Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002.最新文献_第4页

Identifying critical pathways to high performance PV 确定实现高性能光伏的关键途径

Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002. Pub Date : 2002-05-19 DOI: 10.1109/PVSC.2002.1190955

M. Symko-Davies, R. Noufi, S. Kurtz

引用次数: 5

Low-temperature growth of poly-crystalline silicon films using SiCl/sub 4/ and H/sub 2/ mixture 用SiCl/ sub4 /和H/ sub2 /混合物低温生长多晶硅薄膜

Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002. Pub Date : 2002-05-19 DOI: 10.1109/PVSC.2002.1190848

Xuan-ying Lin, Kui-xun Lin, Chuangjun Huang, Yun-peng Yu, Chuying Yu, L. Chi

引用次数: 1

Discovery and optimization of In-Zn-Sn-O based transparent conductors by combinatorial and pulsed laser deposition approaches 用组合激光和脉冲激光沉积方法发现和优化In-Zn-Sn-O基透明导体

Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002. Pub Date : 2002-05-19 DOI: 10.1109/PVSC.2002.1190804

J. Perkins, J. A. del Cueto, J. Alleman, A.C. Warmsingh, B. Keyes, L. Gedvilas, P. Parilla, X. Li, B. To, D. Readey, M. Van Hest, D. Ginley

引用次数: 3

A simple passive cooling structure and its heat analysis for 500/spl times/ concentrator PV module 500/spl次/聚光光伏组件的简单被动冷却结构及其热分析

Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002. Pub Date : 2002-05-19 DOI: 10.1109/PVSC.2002.1190913

K. Araki, H. Uozumi, Masahiro Yamaguchi

引用次数: 85

Carrier density imaging (CDI): a spatially resolved lifetime measurement suitable for in-line process-control 载流子密度成像(CDI):一种适用于在线过程控制的空间分辨寿命测量方法

Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002. Pub Date : 2002-05-19 DOI: 10.1109/PVSC.2002.1190509

J. Isenberg, S. Riepe, S. Glunz, W. Warta

引用次数: 15

Higher efficiency for thin multi crystalline silicon solar cells by improving the rear surface passivation 通过改善后表面钝化，提高薄型多晶硅太阳能电池的效率

Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002. Pub Date : 2002-05-19 DOI: 10.1109/PVSC.2002.1190519

C. Tool, P. Manshanden, A. Burgers, A. Weeber

引用次数: 6

Combination of plasma diagnostics and modelling for the investigation of microcrystalline silicon deposition process 结合等离子体诊断和模型研究微晶硅沉积过程

Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002. Pub Date : 2002-05-19 DOI: 10.1109/PVSC.2002.1190812

D. Mataras, E. Amanatides, D. Rapakoulias

{"title":"Combination of plasma diagnostics and modelling for the investigation of microcrystalline silicon deposition process","authors":"D. Mataras, E. Amanatides, D. Rapakoulias","doi":"10.1109/PVSC.2002.1190812","DOIUrl":"https://doi.org/10.1109/PVSC.2002.1190812","url":null,"abstract":"In this work is presented a study of the microcrystalline silicon PECVD process using highly diluted silane in hydrogen discharges. The investigation is performed by applying various non-intrusive plasma diagnostics (electrical, optical, mass spectrometric and laser interferometric measurements). Each of these measurements is related to different plasma sub-processes and all of them compose an almost complete set for the investigation of the effect of external discharge parameters on the deposition process. Thus, based on these measurements, a mass transfer model of SiH/sub 4//H/sub 2/ discharges that involves gas phase chemistry and plasma surface interaction is used, aiming at the optimization of the deposition rate of /spl mu/c-Si:H as well as the prediction of the main film precursors at conditions of low and high deposition rates. In this way, the main characteristics of the effect of frequency, discharge geometry, power consumption and total gas pressure on the deposition process are studied. The increase of silane dissociation rate towards neutral radicals (frequency), the contribution of highly sticking radicals (discharge geometry) and the controlled production of higher radicals through secondary gas phase reactions (gas pressure), are presented as prerequisites for the achievement of high deposition rates (> 5/spl Aring//sec).","PeriodicalId":177538,"journal":{"name":"Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002.","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132534930","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Production of thin (70-100 /spl mu/m) crystalline silicon cells for conformable modules 生产薄(70-100 /spl mu/m)的晶体硅电池

Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002. Pub Date : 2002-05-19 DOI: 10.1109/PVSC.2002.1190468

D. Meier, J. Jessup, P. Hacke, S. Granata, N. Ishikawa, M. Emoto

引用次数: 4

Low cost AC power monitor for residential PV support 用于住宅光伏支持的低成本交流电源监视器

Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002. Pub Date : 2002-05-19 DOI: 10.1109/PVSC.2002.1190888

A. Rosenthal, J. Mani, M. Kachare

{"title":"Low cost AC power monitor for residential PV support","authors":"A. Rosenthal, J. Mani, M. Kachare","doi":"10.1109/PVSC.2002.1190888","DOIUrl":"https://doi.org/10.1109/PVSC.2002.1190888","url":null,"abstract":"The rate at which new, residential on-grid PV systems are being installed increases every year. Yet, most include virtually no metering, customer education or other support for the system owners. The California Energy Commission's Renewable Energy Program Evaluation, October 2000, stated that consumers need a basic level of system performance measurement in order to verify whether their system is operating properly. This echoes a recurring observation that has been made by researchers, at least, since 1990. Consumers can turn to after-market meters which exist, but these are often inaccurate and none supports remote display. Of equal concern is that manufacturers of most meters assume a basic knowledge of electrical power that homeowners do not possess. To help meet this longstanding need, an inexpensive, accurate, AC power monitor has been developed for installation by an untrained homeowner. This monitor incorporates a power line carrier remote display that can be located anywhere in the home. The monitor and associated training materials have been designed to teach consumers to accurately assess PV system performance and recognize system failures. It is hoped that the unit's low cost and potential consumer value demonstrate its commercial viability.","PeriodicalId":177538,"journal":{"name":"Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131494995","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

Development of II-VI high band gap devices for high efficiency tandem solar cells 高效串联太阳能电池II-VI高带隙器件的研制

Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002. Pub Date : 2002-05-19 DOI: 10.1109/PVSC.2002.1190667

P. Mahawela, S. Jeedigunta, C. Ferekides, D. Morel

引用次数: 8