Zengyi Peng, Min Li, Hua Xu, Miao Xu, Lei Wang, Weijing Wu, Junbiao Peng, Zhuliang Yu
{"title":"Designing Manufacturing Process for Oxide Thin-Film Transistors Based on End-to-End Graph Convolutional Networks Model","authors":"Zengyi Peng, Min Li, Hua Xu, Miao Xu, Lei Wang, Weijing Wu, Junbiao Peng, Zhuliang Yu","doi":"10.1002/jsid.2104","DOIUrl":"https://doi.org/10.1002/jsid.2104","url":null,"abstract":"<div>\u0000 \u0000 <p>Large-area, high-resolution organic light-emitting diode (OLED) displays require high-performance oxide thin-film transistors (TFTs) with excellent mobility and stability, as well as little threshold voltage shift, especially for G8.5+ OLED production lines. Our previous work demonstrated rare-earth doped oxides are ideal channel layer materials for TFTs due to their superior mobility and stability. However, scaling up TFT production from pilot lines to mass manufacturing poses significant challenges, largely because of the complexity of multi-element composite materials and intricate processes. In this study, an end-to-end graph convolutional network (GCN) model is employed to optimize TFT production processes. By encoding process parameters as graph nodes and features, the GCN effectively predicts critical drain current–gate voltage (I–V) characteristics, enabling precise calculation of electron mobility, subthreshold slope, and threshold voltage. The model achieves a mean absolute percentage error of 19.9% on validation data. Based on the optimized parameters, a TFT device with properties including a mobility of 37.8 cm<sup>2</sup>/Vs, a threshold voltage of 0.9 V, and a subthreshold slope of 0.62 V/dec was successfully produced. These results highlight the potential of GCN-based models to address the complexities of TFT mass production, providing a powerful tool for process optimization and performance enhancement.</p>\u0000 </div>","PeriodicalId":49979,"journal":{"name":"Journal of the Society for Information Display","volume":"33 10","pages":"1046-1052"},"PeriodicalIF":2.2,"publicationDate":"2025-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145230773","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Sultan El Badaoui, Patrick Le Maitre, Anthony Cibié, Julia Simon, Aurélien Lardeau-Falcy, Jeremy Bilde, Louwenn Cherruault, Manon Arch, Michael Pelissier, Yannis Le Guennec
{"title":"SPICE Modeling of GaN MicroLEDs for Optical Communication","authors":"Sultan El Badaoui, Patrick Le Maitre, Anthony Cibié, Julia Simon, Aurélien Lardeau-Falcy, Jeremy Bilde, Louwenn Cherruault, Manon Arch, Michael Pelissier, Yannis Le Guennec","doi":"10.1002/jsid.2105","DOIUrl":"https://doi.org/10.1002/jsid.2105","url":null,"abstract":"<p>With the rapid expansion of data centers, there is a growing demand for high data-rate, energy-efficient optical links over short distances. One potential technology for this application is Gallium-Nitride (GaN) based microlight emitting diodes (μLEDs), thanks to their compact size, high-speed operation, and ease of manufacturability. During the development of these μLEDs, modeling plays an essential role in optimizing their performance. In this paper, we present various models to estimate both the static and dynamic performance of GaN μLEDs of various sizes. We then propose a methodology to integrate these models into a unified equivalent circuit model, enabling the simulation of the full response of the μLED. Finally, we implement this unified model in a circuit-simulation-compatible module and replicate the experimental setups within a simulation software to evaluate the module's ability to accurately simulate the μLED's response.</p>","PeriodicalId":49979,"journal":{"name":"Journal of the Society for Information Display","volume":"33 10","pages":"1030-1045"},"PeriodicalIF":2.2,"publicationDate":"2025-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sid.onlinelibrary.wiley.com/doi/epdf/10.1002/jsid.2105","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145230799","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Narrower Emission Spectra From Multicolor InGaN Quantum Wells Monolithically Integrated on Polyhedral-Shaped GaN Templates","authors":"Yoshinobu Matsuda, Mitsuru Funato, Yoichi Kawakami","doi":"10.1002/jsid.2103","DOIUrl":"https://doi.org/10.1002/jsid.2103","url":null,"abstract":"<div>\u0000 \u0000 <p>InGaN-based quantum wells (QWs) integrated on arbitrary-shaped 3D GaN templates are promising light sources for ultra-high-resolution micro-LED displays. In this paper, we first demonstrate that the emissions from InGaN QWs on polyhedral-shaped GaN templates are broader than those from planar QWs. Microscopic observations by scanning electron microscopy and cathodoluminescence spectroscopy reveal that the broad emission is due to surface undulations formed during the crystal regrowth of the QW regions on the GaN templates. To suppress the formation of undulations, we subject 3D GaN templates to chemical mechanical polishing before the regrowth. This method successfully reduces the emission spectral width by \u0000<span></span><math>\u0000 <mo>∼</mo></math>20% and can be a standard process for the growth integration of multicolor micro-LEDs.</p>\u0000 </div>","PeriodicalId":49979,"journal":{"name":"Journal of the Society for Information Display","volume":"33 10","pages":"1023-1029"},"PeriodicalIF":2.2,"publicationDate":"2025-08-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145230834","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Novel LED Spherical Visual Display System and Its Geometric Calibration Method","authors":"Yi-Xiong Zeng, Bo Xu, Kun Qiu","doi":"10.1002/jsid.2102","DOIUrl":"https://doi.org/10.1002/jsid.2102","url":null,"abstract":"<div>\u0000 \u0000 <p>Visual display systems are widely utilized in simulation training systems due to their ability to provide users with realistic visual representations. To achieve a more immersive display experience, these systems typically expand the field of view by combining multiple display devices. This paper proposes a novel spherical dome display system based on LED technology, designed to achieve a full-field, high-definition spherical display. The study focuses on the display driving mechanism of the dome, introducing a channel segmentation method to enable efficient driving. To address the geometric distortion that occurs when planar images are projected onto a spherical surface, a targeted geometric correction method is proposed. The theoretical principles and correction process are explained in detail. Through algorithm simulations and experimental validation, the proposed channel segmentation and geometric correction methods effectively reduce the number of driving channels required for the LED spherical display, decrease image processing complexity, and simplify hardware implementation. The corrected images are free from distortion and deformation, with smooth, misalignment-free transitions between channels. These methods ensure the proper functionality of the proposed LED spherical display, thereby supporting its widespread application.</p>\u0000 </div>","PeriodicalId":49979,"journal":{"name":"Journal of the Society for Information Display","volume":"33 10","pages":"1013-1022"},"PeriodicalIF":2.2,"publicationDate":"2025-07-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145230855","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Multi-Stage Reset Driving Scheme Based on the Sawtooth Function for Suppressing Oil Splitting of Electrowetting Displays","authors":"Hongwei Jiang, Zhengxing Long, Qianru Chen, Zichuan Yi, Dan Wang, Biao Tang, Dong Yuan, Qinghua Zhong, Guofu Zhou","doi":"10.1002/jsid.2101","DOIUrl":"10.1002/jsid.2101","url":null,"abstract":"<div>\u0000 \u0000 <p>Electrowetting display (EWD) is a new reflective “paper-like” display technology based on fast response microfluidic manipulation technology. It has the advantages of low energy consumption, visual health, and flexibility. However, EWDs are often plagued by oil splitting phenomena and charge trapping effects during a driving process, seriously affecting their display performance. Therefore, a new multi-stage reset driving scheme based on a sawtooth function was proposed, which could effectively solve these defects. It consisted of a shrinking stage and a stabilizing stage. First, the proposed driving scheme was driven by a negative voltage by analyzing the voltage characteristic curve. Second, based on the splitting theory, an exponential function was applied to make the pixel's oil rupture quickly. Then, a sawtooth function was applied to enable oil to achieve secondary fusion during the cyclic driving process, effectively reducing the dispersed residual oil in pixels. Finally, a reset signal was introduced to release captured charges and suppress oil backflow. Experimental results showed that the response time was reduced by 25% compared with the exponential function driving scheme. Compared with the negative PWM pulse modulation driving scheme, the average brightness was improved by 9.5%.</p>\u0000 </div>","PeriodicalId":49979,"journal":{"name":"Journal of the Society for Information Display","volume":"33 9","pages":"993-1005"},"PeriodicalIF":2.2,"publicationDate":"2025-07-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144935382","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Mingfang Chen, Xiangfei Kong, Sen Wang, Yongxia Zhang
{"title":"Research and Application of Lightweight Network Architecture for Real-Time Detection of TFT-LCD Display Defects","authors":"Mingfang Chen, Xiangfei Kong, Sen Wang, Yongxia Zhang","doi":"10.1002/jsid.2099","DOIUrl":"10.1002/jsid.2099","url":null,"abstract":"<div>\u0000 \u0000 <p>The mura defects of thin-film transistor liquid crystal display (TFT-LCD) panels exhibit characteristics of low contrast and random positioning, resulting in issues such as low accuracy in defect identification and poor user experience. This paper proposes a lightweight YOLO-SPPAM network. Based on the spatial pyramid pooling (SPP) module belonging to YOLOX, the newly constructed spatial pyramid pooling attention (SPPA) module allows the network to focus on salient target regions, enhancing the model's ability to perceive crucial features. This paper introduces augmentable convolutional block attention module (ACBAM) to obtain parallel dual-channel attention by parallel processing of channel attention and spatial attention. The paper replaces ordinary convolutions in down sampling with fine-grained separable convolution module (FGSCM). Qualitative and quantitative comparison experiments with state-of-the-art algorithms on a self-made TFT-LCD mura defects dataset demonstrate that YOLO-SPPAM outperforms in terms of accuracy and speed, meeting the real-time requirements of TFT-LCD defect detection tasks.</p>\u0000 </div>","PeriodicalId":49979,"journal":{"name":"Journal of the Society for Information Display","volume":"33 9","pages":"977-992"},"PeriodicalIF":2.2,"publicationDate":"2025-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144935377","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Riemannian Color Difference Metric for Spatial Color Gratings","authors":"Patrick Candry, Kristiaan Neyts","doi":"10.1002/jsid.2100","DOIUrl":"10.1002/jsid.2100","url":null,"abstract":"<div>\u0000 \u0000 <p>We developed a new Riemannian color difference metric for static spatial sinusoidal color variations. With this metric, one can predict, in any direction of the color space, the detection threshold of sinusoidal color variations. The metric includes the angular size, spatial frequency, luminance, and chromaticity of the grating. The metric is based on the Riemannian color difference metric for split fields that we developed earlier and models for contrast sensitivity functions of the isolated achromatic, red–green, and blue–yellow detection mechanisms. We validated the models of the contrast sensitivity functions against various datasets. The color difference metric was validated against datasets of isoluminous chromatic Gabor gratings at various spatial frequencies and various color centers. We found adequate agreement with these datasets. The results are presented in the CIELAB \u0000<span></span><math>\u0000 <mo>(</mo>\u0000 <msup>\u0000 <mrow>\u0000 <mi>a</mi>\u0000 </mrow>\u0000 <mrow>\u0000 <mo>∗</mo>\u0000 </mrow>\u0000 </msup>\u0000 <mo>,</mo>\u0000 <msup>\u0000 <mrow>\u0000 <mi>b</mi>\u0000 </mrow>\u0000 <mrow>\u0000 <mo>∗</mo>\u0000 </mrow>\u0000 </msup>\u0000 <mo>)</mo></math> plane.</p>\u0000 </div>","PeriodicalId":49979,"journal":{"name":"Journal of the Society for Information Display","volume":"33 9","pages":"964-976"},"PeriodicalIF":2.2,"publicationDate":"2025-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144935412","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Boyu Li, Zhilin Ai, Baizhou Jiang, Binxiao Huang, Jason Chun Lok Li, Jie Liu, Zhengyuan Tu, Guoyu Wang, Daihai Yu, Ngai Wong
{"title":"Cover Image, Volume 33, Issue 5","authors":"Boyu Li, Zhilin Ai, Baizhou Jiang, Binxiao Huang, Jason Chun Lok Li, Jie Liu, Zhengyuan Tu, Guoyu Wang, Daihai Yu, Ngai Wong","doi":"10.1002/jsid.2093","DOIUrl":"10.1002/jsid.2093","url":null,"abstract":"<p>The cover image is based on the article <i>BDLUT: Blind Image Denoising with Hardware-Optimized Look-Up Tables</i> by Ngai Wong et al., https://doi.org/10.1002/jsid.2075\u0000 \u0000 <figure>\u0000 <div><picture>\u0000 <source></source></picture><p></p>\u0000 </div>\u0000 </figure></p><p>The SID logo is reproduced with permission of the Society for Information Display.</p>","PeriodicalId":49979,"journal":{"name":"Journal of the Society for Information Display","volume":"33 5","pages":""},"PeriodicalIF":2.2,"publicationDate":"2025-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1002/jsid.2093","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144598429","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Stereopsis–Occlusion Conflicts Impair Visual Performance in Augmented Reality","authors":"Daniel P. Spiegel, Ian M. Erkelens","doi":"10.1002/jsid.2095","DOIUrl":"10.1002/jsid.2095","url":null,"abstract":"<p>Binocular rendering in augmented reality (AR) displays is prone to several artifacts that can impact visual performance, comfort, and user experience. A number of these artifacts stem from conflicts in the visual system. Vergence–accommodation conflicts (VAC), that is, the mismatch between vergence demand (driven by the horizontal binocular disparity of the augmentation) and the accommodative demand (driven by the focal distance of the display), and their impact on visual processing have been well described. However, other conflicts such stereopsis–occlusion conflicts, stemming from the absent or erroneous occlusion of the augmentations when rendered in depth behind a physical object, remain rather underexplored. In this study, we mainly focused on the impact of stereopsis–occlusion conflicts on visual performance. The results indicate that stereopsis–occlusion conflicts are a real concern for an effortless and immersive AR experience and that stereopsis–occlusion conflicts, under certain conditions, can be more detrimental to visual performance than VAC.</p>","PeriodicalId":49979,"journal":{"name":"Journal of the Society for Information Display","volume":"33 8","pages":"937-947"},"PeriodicalIF":2.2,"publicationDate":"2025-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sid.onlinelibrary.wiley.com/doi/epdf/10.1002/jsid.2095","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145128961","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Yurim Jang, Geon-Ho Park, Jinah Kim, Changeui Hong, Seung-Won Jung
{"title":"Underexposed Image Enhancement for Mura Compensation in Display Panels","authors":"Yurim Jang, Geon-Ho Park, Jinah Kim, Changeui Hong, Seung-Won Jung","doi":"10.1002/jsid.2097","DOIUrl":"10.1002/jsid.2097","url":null,"abstract":"<div>\u0000 \u0000 <p>Mura, a form of uneven brightness on display panels, manifests as visible artifacts that compromise display quality. Conventional mura compensation methods rely on long-exposure imaging to accurately capture subtle brightness inconsistencies, but this approach is time-intensive and unsuitable for high-throughput manufacturing. In this study, we propose a novel method that leverages underexposed image enhancement to estimate mura compensation data using short-exposure imaging. Specifically, we introduce a novel mura compensation loss function designed to minimize discrepancies in compensation data derived from long- and short-exposure images. To facilitate supervised training, we construct a dataset comprising paired long- and short-exposure images of display panels with real and synthesized mura patterns. Our experimental results demonstrate the effectiveness of the proposed approach, showing that the enhancement network trained with the proposed loss function achieves precise mura compensation while significantly reducing imaging time, offering a practical solution for efficient manufacturing processes.</p>\u0000 </div>","PeriodicalId":49979,"journal":{"name":"Journal of the Society for Information Display","volume":"33 9","pages":"955-963"},"PeriodicalIF":2.2,"publicationDate":"2025-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144934784","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}