Underexposed Image Enhancement for Mura Compensation in Display Panels

IF 2.2 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Yurim Jang, Geon-Ho Park, Jinah Kim, Changeui Hong, Seung-Won Jung
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引用次数: 0

Abstract

Mura, a form of uneven brightness on display panels, manifests as visible artifacts that compromise display quality. Conventional mura compensation methods rely on long-exposure imaging to accurately capture subtle brightness inconsistencies, but this approach is time-intensive and unsuitable for high-throughput manufacturing. In this study, we propose a novel method that leverages underexposed image enhancement to estimate mura compensation data using short-exposure imaging. Specifically, we introduce a novel mura compensation loss function designed to minimize discrepancies in compensation data derived from long- and short-exposure images. To facilitate supervised training, we construct a dataset comprising paired long- and short-exposure images of display panels with real and synthesized mura patterns. Our experimental results demonstrate the effectiveness of the proposed approach, showing that the enhancement network trained with the proposed loss function achieves precise mura compensation while significantly reducing imaging time, offering a practical solution for efficient manufacturing processes.

Abstract Image

Abstract Image

Abstract Image

显示面板中Mura补偿的曝光不足图像增强
Mura是显示面板上亮度不均匀的一种形式,表现为影响显示质量的可见伪影。传统的村补偿方法依赖于长时间曝光成像来准确捕捉细微的亮度不一致,但这种方法耗时长,不适合高通量制造。在这项研究中,我们提出了一种新的方法,利用曝光不足的图像增强来估计村补偿数据使用短曝光成像。具体来说,我们引入了一种新的村补偿损失函数,旨在最大限度地减少长曝光和短曝光图像中补偿数据的差异。为了便于监督训练,我们构建了一个数据集,该数据集包含具有真实和合成mura图案的显示面板的成对长曝光和短曝光图像。我们的实验结果证明了所提出方法的有效性,表明使用所提出的损失函数训练的增强网络在实现精确的mura补偿的同时显着减少了成像时间,为高效制造过程提供了实用的解决方案。
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来源期刊
Journal of the Society for Information Display
Journal of the Society for Information Display 工程技术-材料科学:综合
CiteScore
4.80
自引率
8.70%
发文量
98
审稿时长
3 months
期刊介绍: The Journal of the Society for Information Display publishes original works dealing with the theory and practice of information display. Coverage includes materials, devices and systems; the underlying chemistry, physics, physiology and psychology; measurement techniques, manufacturing technologies; and all aspects of the interaction between equipment and its users. Review articles are also published in all of these areas. Occasional special issues or sections consist of collections of papers on specific topical areas or collections of full length papers based in part on oral or poster presentations given at SID sponsored conferences.
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