等离子体聚焦诱导氧化石墨烯薄膜的还原

IF 1.4 3区物理与天体物理 Q3 INSTRUMENTS & INSTRUMENTATION

Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms Pub Date : 2025-07-28 DOI:10.1016/j.nimb.2025.165821

Faranak Rahebi, Morteza Habibi

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引用次数: 0

摘要

我们研究了等离子体聚焦（PF）辐照诱导氧化石墨烯（GO）薄膜的还原，这是一种新的氧化石墨烯相关研究和应用方法。采用x射线衍射、拉曼光谱和傅里叶变换红外光谱对氧化石墨烯和辐照氧化石墨烯样品进行了表征。结果证实，通过10次聚焦镜头可以部分减少氧化石墨烯，这对于调整氧化石墨烯的性质和剂量学应用至关重要。考虑到PF在提供不同的减少组件和在更可控的模式下操作的能力，通过进行一些修改和优化，可以在很短的时间内实现更有效的减少。总之，pf辅助氧化石墨烯还原为扩大pf相关研究和应用提供了一条有希望的途径。

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Reduction in graphene oxide thin film induced by plasma focus

We investigated the reduction of supported graphene oxide (GO) thin film induced by plasma focus (PF) irradiation as a new approach in PF-related studies and applications. GO and irradiated GO (IGO) samples were characterized by X-ray diffraction, Raman spectroscopy, and Fourier transform infrared spectroscopy. The results confirmed the partial reduction of GO by 10 focusing shots, which can be crucial in tuning the properties of GO and dosimetric applications. Considering the capabilities of PF in providing different reduction components and operating in more controlled modes, a more effective reduction can be achieved in a very short time by making some modifications and optimizations. In short, PF-assisted reduction of GO offers a promising route for expanding PF-related studies and applications.

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来源期刊

Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms 物理-核科学技术

CiteScore

2.80

自引率

7.70%

发文量

231

审稿时长

1.9 months

期刊介绍： Section B of Nuclear Instruments and Methods in Physics Research covers all aspects of the interaction of energetic beams with atoms, molecules and aggregate forms of matter. This includes ion beam analysis and ion beam modification of materials as well as basic data of importance for these studies. Topics of general interest include: atomic collisions in solids, particle channelling, all aspects of collision cascades, the modification of materials by energetic beams, ion implantation, irradiation - induced changes in materials, the physics and chemistry of beam interactions and the analysis of materials by all forms of energetic radiation. Modification by ion, laser and electron beams for the study of electronic materials, metals, ceramics, insulators, polymers and other important and new materials systems are included. Related studies, such as the application of ion beam analysis to biological, archaeological and geological samples as well as applications to solve problems in planetary science are also welcome. Energetic beams of interest include atomic and molecular ions, neutrons, positrons and muons, plasmas directed at surfaces, electron and photon beams, including laser treated surfaces and studies of solids by photon radiation from rotating anodes, synchrotrons, etc. In addition, the interaction between various forms of radiation and radiation-induced deposition processes are relevant.