy consumption. The low-level model enables, besides area estimation, the validation of low-level protocols, as the communication protocol, network interface or flow-control mechanisms between routers. Results evaluate execution time, simulation time, and the number of executed instructions for several benchmarks using the proposed approach. The OVP model presents in average five times faster than the RTL-SystemC model, and the RTL-SystemC up to 155 times faster than the RTL-VHDL model.","PeriodicalId":215448,"journal":{"name":"2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133476105","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Marco Trevisi, R. Carmona-Galán, J. Fernández-Berni, Á. Rodríguez-Vázquez
{"title":"On the design of a sparsifying dictionary for compressive image feature extraction","authors":"Marco Trevisi, R. Carmona-Galán, J. Fernández-Berni, Á. Rodríguez-Vázquez","doi":"10.1109/ICECS.2015.7440410","DOIUrl":"https://doi.org/10.1109/ICECS.2015.7440410","url":null,"abstract":"Compressive sensing is an alternative to Nyquist-rate sampling when the signal to be acquired is known to be sparse or compressible. A sparse signal has a small number of nonzero components compared to its total length. This property can either exist either in the sampling domain, i. e. time or space, or with respect to a transform basis. There is a parallel between representing a signal in a compressed domain and feature extraction. In both cases, there is an effort to reduce the amount of resources required to describe a large set of data. A given feature is often represented by a set of parameters, which only acquire a relevant value in a few points in the image plane. Although there are some works reported on feature extraction from compressed samples, none of them considers the implementation of the feature extractor as a part of the sensor itself. Our approach is to introduce a sparsifying dictionary, feasibly implementable at the focal plane, which describes the image in terms of features. This allows a standard reconstruction algorithm to directly recover the interesting image features, discarding the irrelevant information. In order to validate the approach, we have integrated a Harris-Stephens corner detector into the compressive sampling process. We have evaluated the accuracy of the reconstructed corners compared to applying the detector to a reconstructed image.","PeriodicalId":215448,"journal":{"name":"2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS)","volume":"133 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124273733","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Z. Merhi, O. Tahan, Samih Abdul-Nabi, A. Haj-Ali, M. Bayoumi
{"title":"Decentralized clustering in VANET using adaptive resonance theory","authors":"Z. Merhi, O. Tahan, Samih Abdul-Nabi, A. Haj-Ali, M. Bayoumi","doi":"10.1109/ICECS.2015.7440284","DOIUrl":"https://doi.org/10.1109/ICECS.2015.7440284","url":null,"abstract":"Nowadays VANETs are becoming a dominating technology in automotive industries where vehicles communicate with each other to deliver safety messages or any type of information to other vehicles. However, the increasing numbers of vehicles on the roads poses a challenge on designing an efficient communication protocol for VANETs. The scalability issue in VANETs has a deteriorating effect on latency and on the stability of the network. Clustering is one technique used for solving this issue. In this work, we propose a clustering technique that creates mini clusters that are in the same communication range of the vehicles with the help of Adaptive resonance theory (ART). These mini clusters are created based on speed where it categorizes the vehicle in one of three levels: high, medium or low speeds. ART is an unsupervised neural network model that classifies inputs based on the degree of similarities of the input. By carefully tuning ART, three clusters are always obtained corresponding to the above speed classifications. The proposed work was simulated and compared against traditional clustering methods where our work presented a 50% advantage over these techniques.","PeriodicalId":215448,"journal":{"name":"2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS)","volume":"29 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117273045","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A new 16-bit low-power PVT-calibrated time-based differential Analog-to-Digital Converter (ADC) circuit in CMOS 65nm technology","authors":"A. El-Bayoumi, H. Mostafa, A. Soliman","doi":"10.1109/ICECS.2015.7440356","DOIUrl":"https://doi.org/10.1109/ICECS.2015.7440356","url":null,"abstract":"Time-Based Analog-to-Digital Converter (ADC) becomes the key of the new era of scaling CMOS technology. It provides a lower power and area than conventional ADCs. These improvements urges the Time-Based ADC to overcome Software Defined Radio (SDR) receivers' challenges and to be a dominant module in designing them. Such an SDR receiver can adapt itself automatically to deal with the desired bandwidth. This permits more technologies to be built-in the same single chip. Time-Based ADC includes a Voltage-to-Time Converter (VTC) and a Time-to-Digital Converter (TDC). In this work, we present a novel differential VTC simulated under process-voltage-temperature (PVT) variations using TSMC 65nm CMOS technology. It is connected with a TDC algorithm implemented on MATLAB to form a complete ADC. The proposed ADC is based on a new design methodology which reports at higher input frequencies after calibration a higher Effective-Number-of-Bits (ENOB) than previously published ADC circuits in TSMC 65nm CMOS technology, with a supply voltage of 1.2V.","PeriodicalId":215448,"journal":{"name":"2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123701106","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Classical electrical circuitry to support modern control methods","authors":"M. Papoutsidakis, D. Tseles, D. Piromalis","doi":"10.1109/ICECS.2015.7440308","DOIUrl":"https://doi.org/10.1109/ICECS.2015.7440308","url":null,"abstract":"Pneumatic positioning systems have always been attractive for robotics and automation applications due to their high power-to-weight ratio and low cost. On the other hand, achieving fast and accurate control of their position have been known as a complex control problem and in fact it has not been solved yet in a 100% percentage of position accuracy and repeatability. A smart way to implement the three term classical control approach (PID) to such a system is presented in this paper. The I-Term was selected to be \"switched\" on and off, dynamically and automatically, according to the system control requirements. Although the task sounds challenging for an engineer, the primary aim of this research project is to design and implement an advanced electrical board which will be the embedded interface between an engineer and a pneumatic positioning plant. The interface board will include a microcontroller and all necessary peripheral circuitry as well as the software environment where the control code will be composed. Low cost, easy to pick-up from a local store electrical equipment will be used that can operate under non up to date computer connection thus minimizing the cost of the whole system further. Reliability, low cost and ease of use of the board are critical design factors. The feedback data of the pneumatic system performance will be monitored in a computer monitor via the board's data acquisition operation in real time.","PeriodicalId":215448,"journal":{"name":"2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129789090","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A high gain and low-offset current-mode instrumentation amplifier using differential difference current conveyors","authors":"U. Çini, E. Arslan","doi":"10.1109/ICECS.2015.7440251","DOIUrl":"https://doi.org/10.1109/ICECS.2015.7440251","url":null,"abstract":"In this work, a current-mode high CMRR and low offset instrumentation amplifier is proposed. In the structure, only differential difference current conveyors (DDCC) are employed. The offset of the instrumentation amplifier is suppressed using an integrator feedback stage. The CMRR of the system is simulated using mismatch models for the DDCC elements employed. The CMRR of the instrumentation amplifier is independent of resistor mismatches and high CMRR is achieved if good matching of the differential transistors of each current conveyor is provided. The proposed instrumentation amplifier is designed using 0.35μm technology and simulated using HSPICE. The designed instrumentation amplifier provides high CMRR with low offset and it is especially suitable for AC coupled measurements. The simplicity of the design structure is the main advantage of the provided design where only DDCC elements are required for high CMRR and high output swing.","PeriodicalId":215448,"journal":{"name":"2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124109446","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Pipino, A. Pezzotta, F. Resta, M. Matteis, A. Baschirotto
{"title":"A rail-to-rail-input chopper instrumentation amplifier in 28nm CMOS","authors":"A. Pipino, A. Pezzotta, F. Resta, M. Matteis, A. Baschirotto","doi":"10.1109/ICECS.2015.7440252","DOIUrl":"https://doi.org/10.1109/ICECS.2015.7440252","url":null,"abstract":"This paper presents a chopper instrumentation amplifier designed in 28nm CMOS technology. The operational amplifier has a rail-to-rail folded cascode input stage, which ensures a constant gm over the available common-mode range. It is characterized by a Nested Miller compensation. All transistors operate in sub-threshold region; thus the opamp has been designed through a specific procedure for sub-threshold operation. The chopper technique is exploited to reduce the input referred offset and noise. The circuit operates with 0.9V supply voltage and exhibits a simulated 106dB DC gain and 329kHz GBW. Montecarlo simulations demonstrate an offset distribution with 2.2μV standard deviation. The input noise spectral density is equal to 27nV/√Hz, giving a noise efficiency factor of 8.","PeriodicalId":215448,"journal":{"name":"2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS)","volume":"115 21","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120826863","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Bulk and FDSOI Sub-micron CMOS transistors resilience to single-event transients","authors":"W. C. Bartra, A. Vladimirescu, R. Reis","doi":"10.1109/ICECS.2015.7440267","DOIUrl":"https://doi.org/10.1109/ICECS.2015.7440267","url":null,"abstract":"This work presents a comparison of resilience between a 32nm Bulk and a 28nm Fully-Depleted Silicon On Insulator (FDSOI) transistor to heavy ion impacts on the Drain region. The impacts were performed in different transistor locations at different impact angles whereas previous works considered the impact just at a 0 degree angle. This comparison is performed with the device in the off-state using 2D TCAD simulations. The results show a 7.7 times improved resilience of the FDSOI transistor compared to that of Bulk MOSFET.","PeriodicalId":215448,"journal":{"name":"2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS)","volume":"83 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114321019","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}