Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms最新文献

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Measurement of radionuclide production probabilities in negative muon nuclear capture and validation of Monte Carlo simulation model 负介子核捕获中放射性核素产生概率的测量及蒙特卡罗模拟模型的验证
IF 1.4 3区 物理与天体物理
Yuji Yamaguchi , Megumi Niikura , Rurie Mizuno , Motonobu Tampo , Masahide Harada , Naritoshi Kawamura , Izumi Umegaki , Soshi Takeshita , Katsuhiro Haga
{"title":"Measurement of radionuclide production probabilities in negative muon nuclear capture and validation of Monte Carlo simulation model","authors":"Yuji Yamaguchi ,&nbsp;Megumi Niikura ,&nbsp;Rurie Mizuno ,&nbsp;Motonobu Tampo ,&nbsp;Masahide Harada ,&nbsp;Naritoshi Kawamura ,&nbsp;Izumi Umegaki ,&nbsp;Soshi Takeshita ,&nbsp;Katsuhiro Haga","doi":"10.1016/j.nimb.2025.165801","DOIUrl":"10.1016/j.nimb.2025.165801","url":null,"abstract":"<div><div>As part of the development of a sample radioactivity calculation program, we have measured radionuclide production probabilities in negative muon nuclear capture to update experimental data and to validate a calculation dataset obtained by a Monte Carlo simulation code. The probabilities have been obtained by an activation experiment on <sup>27</sup>Al, <span><math><msup><mrow></mrow><mrow><mi>nat</mi></mrow></msup></math></span>Si, <sup>59</sup>Co, and <span><math><msup><mrow></mrow><mrow><mi>nat</mi></mrow></msup></math></span>Ta targets. The obtained probabilities expand the validation scope to the radionuclide production processes outside of the existing data coverage. By comparing the resultant probabilities with the calculated dataset, it has been revealed that the dataset is generally on the safe side in radioactivity estimation and needs to be corrected in the following three cases: (i) isomer production; (ii) radionuclide production by multiple neutron emission; (iii) radionuclide production by particle emissions involving a proton. The present probabilities and the new findings on the correction provide valuable clues to improvements of the simulation models.</div></div>","PeriodicalId":19380,"journal":{"name":"Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms","volume":"567 ","pages":"Article 165801"},"PeriodicalIF":1.4,"publicationDate":"2025-07-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144723910","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Boron induced x-ray production cross sections 硼诱导x射线产生的截面
IF 1.4 3区 物理与天体物理
I. Gorlachev , I. Ivanov , P. Kharkin , A. Kireyev , M. Koloberdin , A. Platov , M. Zdorovets , N. Burtebayev
{"title":"Boron induced x-ray production cross sections","authors":"I. Gorlachev ,&nbsp;I. Ivanov ,&nbsp;P. Kharkin ,&nbsp;A. Kireyev ,&nbsp;M. Koloberdin ,&nbsp;A. Platov ,&nbsp;M. Zdorovets ,&nbsp;N. Burtebayev","doi":"10.1016/j.nimb.2025.165818","DOIUrl":"10.1016/j.nimb.2025.165818","url":null,"abstract":"<div><div>The production cross sections of K-, L-, and M−shell x-rays induced by accelerated boron ions were measured at energies ranging from 11.0 to 17.6 MeV in 2.2 MeV increments. Thin films of Al, Ti, Cr, Cu, Zn, Zr, Nb, Mo, Ag, Cd, In, Sn, Sb, Ta, W, Pb, and Bi, deposited on Mylar substrates via ion-plasma sputtering, were used as targets. X-ray production cross sections were determined using Rutherford backscattering cross sections. To enable this calculation, backscattered ions were detected simultaneously with the emitted x-rays. The experimental results were compared with theoretical predictions based on the ECPSSR and PWBA models, as implemented in the ISICS-11 code.</div></div>","PeriodicalId":19380,"journal":{"name":"Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms","volume":"567 ","pages":"Article 165818"},"PeriodicalIF":1.4,"publicationDate":"2025-07-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144721456","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Tungsten peak broadening in LEIS: Origins and challenges for quantitative analysis LEIS中钨峰展宽:定量分析的起源与挑战
IF 1.4 3区 物理与天体物理
N. Efimov , D. Sinelnikov , M. Grishaev , I. Nikitin , V. Luzanov
{"title":"Tungsten peak broadening in LEIS: Origins and challenges for quantitative analysis","authors":"N. Efimov ,&nbsp;D. Sinelnikov ,&nbsp;M. Grishaev ,&nbsp;I. Nikitin ,&nbsp;V. Luzanov","doi":"10.1016/j.nimb.2025.165823","DOIUrl":"10.1016/j.nimb.2025.165823","url":null,"abstract":"<div><div>This study presents the energy spectra of 15 keV Ne<sup>+</sup> ions scattered from the surface of polycrystalline tungsten during its thermal annealing in the temperature range from 560 °C to 2500 °C. Before the heating, the energy spectra for tungsten exhibit significant broadening; however, annealing results in a narrowing of the tungsten peaks, making them comparable to the typical spectra observed for gold. This narrowing of the elastic peak, along with the observed increase in the total scattering coefficient and disappearance of oxygen peaks, is attributed to the removal of the oxidized surface layer. Additionally, a quantitative LEIS analysis of W-Si striped films with well-known relative atomic surface concentrations is conducted. The influence of the surface condition of tungsten reference samples on quantitative LEIS analysis is examined and discussed.</div></div>","PeriodicalId":19380,"journal":{"name":"Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms","volume":"567 ","pages":"Article 165823"},"PeriodicalIF":1.4,"publicationDate":"2025-07-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144721393","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Reduction in graphene oxide thin film induced by plasma focus 等离子体聚焦诱导氧化石墨烯薄膜的还原
IF 1.4 3区 物理与天体物理
Faranak Rahebi, Morteza Habibi
{"title":"Reduction in graphene oxide thin film induced by plasma focus","authors":"Faranak Rahebi,&nbsp;Morteza Habibi","doi":"10.1016/j.nimb.2025.165821","DOIUrl":"10.1016/j.nimb.2025.165821","url":null,"abstract":"<div><div>We investigated the reduction of supported graphene oxide (GO) thin film induced by plasma focus (PF) irradiation as a new approach in PF-related studies and applications. GO and irradiated GO (IGO) samples were characterized by X-ray diffraction, Raman spectroscopy, and Fourier transform infrared spectroscopy. The results confirmed the partial reduction of GO by 10 focusing shots, which can be crucial in tuning the properties of GO and dosimetric applications. Considering the capabilities of PF in providing different reduction components and operating in more controlled modes, a more effective reduction can be achieved in a very short time by making some modifications and optimizations. In short, PF-assisted reduction of GO offers a promising route for expanding PF-related studies and applications.</div></div>","PeriodicalId":19380,"journal":{"name":"Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms","volume":"567 ","pages":"Article 165821"},"PeriodicalIF":1.4,"publicationDate":"2025-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144713914","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Raman study of InxGa1-xN (x = 0.37–0.9) films irradiated with different ions 不同离子辐照下InxGa1-xN (x = 0.37-0.9)薄膜的拉曼光谱研究
IF 1.4 3区 物理与天体物理
Xueting Liu , Limin Zhang , Ning Liu , Shuo Zhang , Tieshan Wang
{"title":"Raman study of InxGa1-xN (x = 0.37–0.9) films irradiated with different ions","authors":"Xueting Liu ,&nbsp;Limin Zhang ,&nbsp;Ning Liu ,&nbsp;Shuo Zhang ,&nbsp;Tieshan Wang","doi":"10.1016/j.nimb.2025.165822","DOIUrl":"10.1016/j.nimb.2025.165822","url":null,"abstract":"<div><div>This study investigates damage in In<em><sub>x</sub></em>Ga<sub>1-</sub><em><sub>x</sub></em>N films irradiated with carbon (C) and krypton (Kr) ions. The In<em><sub>x</sub></em>Ga<sub>1-</sub><em><sub>x</sub></em>N (<em>x</em> = 0.37–0.9) films were grown on gallium nitride (GaN) epilayers and irradiated with C and Kr ions, resulting in an average damage dose of approximately 0.06 displacements per atom (dpa) within the Raman measured depth. Raman spectroscopy was used to assess the changes in structural damage, electron carrier concentration, and lattice disorder. Results show that irradiation causes lattice relaxation and reduces carrier concentration. The irradiation resistance decreased gradually with increasing indium (In) content (<em>x</em>) in In<em><sub>x</sub></em>Ga<sub>1-</sub><em><sub>x</sub></em>N, which can be attributed to the higher bond energy of Ga-N bonds compared to In-N bonds. Furthermore, the use of heavier Kr ions, resulted in more pronounced cascade collisions in the InGaN films, leading to more severe structural damage compared to lighter C ions at the same dpa.</div></div>","PeriodicalId":19380,"journal":{"name":"Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms","volume":"567 ","pages":"Article 165822"},"PeriodicalIF":1.4,"publicationDate":"2025-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144721489","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Characterizing secondary neutrons at BLIP for isotope production applications 在同位素生产应用中BLIP的二次中子特性
IF 1.4 3区 物理与天体物理
Wilson Lin, Michael A. Skulski , Cathy S. Cutler, Dmitri G. Medvedev, Jonathan T. Morrell
{"title":"Characterizing secondary neutrons at BLIP for isotope production applications","authors":"Wilson Lin,&nbsp;Michael A. Skulski ,&nbsp;Cathy S. Cutler,&nbsp;Dmitri G. Medvedev,&nbsp;Jonathan T. Morrell","doi":"10.1016/j.nimb.2025.165815","DOIUrl":"10.1016/j.nimb.2025.165815","url":null,"abstract":"<div><div>Fast secondary neutrons created at the Brookhaven Linac Isotope Producer (BLIP) facility following proton irradiation were characterized by the foil activation technique and compared with FLUKA Monte Carlo simulations. The FLUKA-simulated neutron flux was spectrally adjusted following the maximum entropy formalism using the International Reactor Dosimetry and Fusion File (IRDFF-II), with predictions agreeing with experimental measurements to within 9 % following the adjustment procedure. A multitude of degrader configurations were simulated to assess the feasibility of improving the fast (E<sub>n</sub> &gt; 20 MeV) secondary neutron yield at the proposed neutron target position (“N-slot”). A configuration where the N-slot is closest to the proton degrader produced the highest fast neutron yield, with tungsten degraders achieving the best performance. Assuming the optimized target-degrader configuration proposed in this work, we discuss potential isotope production opportunities with secondary neutrons. In most cases the yields are in the order of several mCi.</div></div>","PeriodicalId":19380,"journal":{"name":"Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms","volume":"567 ","pages":"Article 165815"},"PeriodicalIF":1.4,"publicationDate":"2025-07-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144704222","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The resolution functions of the time-of-flight pinhole SANS and multi-slit VSANS: a comparison between experiment and Mcstas simulation 飞行时间针孔SANS和多缝VSANS的分辨功能:实验与Mcstas模拟比较
IF 1.4 3区 物理与天体物理
Hong Zhu , He Cheng , Changli Ma , Zehua Han , Qing Chen , Tengfei Cui , Taisen Zuo , Yujia Liu
{"title":"The resolution functions of the time-of-flight pinhole SANS and multi-slit VSANS: a comparison between experiment and Mcstas simulation","authors":"Hong Zhu ,&nbsp;He Cheng ,&nbsp;Changli Ma ,&nbsp;Zehua Han ,&nbsp;Qing Chen ,&nbsp;Tengfei Cui ,&nbsp;Taisen Zuo ,&nbsp;Yujia Liu","doi":"10.1016/j.nimb.2025.165795","DOIUrl":"10.1016/j.nimb.2025.165795","url":null,"abstract":"<div><div>In neutron scattering instrumentation, the resolution function critically bridges instrument design and data reliability. While traditional time-of-flight (TOF) pinhole SANS instruments approximate resolution functions using Gaussian distributions, multi-slit Very Small Angle Neutron Scattering (MS-VSANS) instruments require fundamentally different treatments in horizontal and vertical directions due to multi-slit collimation. Focusing on the MS-VSANS system at the China Spallation Neutron Source (CSNS), we derived its anisotropic resolution function from first principles and subsequently demonstrated its accuracy through comparisons between Mcstas simulations and experimental measurements. The derived model successfully predicted resolution smearing effects, showing quantitative agreement with both real-world data and virtual experiments in terms of absolute intensity and directional resolution. This work establishes a robust framework for interpreting slit-based VSANS data, while revealing that TOF-SANS’s Gaussian approximations fail to capture MS-VSANS’s directional decoupling. The experimentally validated resolution model provides critical insights for optimizing slit configurations and advancing applications requiring ultra-high angular resolution. Leveraging the experimentally validated resolution function, deploying this framework across MS-VSANS user facilities is essential for unlocking its full potential.</div></div>","PeriodicalId":19380,"journal":{"name":"Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms","volume":"567 ","pages":"Article 165795"},"PeriodicalIF":1.4,"publicationDate":"2025-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144702834","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Effects of H2O vapor-assisted on focused ion beam milling of single-crystal diamond: Sputtering yield enhancement and damage suppression 水蒸汽辅助聚焦离子束铣削单晶金刚石的影响:溅射成品率提高和损伤抑制
IF 1.4 3区 物理与天体物理
Yu Yang , Quan-long Wang , Cheng-long Ma , Bang-jie Gu , Lun Chen , Lei Han
{"title":"Effects of H2O vapor-assisted on focused ion beam milling of single-crystal diamond: Sputtering yield enhancement and damage suppression","authors":"Yu Yang ,&nbsp;Quan-long Wang ,&nbsp;Cheng-long Ma ,&nbsp;Bang-jie Gu ,&nbsp;Lun Chen ,&nbsp;Lei Han","doi":"10.1016/j.nimb.2025.165816","DOIUrl":"10.1016/j.nimb.2025.165816","url":null,"abstract":"<div><div>In this work, the sputtering yield and damage in single-crystal diamond were investigated using molecular dynamics simulations during H<sub>2</sub>O vapor-assisted Focused Ion Beam (FIB) milling. A comparative analysis of FIB sputtering and vapor-assisted processes revealed that H<sub>2</sub>O vapor increased the sputtering yield, while simultaneously suppressing the evolution of internal damage and graphitization in processing regions. The presence of H<sub>2</sub>O vapor assisted in generating a broader stress variation region on the diamond surface and suppressed the diffusion of implanted ions, promoting their localized distribution. Mean-squared displacement (MSD) analysis further revealed that the presence of H2O vapor significantly reduced the displacement of carbon atoms in the processed region, resulting in greater processing stability and precision. These findings demonstrated the dual advantages of H<sub>2</sub>O-assisted FIB in enhancing material removal efficiency and minimizing subsurface damage, offering theoretical insights and practical guidance for precision diamond machining.</div></div>","PeriodicalId":19380,"journal":{"name":"Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms","volume":"567 ","pages":"Article 165816"},"PeriodicalIF":1.4,"publicationDate":"2025-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144702640","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Benchmark study of PHITS for various projectiles and observables using SINBAD 利用SINBAD对各种弹丸和可观测物的PHITS进行基准研究
IF 1.4 3区 物理与天体物理
Tatsuhiko Ogawa , Nathalie Labonnote
{"title":"Benchmark study of PHITS for various projectiles and observables using SINBAD","authors":"Tatsuhiko Ogawa ,&nbsp;Nathalie Labonnote","doi":"10.1016/j.nimb.2025.165791","DOIUrl":"10.1016/j.nimb.2025.165791","url":null,"abstract":"<div><div>The general-purpose radiation transport simulation code PHITS was validated against SINBAD, a comprehensive radiation shielding benchmark database. Unlike previous studies that primarily focused on proton accelerator shielding, this work extended the validation to a wider range of experimental data, including double-differential neutron yields, activation, remnant dose, and microdosimetric quantities induced by protons, electrons, ions, and pions. While PHITS predictions generally agreed with experimental data within a factor of two, indicating sufficient accuracy of transport and burn-up calculations, the comparison highlighted deficiencies in several nuclear reaction models. Specifically, the high-energy hadron cascade model for neutron production and isomer production, evaporation model, and heavy-ion reaction model can be refined further for higher accuracy.</div></div>","PeriodicalId":19380,"journal":{"name":"Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms","volume":"567 ","pages":"Article 165791"},"PeriodicalIF":1.4,"publicationDate":"2025-07-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144696770","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Calculations of secondary neutron production cross sections and yields induced by high-energy 4He ions 高能4He离子诱导二次中子产生截面和产率的计算
IF 1.4 3区 物理与天体物理
Z. Zhang , R. Han , Z. Chen , G. Tian , B. Liu , X. Zhang , H. Sun , F. Shi , Q. Li , P. Zhang
{"title":"Calculations of secondary neutron production cross sections and yields induced by high-energy 4He ions","authors":"Z. Zhang ,&nbsp;R. Han ,&nbsp;Z. Chen ,&nbsp;G. Tian ,&nbsp;B. Liu ,&nbsp;X. Zhang ,&nbsp;H. Sun ,&nbsp;F. Shi ,&nbsp;Q. Li ,&nbsp;P. Zhang","doi":"10.1016/j.nimb.2025.165794","DOIUrl":"10.1016/j.nimb.2025.165794","url":null,"abstract":"<div><div>Accurate simulation of secondary neutron production induced by <span><math><msup><mrow></mrow><mrow><mn>4</mn></mrow></msup></math></span>He ions in various materials is essential for numerous applications. This study evaluates the performance of GEANT4, PHITS, and FLUKA in calculating cross sections and yields of secondary neutrons induced by <span><math><msup><mrow></mrow><mrow><mn>4</mn></mrow></msup></math></span>He ions. The simulation results are compared with experimental data to assess their accuracy. PHITS and FLUKA show strong agreement with experimental measurements, indicating their reliability. In contrast, GEANT4 simulations using the INCL model with default parameters significantly underestimate neutron production for both thin and thick targets. This discrepancy can be reduced by adjusting the Fermi momentum within the INCL model or using the LIQMD model. The study highlights the capabilities and limitations of three codes in modeling neutron production, providing insights into their applicability for radiation shielding and nuclear physics research. The results demonstrate that three codes offer reliable predictions, with specific strengths in different energy ranges and target materials.</div></div>","PeriodicalId":19380,"journal":{"name":"Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms","volume":"567 ","pages":"Article 165794"},"PeriodicalIF":1.4,"publicationDate":"2025-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144678358","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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