{"title":"ATPG for mixed-signal circuits using commercial digital tools","authors":"C. Wegener","doi":"10.1109/IMS3TW.2014.6997394","DOIUrl":null,"url":null,"abstract":"For digital circuits, Automatic Test Pattern Generation (ATPG) is a commercially solved problem. For circuits which contain analog components, intensive research and some commercial approaches are available.","PeriodicalId":166586,"journal":{"name":"19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings","volume":"111 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-12-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMS3TW.2014.6997394","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
For digital circuits, Automatic Test Pattern Generation (ATPG) is a commercially solved problem. For circuits which contain analog components, intensive research and some commercial approaches are available.