19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings最新文献

Phase noise measurement techniques using delta-sigma TDC δ - σ TDC相位噪声测量技术

19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings Pub Date : 2014-12-29 DOI: 10.1109/IMS3TW.2014.6997392

Yusuke Osawa, D. Hirabayashi, Naohiro Harigai, Haruo Kobayashi, K. Niitsu, O. Kobayashi

引用次数: 12

ATPG for mixed-signal circuits using commercial digital tools ATPG混合信号电路使用商业数字工具

19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings Pub Date : 2014-12-29 DOI: 10.1109/IMS3TW.2014.6997394

C. Wegener

引用次数: 2

An electro-chemical test and optimization system for impressed current cathodic corrosion protection 外加电流阴极腐蚀防护的电化学测试与优化系统

19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings Pub Date : 2014-12-29 DOI: 10.1109/IMS3TW.2014.6997399

A. Chang, J. Patel, Haleh Shahbazbegian, B. Kaminska

{"title":"An electro-chemical test and optimization system for impressed current cathodic corrosion protection","authors":"A. Chang, J. Patel, Haleh Shahbazbegian, B. Kaminska","doi":"10.1109/IMS3TW.2014.6997399","DOIUrl":"https://doi.org/10.1109/IMS3TW.2014.6997399","url":null,"abstract":"A simple electro-chemical test and an optimization system for impressed current cathodic protection (ICCP) for the A36 hot-rolled steel bar is presented in this article. A simple two-electrode based test system using an electro-chemical cell to test the corrosion rate of the target metal is proposed. The Tafel plot to determine the corrosion rate of the target metal is prepared using our simple test system and the corrosion current (icorr) is extrapolated from the Tafel plot. A novel technique by impressing the corrosion current to protect the target metal using ICCP is implemented and tested. The proposed protection system further simplifies the corrosion protection system compared to the current methods. To determine effectiveness of the proposed protection system, weight loss of a freely corroding target metal and a protected sample of the target metal are compared. For 0.6 M NaCl solution as a test environment, both the metal samples are tested for two weeks. The protected metal sample is protected using our novel closed-loop protection system using 2.4 - 4.25 mW power with protection feedback every 24 hours. The weight reduction of the freely corroding metal sample is 0.017533 weight percentage per day and for the protected metal sample is 0.003357 weight percentage per day. Hence, the weight lost of the freely corroded metal is 5.22 times faster than the protected metal sample.","PeriodicalId":166586,"journal":{"name":"19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-12-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131290123","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Study of adaptive tuning strategies for Near Field Communication (NFC) transmitter module 近场通信(NFC)发射机模块自适应调谐策略研究

19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings Pub Date : 2014-12-29 DOI: 10.1109/IMS3TW.2014.6997401

M. Dieng, F. Azais, M. Comte, S. Bernard, V. Kerzérho, M. Renovell, T. Kervaon, P. Pugliesi-Conti

引用次数: 4

An I2C based mixed-signal test and measurement infrastructure 基于I2C的混合信号测试和测量基础设施

19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings Pub Date : 2014-12-29 DOI: 10.1109/IMS3TW.2014.6997396

Antonio Jose Salazar Escobar, J. Machado da Silva, M. Correia

引用次数: 4

Non-intrusive built-in test for 65nm RF LNA 非侵入式内置测试65nm射频LNA

19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings Pub Date : 2014-12-29 DOI: 10.1109/IMS3TW.2014.6997397

Athanasios Dimakos, H. Stratigopoulos, A. Siligaris, S. Mir, E. de Foucauld

{"title":"Non-intrusive built-in test for 65nm RF LNA","authors":"Athanasios Dimakos, H. Stratigopoulos, A. Siligaris, S. Mir, E. de Foucauld","doi":"10.1109/IMS3TW.2014.6997397","DOIUrl":"https://doi.org/10.1109/IMS3TW.2014.6997397","url":null,"abstract":"In this paper, we discuss the use of non-intrusive sensors to enable a built-in test for a 65nm RF LNA. The non-intrusive sensors consist of single layout components copied from the topology of the LNA and dummy analog stages formed by identical components used in the topology of the LNA. The sensors are placed in close physical proximity to the LNA such that the sensor measurements track the performances of the LNA by virtue of die-to-die and correlated within-die process variations. In this way, the alternate test paradigm is used to infer the performances from the sensor measurements. Although the correlation between sensor measurements and performances is negatively affected by the uncorrelated within-die variations, we show that the correlation still holds strong even for the advanced 65nm technology node where this type of variations is more pronounced. In addition, we show that instead of using dummy area-hungry inductors to monitor inductance variability, we can obtain the same level of correlation by monitoring instead the sheet resistances of the metal lines that form the coil of the inductors.","PeriodicalId":166586,"journal":{"name":"19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-12-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125214555","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Low cost test architecture for mixed-signal integrated circuits 混合信号集成电路的低成本测试架构

19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings Pub Date : 2014-12-29 DOI: 10.1109/IMS3TW.2014.6997389

J. L. da Silva, E. Camargo, Douglas Foster, Sandro T. Coelho, A. G. de Oliveira, A. Olmos, M. Lubaszewski

引用次数: 0

Low cost implicit built-in self-test of passive RFID Tags 低成本隐含内置自检无源RFID标签

19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings Pub Date : 2014-12-29 DOI: 10.1109/IMS3TW.2014.6997390

Suvadeep Banerjee, D. Banerjee, A. Banerjee, Kyungmin Lee, A. Chatterjee

引用次数: 1

Fault mitigation strategies for Single Event Transients on SAR converters SAR变换器单事件瞬态故障缓解策略

19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings Pub Date : 2014-12-29 DOI: 10.1109/IMS3TW.2014.6997395

A. J. C. Lanot, T. Balen

引用次数: 4

Experimental verification of timing measurement circuit with self-calibration 定时测量电路自校准的实验验证

19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings Pub Date : 2014-12-29 DOI: 10.1109/IMS3TW.2014.6997393

Takeshi Chujo, D. Hirabayashi, Congbing Li, Yutaro Kobayashi, Junshan Wang, Haruo Kobayashi, Kentaroh Katoh, Sato Koshi

引用次数: 13