{"title":"ATPG混合信号电路使用商业数字工具","authors":"C. Wegener","doi":"10.1109/IMS3TW.2014.6997394","DOIUrl":null,"url":null,"abstract":"For digital circuits, Automatic Test Pattern Generation (ATPG) is a commercially solved problem. For circuits which contain analog components, intensive research and some commercial approaches are available.","PeriodicalId":166586,"journal":{"name":"19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings","volume":"111 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-12-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"ATPG for mixed-signal circuits using commercial digital tools\",\"authors\":\"C. Wegener\",\"doi\":\"10.1109/IMS3TW.2014.6997394\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"For digital circuits, Automatic Test Pattern Generation (ATPG) is a commercially solved problem. For circuits which contain analog components, intensive research and some commercial approaches are available.\",\"PeriodicalId\":166586,\"journal\":{\"name\":\"19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings\",\"volume\":\"111 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-12-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMS3TW.2014.6997394\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMS3TW.2014.6997394","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
ATPG for mixed-signal circuits using commercial digital tools
For digital circuits, Automatic Test Pattern Generation (ATPG) is a commercially solved problem. For circuits which contain analog components, intensive research and some commercial approaches are available.