Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002.最新文献

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Thin film technology for electron beam crystallized silicon solar cells on low cost substrates 电子束结晶硅太阳能电池在低成本衬底上的薄膜技术
J. Heemeier, M. Rostalsky, F. Gromball, N. Linke, J. Muller
{"title":"Thin film technology for electron beam crystallized silicon solar cells on low cost substrates","authors":"J. Heemeier, M. Rostalsky, F. Gromball, N. Linke, J. Muller","doi":"10.1109/PVSC.2002.1190850","DOIUrl":"https://doi.org/10.1109/PVSC.2002.1190850","url":null,"abstract":"In the design described a combination of nitride and carbide layers enables the recrystallization of a silicon absorber deposited on graphite or glass substrates. The interface layer siliconcarbide improves the wettability of the silicon film and the substrate during electron beam recrystallization. To prevent entrapment of deep impurities from the glass substrate aluminumnitride is used as a diffusion barrier. Furthermore AlN is used as a supporting mechanical layer during Si crystallization, and titaniumnitride as electrical backside contact. Additionally the absorption of light is enhanced due to reflection at the TiN layer. Efficient Si deposition rates up to 300 nm/min are achieved by means of a PECVD process using trichlorosilane (SiHCl/sub 3/) and hydrogen (H/sub 2/). Scanning of a line shaped electron beam across the silicon surface significantly enlarges the grains as well as it reduces impurities. A crystalline absorber thickness up to 20 /spl mu/m is achieved without epitaxial growth. The layer interfaces are analyzed by scanning electron microscopy, x-ray diffraction and elastic recoil detection analysis.","PeriodicalId":177538,"journal":{"name":"Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002.","volume":"71 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131181501","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Solar cell model for electron transport in photosynthesis 光合作用中电子传递的太阳能电池模型
T. Markvart, P. Landsberg
{"title":"Solar cell model for electron transport in photosynthesis","authors":"T. Markvart, P. Landsberg","doi":"10.1109/PVSC.2002.1190859","DOIUrl":"https://doi.org/10.1109/PVSC.2002.1190859","url":null,"abstract":"We show in this paper that the primary photosynthetic reaction resembles closely the operation of the solar cell. It is found, in particular, that the reaction rate can be written in a form similar to the Shockley solar cell equation. The reaction produces both chemical and electrical energy and the way this energy is divided into these two components makes it possible to optimise the amount of power produced: in other words, the photosynthetic organism can track the maximum power point. An estimate is also given of the maximum energy that can be produced, and of the different losses that limit this amount.","PeriodicalId":177538,"journal":{"name":"Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002.","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130926521","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Accelerated testing of an encapsulant for PV modules 光伏组件封装剂加速测试
J.I. Hanoka
{"title":"Accelerated testing of an encapsulant for PV modules","authors":"J.I. Hanoka","doi":"10.1109/PVSC.2002.1190912","DOIUrl":"https://doi.org/10.1109/PVSC.2002.1190912","url":null,"abstract":"Evergreen Solar has developed a new encapsulant material for use in PV modules. In this paper we report on: the long term UV stability of this material in comparison with fast cured EVA; the effects of humidity-freeze cycling of both materials; and the bond strength of this new encapsulant to glass. The results indicate that Evergreen's new encapsulant can be expected to have a much longer service life than that of EVA.","PeriodicalId":177538,"journal":{"name":"Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002.","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131088364","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
High-efficiency space and terrestrial multijunction solar cells through bandgap control in cell structures 通过带隙控制电池结构的高效率空间和地面多结太阳能电池
R. King, C. Fetzer, P. Colter, K. Edmondson, J. Ermer, H. Cotal, H. Yoon, A. Stavrides, G. Kinsey, D. Krut, N. H. Karam
{"title":"High-efficiency space and terrestrial multijunction solar cells through bandgap control in cell structures","authors":"R. King, C. Fetzer, P. Colter, K. Edmondson, J. Ermer, H. Cotal, H. Yoon, A. Stavrides, G. Kinsey, D. Krut, N. H. Karam","doi":"10.1109/PVSC.2002.1190685","DOIUrl":"https://doi.org/10.1109/PVSC.2002.1190685","url":null,"abstract":"Using the energy bandgap of semiconductors as a design parameter is critically important for achieving the highest efficiency multijunction solar cells. The bandgaps of lattice-matched semiconductors that are most convenient to use are rarely those which would result in the highest theoretical efficiency. For both the space and terrestrial solar spectra, the efficiency of 3-junction GaInP/GaAs/Ge solar cells can be increased by a lower bandgap middle cell, as for GaInAs middle cells, as well as by using higher bandgap top cell materials. Wide-bandgap and indirect-gap materials used in parasitically absorbing layers such as tunnel junctions help to increase transmission of light to the active cell layers beneath. Control of bandgap in such cell structures has been instrumental in achieving solar cell efficiencies of 29.7% under the AMO space spectrum (0.1353 W/cm/sup 2/, 28/spl deg/C) and 34% under the concentrated terrestrial spectrum (AM1.5G, 150-400 suns, 25/spl deg/C), the highest yet achieved for solar cells built on a single substrate.","PeriodicalId":177538,"journal":{"name":"Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002.","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132860216","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 75
Scanning IQE-measurement for accurate current determination on very large area solar cells 扫描iiq测量法用于非常大面积太阳能电池的精确电流测定
B. Fischer, M. Keil, P. Fath, E. Bucher
{"title":"Scanning IQE-measurement for accurate current determination on very large area solar cells","authors":"B. Fischer, M. Keil, P. Fath, E. Bucher","doi":"10.1109/PVSC.2002.1190557","DOIUrl":"https://doi.org/10.1109/PVSC.2002.1190557","url":null,"abstract":"We developed a setup to measure the quantum efficiency and integral reflectance for large area solar cells where the cell is scanned underneath a 2/spl times/2 cm/sup 2/ illuminated area defined by a mask. Measurements with 90 wavelengths between 300 and 1200 nm on 12.5 /spl times/ 12.5 cm/sup 2/ solar cells are obtained in less than 15 minutes with very low noise due to the good signal-to-bias ratio. A self-consistent scaling procedure based on the analysis of the internal quantum efficiency is used to account for scaling errors due to the electrical measurement and stray light. This analysis also provides data which enable the calculation of the current loss in the emitter of the solar cell. A method is introduced to identify the bias light level at which the small signal quantum efficiency coincides with the integral large signal response eliminating the need to take the complete quantum efficiency for many bias levels.","PeriodicalId":177538,"journal":{"name":"Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002.","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133704337","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 22
Effect of back-contact copper concentration on CdTe cell operation 背接触铜浓度对CdTe电池运行的影响
A. Pudov, M. Gloeckler, S. Demtsu, J. Sites, K. Barth, R. A. Enzenroth, W. Sampath
{"title":"Effect of back-contact copper concentration on CdTe cell operation","authors":"A. Pudov, M. Gloeckler, S. Demtsu, J. Sites, K. Barth, R. A. Enzenroth, W. Sampath","doi":"10.1109/PVSC.2002.1190676","DOIUrl":"https://doi.org/10.1109/PVSC.2002.1190676","url":null,"abstract":"CdTe solar cells were fabricated with five different concentrations of copper, including zero, used in back-contact formation. Room-temperature J-V curves showed progressive deterioration in fill factor with reduced copper. J/sub SC/ and QE were similar for all Cu-levels. Capacitance measurement suggested enhanced intermixing at the back contact with copper present. Photocurrent mapping was much less uniform for reduced-Cu cells. Elevated-temperature stress induced very little change in J-V when sufficient Cu was used in the contact.","PeriodicalId":177538,"journal":{"name":"Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002.","volume":"323 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133682593","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 20
Analysis of fill factor losses using current-voltage curves obtained under dark and illuminated conditions 利用在黑暗和光照条件下获得的电流-电压曲线分析填充因子损耗
P. Hacke, D. Meier
{"title":"Analysis of fill factor losses using current-voltage curves obtained under dark and illuminated conditions","authors":"P. Hacke, D. Meier","doi":"10.1109/PVSC.2002.1190559","DOIUrl":"https://doi.org/10.1109/PVSC.2002.1190559","url":null,"abstract":"Series resistance was determined using illuminated and dark J-V curves for a group of twenty-eight cells. The change in fill factor due to the series resistance power loss was calculated and subtracted from the Suns-Voc-determined fill factor, which represents the fill factor void of series resistance losses. On average, this difference was found to equal the cell fill factor. This agreement indicates the reliability of each of the components involved in the determination. As a result, the fill factor losses due to series resistance using only dark and illuminated J-V measurements are determined with good accuracy. The limitations of this analysis are also discussed.","PeriodicalId":177538,"journal":{"name":"Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002.","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131436377","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Contact shadowing losses reduction by fine line screen printing 通过细线丝网印刷减少接触阴影损失
M. Butturi, M. Stefancich, D. Vincenzi, G. Martinelli, L. Pirozzi, G. Arabito, M. Izzi, P. Mangiapane
{"title":"Contact shadowing losses reduction by fine line screen printing","authors":"M. Butturi, M. Stefancich, D. Vincenzi, G. Martinelli, L. Pirozzi, G. Arabito, M. Izzi, P. Mangiapane","doi":"10.1109/PVSC.2002.1190545","DOIUrl":"https://doi.org/10.1109/PVSC.2002.1190545","url":null,"abstract":"Aim of this work is to transfer high efficiency concepts to large-scale crystalline silicon solar cell production, which is based on screen printing technology. The achievable cell efficiency obtainable by this technique is strongly affected by the limitation due to the contact shadowing losses necessary for reaching high Fill Factor values; indeed highest the FF, highest the surface coverage. An appealing way to overcome this limitation is to join screen printing to buried contact technology to get high aspect ratio grid pattern and, at the same time, a high FF value. Moreover this technology allows to easily define a selective emitter. Keeping to this purpose high resolution polymer screens or stencils with variable thickness have been tested. Both this steps have been obtained by adjusting the conventional screen printing process.","PeriodicalId":177538,"journal":{"name":"Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002.","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128836899","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Comprehensive study of the doping and injection-level dependence of stoichiometric silicon nitride passivation for silicon solar cells 硅太阳电池化学计量氮化硅钝化的掺杂和注入依赖的综合研究
M. Kerr, A. Cuevas
{"title":"Comprehensive study of the doping and injection-level dependence of stoichiometric silicon nitride passivation for silicon solar cells","authors":"M. Kerr, A. Cuevas","doi":"10.1109/PVSC.2002.1190466","DOIUrl":"https://doi.org/10.1109/PVSC.2002.1190466","url":null,"abstract":"The injection-level-dependence of the surface recombination velocity for the interface between crystalline silicon and stoichiometric PECVD silicon nitride has been studied. A wide variety of substrate resistivities, both n-type and p-type dopants, have been investigated for minority carrier injection-levels between 10/sup 12/-10/sup 17/ cm/sup -3/. Effective lifetimes of 10 ms have been obtained for high resistivity silicon, the highest ever measured for SiN passivated wafers, resulting in S/sub eff/ values of 1cm/s being unambiguously determined. The S/sub eff/(/spl Delta/n) dependence is very weak for n-type silicon under low injection, while for p-type silicon there is a clear minimum for injection-levels close to the doping density. Performance limits for solar cells passivated with stoichiometric SiN films are discussed and the results for actual devices with open-circuit voltages up to 675 mV presented.","PeriodicalId":177538,"journal":{"name":"Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002.","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131275140","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Japanese R&D activities of multi-junction and concentrator solar cells 日本在多结和聚光太阳能电池方面的研发活动
M. Yamaguchi, K. Araki
{"title":"Japanese R&D activities of multi-junction and concentrator solar cells","authors":"M. Yamaguchi, K. Araki","doi":"10.1109/PVSC.2002.1190701","DOIUrl":"https://doi.org/10.1109/PVSC.2002.1190701","url":null,"abstract":"Japanese R&D activities of concentrator solar cells and systems are overviewed. Japan Energy developed high efficiency (31.7 % at 1-sun AM1.5G) InGaP/InGaAs/Ge 3-junction cell under support by NEDO (New Energy and Industrial Technology Development Organization) in addition to the world-record efficiency InGaP/GaAs//InGaAs 3-junction cell (33.3% at 1-sun AM1.5G) by Japan Energy, Sumitomo and TTI. This project is now taken over by Sharp and targeted to concentration application also supported by NEDO. The new target is 40 % efficiency under 500-sun concentration by March 2006. The SPFG (Single and non-alignment Photolithography Fine Grid) silicon cell is developed by TTI. The first prototype of non-imaging Fresnel lens, which expands acceptance half angle to 2/spl deg//12/spl deg/ and enabled low cost axis tracker was fabricated and tested by TUAT. The module with this nonimaging lens and the SPFG cell is now assembled and subjected to be tested.","PeriodicalId":177538,"journal":{"name":"Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115494990","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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