Antonio Jose Salazar Escobar, J. Machado da Silva, M. Correia
{"title":"基于I2C的混合信号测试和测量基础设施","authors":"Antonio Jose Salazar Escobar, J. Machado da Silva, M. Correia","doi":"10.1109/IMS3TW.2014.6997396","DOIUrl":null,"url":null,"abstract":"The framework being proposed addresses the test and measurement of circuits and systems populated with varying types of sensors and functional blocks, among which one can find embedded test instruments. Its conceptual functionality is based on four types of operations: setup, capture, process, and scan (SCPS), and aims to provide a unifying methodology for managing and synchronizing test operations and instruments. The generalized physical structure and examples of operating commands are described. An application illustrates its use in a particular case.","PeriodicalId":166586,"journal":{"name":"19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-12-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"An I2C based mixed-signal test and measurement infrastructure\",\"authors\":\"Antonio Jose Salazar Escobar, J. Machado da Silva, M. Correia\",\"doi\":\"10.1109/IMS3TW.2014.6997396\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The framework being proposed addresses the test and measurement of circuits and systems populated with varying types of sensors and functional blocks, among which one can find embedded test instruments. Its conceptual functionality is based on four types of operations: setup, capture, process, and scan (SCPS), and aims to provide a unifying methodology for managing and synchronizing test operations and instruments. The generalized physical structure and examples of operating commands are described. An application illustrates its use in a particular case.\",\"PeriodicalId\":166586,\"journal\":{\"name\":\"19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-12-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMS3TW.2014.6997396\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMS3TW.2014.6997396","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An I2C based mixed-signal test and measurement infrastructure
The framework being proposed addresses the test and measurement of circuits and systems populated with varying types of sensors and functional blocks, among which one can find embedded test instruments. Its conceptual functionality is based on four types of operations: setup, capture, process, and scan (SCPS), and aims to provide a unifying methodology for managing and synchronizing test operations and instruments. The generalized physical structure and examples of operating commands are described. An application illustrates its use in a particular case.