Soldering & Surface Mount Technology最新文献

{"title":"Formation and growth mechanism of thin Cu6Sn5 films in Sn/Cu and Sn-0.1AlN/Cu structures using laser heating","authors":"Zhang Liang","doi":"10.1108/ssmt-05-2023-0021","DOIUrl":"https://doi.org/10.1108/ssmt-05-2023-0021","url":null,"abstract":"<h3>Purpose</h3>\u0000<p>The purpose of this study is the formation and growth of nanoscale intermetallic compounds (IMCs) when laser is used as a heat source to form solder joints.</p><!--/ Abstract__block -->\u0000<h3>Design/methodology/approach</h3>\u0000<p>This study investigates the Sn/Cu and Sn-0.1AlN/Cu structure using laser soldering under different laser power: (200, 225 and 250 W) and heating time: (2, 3 and 4 s).</p><!--/ Abstract__block -->\u0000<h3>Findings</h3>\u0000<p>The results show clearly that the formation of nano-Cu₆Sn₅ films is feasible in the laser heating (200 W and 2 s) with Sn/Cu and Sn-0.1AlN/Cu system. The nano-Cu₆Sn₅ films with thickness of 500 nm and grains with 700 nm are generally parallel to the Cu surface with Sn-0.1AlN. Both IMC films thickness of Sn/Cu and Sn-0.1AlN/Cu solder joints gradually increased from 524.2 to 2025.8 nm as the laser heating time and the laser power extended. Nevertheless, doping AlN nanoparticles can slow down the growth rate of Cu₆Sn₅ films in Sn solder joints due to its adsorption.</p><!--/ Abstract__block -->\u0000<h3>Originality/value</h3>\u0000<p>The formation of nano-Cu₆Sn₅ films using laser heating can provide a new method for nanofilm development to realize the metallurgical interconnection in electronic packaging.</p><!--/ Abstract__block -->","PeriodicalId":49499,"journal":{"name":"Soldering & Surface Mount Technology","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-08-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142202274","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Influence of annealing temperature on 3D surface stereometric analysis in C-Ni films","authors":"Vali Dalouji, Nasim Rahimi","doi":"10.1108/ssmt-08-2023-0043","DOIUrl":"https://doi.org/10.1108/ssmt-08-2023-0043","url":null,"abstract":"<h3>Purpose</h3>\u0000<p>The purpose of this paper is to study the correlation between the thicknesses of the C–Ni films that have been prepared by RF-magnetron sputtering on quartz substrates and their three-dimensional (3D) micro morphology. In this work by AFM images, this paper studied stereo metric analysis of these films.</p><!--/ Abstract__block -->\u0000<h3>Design/methodology/approach</h3>\u0000<p>The C–Ni films have been prepared by RF-magnetron sputtering on quartz substrates using a mosaic target consisting of pure graphite and strips of pure nickel approximately 2 cm² attached to the graphite race track. The field emission scanning electronic microscopy (FESEM) images were used for the morphological characterization.</p><!--/ Abstract__block -->\u0000<h3>Findings</h3>\u0000<p>The histogram peaks are zero for all samples and the histograms are almost symmetric around zero. Temperature did not have much effect on the degree of isolation, so all four diagrams have similar results. The qualitative observations through statistical parameters of the 3D surface texture revealed that the smoothest surface has been obtained for C-Ni films annealed at 500 °C (Sa, Sq, Sz and Sv have the lower values), while the most irregular topography has been found for C-Ni films annealed at 300 °C (the fractal dimension D = 2.01 ± 0.131).</p><!--/ Abstract__block -->\u0000<h3>Originality/value</h3>\u0000<p>As shown in FESEM images, the size of the particles was increased for films deposited from 300 ºC to 800ºC; however, at 1000ºC, it decreased significantly. The histogram peaks are zero for all samples and the histograms were almost symmetric around zero. Also, the largest and lowest root mean heights (Sq) belong to films at 300 °C and 500 °C. Furthermore, the more irregular surface was found at 300 °C, and the more regular surface was found at 500 °C. As the temperature was increased to 800 °C, the values of the IAPSD function increased systematically, and then the values of the IAPSD function was decreased in the fourth sample. The surface skewness of samples annealed at 1000 °C was positive which confirms the lack of dominance of cavities on their surface with the highest amount of C-Ni films at 800 °C.</p><!--/ Abstract__block -->","PeriodicalId":49499,"journal":{"name":"Soldering & Surface Mount Technology","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-08-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142202275","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Effect of different beam distances in laser soldering process: a numerical and experimental study","authors":"Muhammad Zaim Hanif Nazarudin, Mohamad Aizat Abas, Wan Maryam Wan Ahmad Kamil, Faiz Farhan Ahmad Nadzri, Saifulmajdy A. Zahiri, Mohamad Fikri Mohd Sharif, Fakhrozi Che Ani, Mohd Hafiz Zawawi","doi":"10.1108/ssmt-11-2023-0065","DOIUrl":"https://doi.org/10.1108/ssmt-11-2023-0065","url":null,"abstract":"<h3>Purpose</h3>\u0000<p>This paper aims to investigate the effect of different beam distance by understanding laser beam influence on solder joint quality. The utilisation numerical-based simulations and experimental validation will help to minimise the formation of micro void in PTH that can lead to cracks and defects on passive devices.</p><!--/ Abstract__block -->\u0000<h3>Design/methodology/approach</h3>\u0000<p>The research uses a combination approach of numerical-based simulation using Finite Volume Method (FVM) and experimental validation to explore the impact of different laser beam distances on solder joint quality in PTH assemblies. The study visualises solder flow and identifies the optimal beam distance for placing a soldering workpiece and a suitable tolerance distance for inserting the solder wire.</p><!--/ Abstract__block -->\u0000<h3>Findings</h3>\u0000<p>The simulation results show the formation of micro void that occurs in PTH region with low volume fraction and unbalance heat concentration profile observed. The experimental results indicate that the focus point of the laser beam at a 99.0 mm distance yields the smallest beam size. Simulation visualisation demonstrates that the laser beam’s converging area at +4.6 mm from the focus point which provides optimal tolerance distances for placing the solder wire. The high-power laser diode exhibits maximum tolerance distance at 103.6 mm from the focus point where suitable beam distance for positioning of the soldering workpiece with 50% laser power. The simulation results align with the IPC-A-610 standard, ensuring optimal filling height, fillet shape with a 90° contact angle and defect-free.</p><!--/ Abstract__block -->\u0000<h3>Practical implications</h3>\u0000<p>This research provides implications for the industry by demonstrating the capability of the simulation approach to produce high-quality solder joints. The parameters, such as beam distance and power levels, offer practical guidelines for improving laser soldering processes in the manufacturing industry.</p><!--/ Abstract__block -->\u0000<h3>Originality/value</h3>\u0000<p>This study contributes to the field by combining high-power laser diode technology with numerical-based simulations to optimise the beam distance parameters for minimising micro void formation in the PTH region.</p><!--/ Abstract__block -->","PeriodicalId":49499,"journal":{"name":"Soldering & Surface Mount Technology","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142202276","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Interfacial IMC growth behavior of Sn-3Ag-3Sb-xIn solder on Cu substrate","authors":"Jiacheng Zhou, Jinglin Shi, Lei Xu, Fuwen Zhang, Zhigang Wang, Qiang Hu, Huijun He","doi":"10.1108/ssmt-03-2024-0013","DOIUrl":"https://doi.org/10.1108/ssmt-03-2024-0013","url":null,"abstract":"<h3>Purpose</h3>\u0000<p>The reliability of solder joints is closely related to the growth of an intermetallic compound (IMC) layer between the lead-free solder and substrate interface. This paper aims to investigate the growth behavior of the interfacial IMC layer during isothermal aging at 125°C for Sn-3Ag-3Sb-xIn/Cu (<em>x</em> = 0, 1, 2, 3, 4, 5 Wt.%) solder joints with different In contents and commercial Sn-3Ag-0.5Cu/Cu solder joints.</p><!--/ Abstract__block -->\u0000<h3>Design/methodology/approach</h3>\u0000<p>In this paper, Sn-3Ag-3Sb-xIn/Cu (<em>x</em> = 0, 1, 2, 3, 4, 5 Wt.%) and commercial Sn-3Ag-0.5Cu/Cu solder were prepared for bonding Cu substrate. Then these samples were subjected to isothermal aging for 0, 2, 8, 14, 25 and 45 days. Scanning electron microscopy and transmission electron microscopy were used to analyze the soldering interface reaction and the difference in IMC growth behavior during the isothermal aging process.</p><!--/ Abstract__block -->\u0000<h3>Findings</h3>\u0000<p>When the concentration of In in the Sn-3Ag-3Sb-xIn/Cu solder joints exceeded 2 Wt.%, a substantial amount of InSb particles were produced. These particles acted as a diffusion barrier, impeding the growth of the IMC layer at the interface. The growth of the Cu₃Sn layer during the aging process was strongly correlated with the presence of In. The growth rate of the Cu₃Sn layer was significantly reduced when the In concentration exceeded 3 Wt.%.</p><!--/ Abstract__block -->\u0000<h3>Originality/value</h3>\u0000<p>The addition of In promotes the formation of InSb particles in Sn-3Ag-3Sb-xIn/Cu solder joints. These particles limit the growth of the total IMC layer, while a higher In content also slows the growth of the Cu₃Sn layer. This study is significant for designing alloy compositions for new high-reliability solders.</p><!--/ Abstract__block -->","PeriodicalId":49499,"journal":{"name":"Soldering & Surface Mount Technology","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-08-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142225963","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Effects of Ni addition on wettability and interfacial microstructure of Sn-0.7Cu-xNi solder alloy","authors":"Jinshuai Xie, Lei Tang, Pengfei Gao, Zhengquan Zhang, Liangfeng Li","doi":"10.1108/ssmt-08-2023-0053","DOIUrl":"https://doi.org/10.1108/ssmt-08-2023-0053","url":null,"abstract":"<h3>Purpose</h3>\u0000<p>This paper aims to study the effect of different Ni content on the microstructure and properties of Sn-0.7Cu alloy. Then, the spreading area, wetting angle, interface layer thickness and microstructure of the soldering interface was observed and analyzed at different soldering temperatures and times.</p><!--/ Abstract__block -->\u0000<h3>Design/methodology/approach</h3>\u0000<p>Sn-0.7Cu-xNi solder alloy was prepared by a high-frequency induction melting furnace. Then Sn-0.7Cu-xNi alloy was soldered on a Cu substrate at different soldering temperatures and times.</p><!--/ Abstract__block -->\u0000<h3>Findings</h3>\u0000<p>It was found that Ni made the intermetallic compounds in the Sn-0.7Cu solder alloy gradually aggregate and coarsen, and the microstructure was refined. The phase compositions of the solder alloy are mainly composed of the ß-Sn phase and a few intermetallic compounds, Cu₆Sn₅ + (Cu, Ni)₆Sn₅. The maximum value of 12.1 HV is reached when the Ni content is 0.1 Wt.%. When the Ni content is 0.5 Wt.%, the wettability of the solder alloy increases by about 15%, the interface thickness increases by about 8.9% and the scallop-like structure is the most refined. When the soldering time is 10 min and the soldering temperature is 280 °C, the wettability of Sn-0.7Cu-0.2Ni is the best.</p><!--/ Abstract__block -->\u0000<h3>Originality/value</h3>\u0000<p>It is groundbreaking to combine the change in soldering interface with the soldering industry. The effects of different soldering temperatures and times on the Sn-0.7Cu-xNi alloy were studied. Under the same conditions, Sn-0.7Cu-0.2Ni exhibits better wettability and more stable solder joint stability.</p><!--/ Abstract__block -->","PeriodicalId":49499,"journal":{"name":"Soldering & Surface Mount Technology","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-08-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141946323","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Investigation of the mechanical properties of lead-free Sn-58Bi solder alloy with cobalt addition through flux doping","authors":"Lina Syazwana Kamaruzzaman, Yingxin Goh, Yi Chung Goh","doi":"10.1108/ssmt-02-2024-0007","DOIUrl":"https://doi.org/10.1108/ssmt-02-2024-0007","url":null,"abstract":"<h3>Purpose</h3>\u0000<p>This study aims to investigate the effect of incorporating cobalt (Co) into Sn-58Bi alloy on its phase composition, tensile properties, hardness and thermal aging performances. The fracture morphologies of tensile-tested solders are also investigated to correlate the microstructural changes with tensile properties of the solder alloys. Then, the thermal aging performances of the solder alloys are investigated in terms of their intermetallic compound (IMC) layer morphology and thickness.</p><!--/ Abstract__block -->\u0000<h3>Design/methodology/approach</h3>\u0000<p>The Sn-58Bi and Sn-58Bi-xCo, where x = 1.0, 1.5 and 2.0 Wt.%, were prepared using the flux doping technique. X-ray diffraction (XRD) is used to study the phase composition of the solder alloys, whereas scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDX) are used to investigate the microstructure, fractography and compositions of the solders. Tensile properties such as ultimate tensile strength (UTS), Young’s modulus and elongation are tested using the tensile test, whereas the microhardness value is gained from the micro-Vickers hardness test. The morphology and thickness of the IMC layer at the solder’s joints are investigated by varying the thermally aging duration up to 56 days at 80°C.</p><!--/ Abstract__block -->\u0000<h3>Findings</h3>\u0000<p>XRD analysis shows the presence of Co₃Sn₂ phase and confirms that Co was successfully incorporated via the flux doping technique. The microstructure of all Sn-58Bi-xCo solders did not differ significantly from Sn-58Bi solders. Sn-58Bi-2.0Co solder exhibited optimum properties among all compositions, with the highest UTS (87.89 ± 2.55 MPa) at 0.01 s⁻¹ strain rate and the lowest IMC layer thickness at the interface after being thermally aged for 56 days (3.84 ± 0.67 µm).</p><!--/ Abstract__block -->\u0000<h3>Originality/value</h3>\u0000<p>The originality and value of this research lie in its novel exploration of the flux doping technique to introduce minor alloying of Co into Sn-58Bi solder alloys, providing new insights into enhancing the properties and performance of these solders. This new Sn-Bi-Co alloy has the potential to replace lead-containing solder alloy in low-temperature soldering.</p><!--/ Abstract__block -->","PeriodicalId":49499,"journal":{"name":"Soldering & Surface Mount Technology","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-07-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141866921","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Effects of soldering temperatures and composition on the microstructures and shear properties of Sn58Bi-xSAC0307/ENIG solder joints","authors":"Mengxia Jiang, Yang Liu, Yuxiong Xue, Guangbao Shan, Jun Lv, Mairui Huang","doi":"10.1108/ssmt-03-2024-0014","DOIUrl":"https://doi.org/10.1108/ssmt-03-2024-0014","url":null,"abstract":"<h3>Purpose</h3>\u0000<p>This paper aims to systematically study the effects of reflow temperature and SAC0307 (SAC) content on the micromorphology and mechanical properties of Sn58Bi-xSAC0307 composite solder joints to meet the requirements of high integration and low-temperature packaging of devices and provide references for the application of composite solder joints.</p><!--/ Abstract__block -->\u0000<h3>Design/methodology/approach</h3>\u0000<p>Sn58Bi and SAC0307 solder paste was mechanically mixed in different proportions to prepare Sn58Bi-xSAC0307/ENIG solder joints. The thermal properties, microstructure and mechanical properties of the composite solder joints were studied.</p><!--/ Abstract__block -->\u0000<h3>Findings</h3>\u0000<p>As SAC content in the solder increases, the balling temperature of SnBi-SAC solder gradually increases. The addition of SAC alloy reduces the grain size of large Bi-rich phase, and there are small-sized dispersed Bi and Ag3Sn particles in the bulk solder. The intermetallic compounds composition of the SnBi-xSAC/ENIG solder joint changes from Ni3Sn4 to (Ni, Cu)3Sn4 and (Cu, Ni)6Sn5 with SAC increasing. As the soldering temperature increases, the strength of all solder joints shows a rising trend. Among them, the shear strength of SnBi-20SAC solder joints at a reflow temperature of 150°C is approximately 37 MPa. As the reflow temperature increases to 250°C, the shear strength of solder joints increases to approximately 67 MPa.</p><!--/ Abstract__block -->\u0000<h3>Originality/value</h3>\u0000<p>This study provides a reference for the optimization of low-temperature solder composition and soldering process under different package designs.</p><!--/ Abstract__block -->","PeriodicalId":49499,"journal":{"name":"Soldering & Surface Mount Technology","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141776024","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Sn99Ag0.3Cu0.7–TiO2 composite solder joints and their influence on thermal parameters of power components","authors":"Adrian Pietruszka, Paweł Górecki, Agata Skwarek","doi":"10.1108/ssmt-03-2024-0016","DOIUrl":"https://doi.org/10.1108/ssmt-03-2024-0016","url":null,"abstract":"<h3>Purpose</h3>\u0000<p>This paper aims to investigate the influence of composite solder joint preparation on the thermal properties of metal-oxide-semiconductor field-effect transistors (MOSFETs) and the mechanical strength of the soldered joint.</p><!--/ Abstract__block -->\u0000<h3>Design/methodology/approach</h3>\u0000<p>Reinforced composite solder joints with the addition of titanium oxide nanopowder (TiO₂) were prepared. The reference alloy was Sn99Ag0.3Cu0.7. Reinforced joints differed in the weight percentage of TiO₂, ranging from 0.125 to 1.0 Wt.%. Two types of components were used for the tests. The resistor in the 0805 package was used for mechanical strength tests, where the component was soldered to the FR4 substrate. For thermal parameters measurements, a power element MOSFET in a TO-263 package was used, which was soldered to a metal core printed circuit board (PCB) substrate. Components were soldered in batch IR oven.</p><!--/ Abstract__block -->\u0000<h3>Findings</h3>\u0000<p>Shear tests showed that the addition of titanium oxide does not significantly increase the resistance of the solder joint to mechanical damage. Titanium oxide addition was shown to not considerably influence the soldered joint’s mechanical strength compared to reference samples when soldered in batch ovens. Thermal resistance <em>R_thj-a</em> of MOSFETs depends on TiO₂ concentration in the composite solder joint reaching the minimum <em>R_thj</em> at 0.25 Wt.% of TiO₂.</p><!--/ Abstract__block -->\u0000<h3>Research limitations/implications</h3>\u0000<p>Mechanical strength: TiO₂ reinforcement shows minimal impact on mechanical strength, suggesting altered liquidus temperature and microstructure, requiring further investigation. Thermal performance: thermal parameters vary with TiO₂ concentration, with optimal performance at 0.25 Wt.%. Experimental validation is crucial for practical application. Experimental confirmation: validation of optimal concentrations is essential for accurate assessment and real-world application. Soldering method influence: batch oven soldering may affect mechanical strength, necessitating exploration of alternative methods. Thermal vs mechanical enhancement: while TiO₂ does not notably enhance mechanical strength, it improves thermal properties, highlighting the need for balanced design in power semiconductor assembly.</p><!--/ Abstract__block -->\u0000<h3>Practical implications</h3>\u0000<p>Incorporating TiO₂ enhances thermal properties in power semiconductor assembly. Optimal concentration balancing thermal performance and mechanical strength must be determined experimentally. Batch oven soldering may influence mechanical strength, requiring evaluation of alternative techniques. TiO₂ composite solder joints offer promise in power electronics for efficient heat dissipation. Microstructural analysis can optimize solder joint design and performance. Rigorous q","PeriodicalId":49499,"journal":{"name":"Soldering & Surface Mount Technology","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-07-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141569290","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Effects of soldering temperature and preheating temperature on the properties of Sn–Zn solder alloys using wave soldering","authors":"Songtao Qu, Qingyu Shi, Gong Zhang, Xinhua Dong, Xiaohua Xu","doi":"10.1108/ssmt-11-2023-0064","DOIUrl":"https://doi.org/10.1108/ssmt-11-2023-0064","url":null,"abstract":"<h3>Purpose</h3>\u0000<p>This study aims to address the problem of low-temperature wave soldering in industry production with Sn-9Zn-2.5 Bi-1.5In alloys and develop qualified process parameters. Sn–Zn eutectic alloys are lead-free solders applied in consumer electronics due to their low melting point, high strength, and low cost. In the electronic assembly industry, Sn–Zn eutectic alloys have great potential for use.</p><!--/ Abstract__block -->\u0000<h3>Design/methodology/approach</h3>\u0000<p>This paper explored developing and implementing process parameters for low-temperature wave soldering of Sn–Zn alloys (SN-9ZN-2.5BI-1.5 In). A two-factor, three-level design of the experiments experiment was designed to simulate various conditions parameters encountered in Sn–Zn soldering, developed the nitrogen protection device of waving soldering and proposed the optimal process parameters to realize mass production of low-temperature wave soldering on Sn–Zn alloys.</p><!--/ Abstract__block -->\u0000<h3>Findings</h3>\u0000<p>The Sn-9Zn-2.5 Bi-1.5In alloy can overcome the Zn oxidation problem, achieve low-temperature wave soldering and meet IPC standards, but requires the development of nitrogen protection devices and the optimization of a series of process parameters. The design experiment reveals that preheating temperature, soldering temperature and flux affect failure phenomena. Finally, combined with the process test results, an effective method to support mass production.</p><!--/ Abstract__block -->\u0000<h3>Research limitations/implications</h3>\u0000<p>In term of overcome Zn’s oxidation characteristics, anti-oxidation wave welding device needs to be studied. Various process parameters need to be developed to achieve a welding process with lower temperature than that of lead solder(Sn–Pb) and lead-free SAC(Sn-0.3Ag-0.7Cu). The process window of Sn–Zn series alloy (Sn-9Zn-2.5 Bi-1.5In alloy) is narrow. A more stringent quality control chart is required to make mass production.</p><!--/ Abstract__block -->\u0000<h3>Practical implications</h3>\u0000<p>In this research, the soldering temperature of Sn-9Zn-2.5 Bi-1.5In is 5 °C and 25 °C lower than Sn–Pb and Sn-0.3Ag-0.7Cu(SAC0307). To the best of the authors’ knowledge, this work was the first time to apply Sn–Zn solder alloy under actual production conditions on wave soldering, which was of great significance for the study of wave soldering of the same kind of solder alloy.</p><!--/ Abstract__block -->\u0000<h3>Social implications</h3>\u0000<p>Low-temperature wave soldering can supported green manufacturing widely, offering a new path to achieve carbon emissions for many factories and also combat to international climate change.</p><!--/ Abstract__block -->\u0000<h3>Originality/value</h3>\u0000<p>There are many research papers on Sn–Zn alloys, but methods of achieving low-temperature wave soldering to meet IPC standards are infrequent. Especially the process control method that can be mass-produced is more challenging. In addition, the metal storage is very high a","PeriodicalId":49499,"journal":{"name":"Soldering & Surface Mount Technology","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141511456","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Robust vision detection of pipeline solder joints","authors":"Huijun An, Lingbao Kong","doi":"10.1108/ssmt-04-2023-0018","DOIUrl":"https://doi.org/10.1108/ssmt-04-2023-0018","url":null,"abstract":"<h3>Purpose</h3>\u0000<p>Solder joint inspection plays a critical role in various industries, with a focus on integrated chip (IC) solder joints and metal surface welds. However, the detection of tubular solder joints has received relatively less attention. This paper aims to address the challenges of detecting small targets and complex environments by proposing a robust visual detection method for pipeline solder joints. The method is characterized by its simplicity, cost-effectiveness and ease of implementation.</p><!--/ Abstract__block -->\u0000<h3>Design/methodology/approach</h3>\u0000<p>A robust visual detection method based on the characteristics of pipeline solder joints is proposed. With the improved hue, saturation and value (HSV) color space, the method uses a multi-level template matching approach to first segment the pipeline from the background, and then match the endpoint of the pipeline to accurately locate the solder joint. The proposed method leverages the distinctive characteristics of pipeline solder joints and employs an enhanced HSV color space. A multi-level template matching approach is utilized to segment the pipeline from the background and accurately locate the solder joint by matching the pipeline endpoint.</p><!--/ Abstract__block -->\u0000<h3>Findings</h3>\u0000<p>The experimental results demonstrate the effectiveness of the proposed solder joint detection method in practical detection tasks. The average precision of pipeline weld joint localization exceeds 95%, while the average recall is greater than 90%. These findings highlight the applicability of the method to pipeline solder joint detection tasks, specifically in the context of production lines for refrigeration equipment.</p><!--/ Abstract__block -->\u0000<h3>Research limitations/implications</h3>\u0000<p>The precision of the method is influenced by the placement angle and lighting conditions of the test specimen, which may pose challenges and impact the algorithm's performance. Potential avenues for improvement include exploring deep learning methods, incorporating additional features and contextual information for localization, and utilizing advanced image enhancement techniques to improve image quality.</p><!--/ Abstract__block -->\u0000<h3>Originality/value</h3>\u0000<p>The proposed pipeline solder joint detection method offers a novel and practical approach. The simplicity, cost-effectiveness and ease of implementation make it an attractive choice for detecting pipeline solder joints in different industrial applications.</p><!--/ Abstract__block -->","PeriodicalId":49499,"journal":{"name":"Soldering & Surface Mount Technology","volume":null,"pages":null},"PeriodicalIF":2.0,"publicationDate":"2024-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141511455","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}