硼诱导x射线产生的截面

IF 1.4 3区物理与天体物理 Q3 INSTRUMENTS & INSTRUMENTATION

Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms Pub Date : 2025-07-29 DOI:10.1016/j.nimb.2025.165818

I. Gorlachev , I. Ivanov , P. Kharkin , A. Kireyev , M. Koloberdin , A. Platov , M. Zdorovets , N. Burtebayev

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引用次数: 0

摘要

在11.0 ~ 17.6 MeV的能量范围内，以2.2 MeV的增量测量了加速硼离子诱导的K-、L-和M -壳层x射线的生成截面。通过离子等离子溅射在Mylar衬底上沉积Al、Ti、Cr、Cu、Zn、Zr、Nb、Mo、Ag、Cd、In、Sn、Sb、Ta、W、Pb和Bi薄膜作为靶材。利用卢瑟福后向散射截面确定x射线产生截面。为了实现这个计算，背向散射离子与发射的x射线同时被检测到。实验结果与基于ECPSSR和PWBA模型的理论预测结果进行了比较，并在ISICS-11代码中实现。

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Boron induced x-ray production cross sections

The production cross sections of K-, L-, and M−shell x-rays induced by accelerated boron ions were measured at energies ranging from 11.0 to 17.6 MeV in 2.2 MeV increments. Thin films of Al, Ti, Cr, Cu, Zn, Zr, Nb, Mo, Ag, Cd, In, Sn, Sb, Ta, W, Pb, and Bi, deposited on Mylar substrates via ion-plasma sputtering, were used as targets. X-ray production cross sections were determined using Rutherford backscattering cross sections. To enable this calculation, backscattered ions were detected simultaneously with the emitted x-rays. The experimental results were compared with theoretical predictions based on the ECPSSR and PWBA models, as implemented in the ISICS-11 code.

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来源期刊

Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms 物理-核科学技术

CiteScore

2.80

自引率

7.70%

发文量

231

审稿时长

1.9 months

期刊介绍： Section B of Nuclear Instruments and Methods in Physics Research covers all aspects of the interaction of energetic beams with atoms, molecules and aggregate forms of matter. This includes ion beam analysis and ion beam modification of materials as well as basic data of importance for these studies. Topics of general interest include: atomic collisions in solids, particle channelling, all aspects of collision cascades, the modification of materials by energetic beams, ion implantation, irradiation - induced changes in materials, the physics and chemistry of beam interactions and the analysis of materials by all forms of energetic radiation. Modification by ion, laser and electron beams for the study of electronic materials, metals, ceramics, insulators, polymers and other important and new materials systems are included. Related studies, such as the application of ion beam analysis to biological, archaeological and geological samples as well as applications to solve problems in planetary science are also welcome. Energetic beams of interest include atomic and molecular ions, neutrons, positrons and muons, plasmas directed at surfaces, electron and photon beams, including laser treated surfaces and studies of solids by photon radiation from rotating anodes, synchrotrons, etc. In addition, the interaction between various forms of radiation and radiation-induced deposition processes are relevant.