Suvadeep Banerjee, D. Banerjee, A. Banerjee, Kyungmin Lee, A. Chatterjee
{"title":"Low cost implicit built-in self-test of passive RFID Tags","authors":"Suvadeep Banerjee, D. Banerjee, A. Banerjee, Kyungmin Lee, A. Chatterjee","doi":"10.1109/IMS3TW.2014.6997390","DOIUrl":null,"url":null,"abstract":"Testing of RFID Tags is complicated by the fact that the RFID chips must be tested both before and after antenna attach. The test procedure prior to chip attach must ensure, to the maximum extent possible, that any defects in the chip that can cause failure after antenna attach are detected with very high failure coverage. The test procedure after antenna attach must ensure that no failures are injected into the system during the antenna attach procedure itself. In both cases, the metric of performance that the RFID system is assessed against, is the maximum distance between the tag reader and the RFID tag at which reliable communication is established between the two. Since RFID tags are extremely low cost, BIST techniques for both test procedures are developed for inductively coupled RFID tags (ISM Band of 13.56 MHz) that are ultra low cost and require minimal hardware overhead (to justify cost considerations). It is shown that high manufacturing failure coverage is achieved with very low BIST overhead.","PeriodicalId":166586,"journal":{"name":"19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings","volume":"543 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-12-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMS3TW.2014.6997390","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Testing of RFID Tags is complicated by the fact that the RFID chips must be tested both before and after antenna attach. The test procedure prior to chip attach must ensure, to the maximum extent possible, that any defects in the chip that can cause failure after antenna attach are detected with very high failure coverage. The test procedure after antenna attach must ensure that no failures are injected into the system during the antenna attach procedure itself. In both cases, the metric of performance that the RFID system is assessed against, is the maximum distance between the tag reader and the RFID tag at which reliable communication is established between the two. Since RFID tags are extremely low cost, BIST techniques for both test procedures are developed for inductively coupled RFID tags (ISM Band of 13.56 MHz) that are ultra low cost and require minimal hardware overhead (to justify cost considerations). It is shown that high manufacturing failure coverage is achieved with very low BIST overhead.
RFID标签的测试是复杂的,因为RFID芯片必须在天线连接之前和之后进行测试。贴片前的测试程序必须尽可能确保贴片后芯片中任何可能导致失效的缺陷都能以非常高的失效覆盖率被检测到。天线连接后的测试程序必须确保在天线连接过程中没有故障注入系统。在这两种情况下,评估RFID系统的性能指标是标签阅读器和RFID标签之间的最大距离,在该距离上两者之间建立了可靠的通信。由于RFID标签成本极低,因此针对电感耦合RFID标签(ISM Band of 13.56 MHz)开发了两种测试过程的BIST技术,这些标签成本极低,并且需要最小的硬件开销(以证明成本考虑)。结果表明,以非常低的BIST开销实现高的制造故障覆盖率。