Tianyu Wu, Anuraag Jajoo, Hee-Jin Choi, Benjamin Watson
{"title":"Real-time per-pixel predistortion for head-tracked light field displays","authors":"Tianyu Wu, Anuraag Jajoo, Hee-Jin Choi, Benjamin Watson","doi":"10.1002/jsid.2062","DOIUrl":"10.1002/jsid.2062","url":null,"abstract":"<p>The latest light-field displays (LFDs) have improved greatly with head tracking but continue to be based on the approximate pinhole model, meaning that cross-talk is often visible at large viewing angles and when virtual objects are distant from the display panel. To address these problems, our real-time LFD technique evaluates a full optical model for every frame and then displays an image predistorted during ray-traced rendering at the subpixel level to the current pixel-to-eye light flow, reducing cross-talk and increasing viewing angle. A comparison to imagery produced with the pinhole model shows clear advantages for our LFD technique, and in a user study with interactive, head-tracked display of several different scenes, viewers reported a significant preference for our novel LFD technique. Our unoptimized prototype implementation is already real time, and as GPUs improve in performance and ray tracing becomes increasingly common, we expect that our LFD technique will be easy to add to a variety of 3D applications, including games.</p>","PeriodicalId":49979,"journal":{"name":"Journal of the Society for Information Display","volume":"33 5","pages":"664-680"},"PeriodicalIF":2.2,"publicationDate":"2025-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1002/jsid.2062","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144598770","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Mesh-patterned silver electrode via electrohydrodynamic printing for transparent and flexible quantum-dot light-emitting diodes","authors":"Suyoun Kim, Jong Ho Park, Yongtaek Hong","doi":"10.1002/jsid.2080","DOIUrl":"10.1002/jsid.2080","url":null,"abstract":"<p>A precise and efficient patterning method for mesh-structured electrodes is crucial for fabricating transparent and flexible quantum-dot light-emitting diodes (TF-QLEDs). In this study, we present an electrohydrodynamic (EHD) printing method to directly pattern Ag mesh electrodes on flexible QLED devices, eliminating the need for sacrificial layers or chemical etching. By investigating the printing parameters, we achieved Ag mesh electrodes with excellent optical transparency exceeding 84%T, electrical conductivity with a sheet resistance of less than 8 Ω/sq, and mechanical stability with less than 5% variation after over 2000 bending cycles. These mesh-patterned electrodes demonstrated superior characteristics compared to conventional electrodes. Additionally, the device efficiency of mesh-patterned electrodes was comparable to that of conventional planar electrodes, making them highly suitable for flexible electronic devices. This method offers significant advantages in transparency, flexibility, and cost-efficiency, presenting a promising approach for the fabrication of next-generation flexible displays.</p>","PeriodicalId":49979,"journal":{"name":"Journal of the Society for Information Display","volume":"33 5","pages":"681-688"},"PeriodicalIF":2.2,"publicationDate":"2025-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1002/jsid.2080","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144598767","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Electroless fabrication of super uniform nickel bumps on the TFT driver substrates for micro-LED display","authors":"Shuaishuai Wang, Yu Lu, Kaixin Zhang, Zhonghang Huang, Tianxi Yang, Chang Lin, Jie Sun, Qun Yan, Tailiang Guo","doi":"10.1002/jsid.2088","DOIUrl":"10.1002/jsid.2088","url":null,"abstract":"<p>This study aims to achieve high-yield micro-LED chip bonding and thus further advance the innovation of micro-LED interconnection technology. In this research, an electroless plating method was used to achieve the highly uniform nickel bump arrays on a thin-film transistor (TFT) driver substrate. Initially, the photoresists AZ4620 and AZ2070 are chosen for the experiments, which can cover the step structure uniformly of TFT substrate. Subsequently, the shape of bumps on the TFT substrate influenced by the plasma treatment and the deposition time was investigated. The result indicated that microbump arrays with a uniformity of less than 1% could be successfully fabricated by employing a 5-min plasma treatment and incorporating surfactant additions at concentrations of 0.02%, and the process of preparation has a high repeatability, which lays a solid foundation for the subsequent electroless plating bonding, and provides a critical reference for the breakthrough of micro-LED interconnection key technology.</p>","PeriodicalId":49979,"journal":{"name":"Journal of the Society for Information Display","volume":"33 7","pages":"852-860"},"PeriodicalIF":2.2,"publicationDate":"2025-04-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144673059","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Optical measurement with foveated rendering and dynamic compensation in eye-tracking near-eye displays","authors":"Congshan Rui, Yining Li, Pengfei Li, Guanghang Mei, Mengna Zhao, Dongliang Shi, Xing Sun, Lei Zhao","doi":"10.1002/jsid.2081","DOIUrl":"10.1002/jsid.2081","url":null,"abstract":"<p>Eye-tracking technology has been widely adopted in the extended reality (XR) industry, particularly in applications such as foveated rendering, eye-tracking interactions, and optical algorithm compensation, enhancing user immersion and providing smooth virtual experiences. For near-eye display systems integrated with eye-tracking capabilities, optical performance metrics such as the contrast transfer function (CTF), distortion, chromaticity uniformity (CU), and chromatic aberration (CA) vary with shifts in the user's fixation point, rendering traditional measurement methods inadequate for such systems. To address this, this paper proposes a novel approach for measuring CTF based on foveated rendering, as well as a dynamic compensation-based method for assessing distortion, CU and CA in eye-tracking near-eye display systems. Experiments are conducted to measure the CTF under both eye-tracked foveated rendering (ETFR) and fixed foveated rendering (FFR). The results demonstrate that the CTF under ETFR is higher than that under FFR, more accurately reflecting the image clarity perceived by the human eye. Additionally, CU shows marked improvement after compensation, with a noticeable reduction in green color shift. The average \u0000<span></span><math>\u0000 <mo>∆</mo>\u0000 <msup>\u0000 <mi>u</mi>\u0000 <mo>′</mo>\u0000 </msup>\u0000 <msup>\u0000 <mi>v</mi>\u0000 <mo>′</mo>\u0000 </msup></math> decreases from 0.0092 to 0.0042, suggesting improved CU. Moreover, dynamic distortion is effectively mitigated after compensation. However, CA exhibited no significant improvement after compensation.</p>","PeriodicalId":49979,"journal":{"name":"Journal of the Society for Information Display","volume":"33 5","pages":"653-663"},"PeriodicalIF":2.2,"publicationDate":"2025-04-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144598344","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Effective 10-bit OLED driver IC with 11-bit DAC, double capacitor-coupled adder, and offset calibration for enhanced panel driving","authors":"Changwhan Kim, Sewon Lee, Minjae Lee","doi":"10.1002/jsid.2068","DOIUrl":"10.1002/jsid.2068","url":null,"abstract":"<p>In this paper, we propose an 11-bit source driver IC optimized for high-resolution OLED display driving. The proposed IC adopts a Double Capacitor Coupled Adder (DCCA) structure, which enables parallel execution of the sampling and driving stages, thereby improving temporal efficiency and response speed. Additionally, we introduce a novel Slew Rate Enhancement (SRE) structure that enables rapid response even in conditions with minimal input–output voltage differences, delivering performance well-suited for high-resolution display driving. An Offset Calibration circuit is included to minimize inter-channel voltage discrepancies, ensuring high precision and consistent output performance. Experimental results demonstrate that the proposed IC achieves a short horizontal line time(H) of 2.0 μs and a slew rate of 9.9 V/μs. The differential nonlinearity (DNL) and integral nonlinearity (INL) are 0.66 LSB and 0.98 LSB, respectively, and, after Offset Calibration, the maximum inter-channel deviation of output voltage (DVO) is reduced to 2.43 mV.</p>","PeriodicalId":49979,"journal":{"name":"Journal of the Society for Information Display","volume":"33 5","pages":"644-652"},"PeriodicalIF":2.2,"publicationDate":"2025-04-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1002/jsid.2068","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144598343","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Boyu Li, Zhilin Ai, Baizhou Jiang, Binxiao Huang, Jason Chun Lok Li, Jie Liu, Zhengyuan Tu, Guoyu Wang, Daihai Yu, Ngai Wong
{"title":"BDLUT: Blind image denoising with hardware-optimized look-up tables","authors":"Boyu Li, Zhilin Ai, Baizhou Jiang, Binxiao Huang, Jason Chun Lok Li, Jie Liu, Zhengyuan Tu, Guoyu Wang, Daihai Yu, Ngai Wong","doi":"10.1002/jsid.2075","DOIUrl":"10.1002/jsid.2075","url":null,"abstract":"<p>Denoising sensor-captured images on edge display devices remains challenging due to deep neural networks' (DNNs) high computational overhead and synthetic noise training limitations. This work proposes BDLUT(-D), a novel blind denoising method combining optimized lookup tables (LUTs) with hardware-centric design. While BDLUT describes the LUT-based network architecture, BDLUT-D represents BDLUT trained with a specialized noise degradation model. Designed for edge deployment, BDLUT(-D) eliminates neural processing units (NPUs) and functions as a standalone ASIC IP solution. Experimental results demonstrate BDLUT-D achieves up to 2.42 dB improvement over state-of-the-art LUT methods on mixed-noise-intensity benchmarks, requiring only 66 KB storage. FPGA implementation shows over 10\u0000<span></span><math>\u0000 <mo>×</mo></math> reduction in logic resources, 75% less storage compared to DNN accelerators, while achieving 57% faster processing than traditional bilateral filtering methods. These optimizations enable practical integration into edge scenarios like low-cost webcam enhancement and real-time 4 K-to-4 K denoising without compromising resolution or latency. By enhancing silicon efficiency and removing external accelerator dependencies, BDLUT(-D) establishes a new standard for practical edge imaging denoising. Implementation is available at https://github.com/HKU-LiBoyu/BDLUT.</p>","PeriodicalId":49979,"journal":{"name":"Journal of the Society for Information Display","volume":"33 5","pages":"628-643"},"PeriodicalIF":2.2,"publicationDate":"2025-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1002/jsid.2075","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144598331","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Wan-Nung Tsung, Xuan-Yong Lin, Hua-Wei Liu, Shang-Yu Su, Chen-Yu Lin, Feng-Ting Pai, Chih-Chang Lai, Ching-Chun Lin
{"title":"A color and brightness shift compensation method for OLED TDDI panel using metal mesh capacitive touch sensor with temperature sensing","authors":"Wan-Nung Tsung, Xuan-Yong Lin, Hua-Wei Liu, Shang-Yu Su, Chen-Yu Lin, Feng-Ting Pai, Chih-Chang Lai, Ching-Chun Lin","doi":"10.1002/jsid.2079","DOIUrl":"10.1002/jsid.2079","url":null,"abstract":"<p>Color and luminance of OLED panel may shift under different ambient temperatures. To address this, raw data from touch sensors can be used to obtain local temperature information. By using this data, the proposed compensation method can be employed to solve the effects of temperature-induced color and luminance shifts. After compensation, OLED panels can provide a more stable and reliable visual experience in diverse ambient temperatures.</p>","PeriodicalId":49979,"journal":{"name":"Journal of the Society for Information Display","volume":"33 5","pages":"616-627"},"PeriodicalIF":2.2,"publicationDate":"2025-04-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144598460","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Hydrogen-free oxide thin-film transistor toward resolving hydrogen-associated instability","authors":"Mamoru Furuta, Mir Mutakabbir Alom, Motoki Ando, Yoshihiro Sato, Takafumi Kambe, Tsutomu Satoyoshi","doi":"10.1002/jsid.2084","DOIUrl":"10.1002/jsid.2084","url":null,"abstract":"<p>We propose and demonstrate the concept of hydrogen-free (H-free) amorphous oxide semiconductor thin-film transistors (AOS TFTs) to resolve hydrogen-associated instability of TFT. H-free SiO<sub>2</sub> and SiN<sub>x</sub> films were successfully deposited by large-area inductively coupled plasma chemical vapor deposition (ICP-CVD) using hydrogen-free source gases. H-free SiO<sub>2</sub> and SiN<sub>x</sub> films were applied as the gate insulator and passivation layers of the TFT, respectively. The H-free In–Ga–Zn–Sn–O (IGZTO) TFT exhibited field-effect mobility of 23.2 cm<sup>2</sup>V<sup>−1</sup> s<sup>−1</sup> and excellent stability under positive gate bias stresses for 7,200 s at stress temperatures in the range of 60–100°C.</p>","PeriodicalId":49979,"journal":{"name":"Journal of the Society for Information Display","volume":"33 5","pages":"582-593"},"PeriodicalIF":2.2,"publicationDate":"2025-04-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144598287","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Taewoong Kim, Jinhwan Choi, Minsung Kim, Hyungsik Kim, Jeongho Kim, Sunho Kim, Boik Park
{"title":"Highly recoverable and robust rollable AMOLED display with smart elastomer materials","authors":"Taewoong Kim, Jinhwan Choi, Minsung Kim, Hyungsik Kim, Jeongho Kim, Sunho Kim, Boik Park","doi":"10.1002/jsid.2087","DOIUrl":"10.1002/jsid.2087","url":null,"abstract":"<p>A new highly recoverable and robust AMOLED display with a novel double-stacked structure consisting of two smart elastomer layers with high modulus and low modulus was suggested and significantly improved pen drop height from 2 cm to 9.5 cm with additional special treatment for elastomer layer removing electro-static damage on panel image, coming from the increase of gate voltage of 1.2 V due to repeated friction between top layer and bottom layer during cyclic rolling. The top protective layer of elastomer enormously reduced the strain of the panel and PSA and therefore, lessened the deformation height of the rollable display at the edge up to 4 mm after a rolling radius of 15 mm and rolling cycles of 200,000, which looks almost flat. The top protective layer of elastomer with tensile hardening property was able to remarkably increase the energy damping effect for the pen drop test and led to the rise of pen drop height. The unique rolling strain distribution was systematically studied using a strain gauge sensor and simulation tool and validated by experimental results. This novel double-stacked structure also showed outstanding environmental reliability results as well.</p>","PeriodicalId":49979,"journal":{"name":"Journal of the Society for Information Display","volume":"33 5","pages":"594-605"},"PeriodicalIF":2.2,"publicationDate":"2025-04-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144598288","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Ji Nan, Yupei Zhang, Yepeng Xiang, Yu Zhang, Long Chen, Bong-Geum Lee
{"title":"Degradation analysis of organic charge generation layer by impedance spectroscopy","authors":"Ji Nan, Yupei Zhang, Yepeng Xiang, Yu Zhang, Long Chen, Bong-Geum Lee","doi":"10.1002/jsid.2089","DOIUrl":"10.1002/jsid.2089","url":null,"abstract":"<p>Understanding the degradation mechanisms of the charge generation layer (CGL) is crucial for developing stable tandem organic light-emitting diodes (OLEDs). Using capacitance-voltage (C-V) measurements and modulus spectroscopy, we visualized the charge distribution within the CGL and analyzed its changes before and after aging. Results indicate that the degradation of the CGL is primarily driven by dopant diffusion, which induces impurity compensation at the interface and increases the driving voltage. Equivalent circuit fitting further quantified the changes in resistance and capacitance across layers, confirming the impact of dopant diffusion on CGL performance. Additionally, the role of spontaneous orientation polarization (SOP) in CGL stability was explored, suggesting its potential influence on the interface barrier height. These findings provide insights for optimizing the CGL design to enhance the long-term stability of tandem OLEDs.</p>","PeriodicalId":49979,"journal":{"name":"Journal of the Society for Information Display","volume":"33 5","pages":"606-615"},"PeriodicalIF":2.2,"publicationDate":"2025-04-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144598289","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}