1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)最新文献
{"title":"A new proton irradiation facility at the Northeast Proton Therapy Center","authors":"J. Sisterson, J. Flanz, J. E. Burns","doi":"10.1109/REDW.1999.816067","DOIUrl":"https://doi.org/10.1109/REDW.1999.816067","url":null,"abstract":"The radiation environment resulting from cosmic rays both in space and on Earth must be well understood to protect both people and equipment. There is a need for irradiation facilities with well characterized proton beams where equipment design can be tested and the underlying physics studied. The Harvard Cyclotron Laboratory (HCL) has delivered proton beams up to 160 MeV to 'outside users' for over 30 years. The Northeast Proton Therapy Center (NPTC) will continue the work of HCL providing facilities for outside users. NPTC will provide continuous proton beams up to 230 MeV with currents as high as 300 nA (3). The advantages of NPTC include, higher proton beam energy, continuous beam capability and fast energy adjustment.","PeriodicalId":447869,"journal":{"name":"1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-07-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128362098","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"SDRAM space radiation effects measurements and analysis","authors":"B.G. Henson, P. McDonald, W. Stapor","doi":"10.1109/REDW.1999.816049","DOIUrl":"https://doi.org/10.1109/REDW.1999.816049","url":null,"abstract":"In recent years, memory technology has been advancing quickly. This paper presents the comprehensive radiation effects examination of two high density (64 Mb and 128 Mb) 0.35 /spl mu/m CMOS Synchronous Dynamic Random Access Memories (SDRAMs). This study uses the major components of the natural near earth environment to determine the applicability of these parts to space missions. Protons have been used to measure the single event effect (SEE) and total dose sensitivity of these devices. Heavy ions were used to measure the SEE, including single event latch-up (SEL), sensitivity of these devices. Comparisons are made between results from semi-empirical modeling and results from data.","PeriodicalId":447869,"journal":{"name":"1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-07-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123815103","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Radiation evaluation of plastic encapsulated transistors and microcircuits for use in space applications","authors":"J. Gorelick, S. McClure, C. Swink","doi":"10.1109/REDW.1999.816063","DOIUrl":"https://doi.org/10.1109/REDW.1999.816063","url":null,"abstract":"Radiation test results demonstrate the viability of selected PEMs devices for space use. The majority of the devices selected for evaluation are commercial equivalents of devices currently used on a number of satellites. Materials evaluations and charging experiments were also performed.","PeriodicalId":447869,"journal":{"name":"1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-07-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130798062","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
D.M. MacQueen, D. Gingrich, N.J. Buchanan, P. W. Green
{"title":"Total ionizing dose effects in a SRAM-based FPGA","authors":"D.M. MacQueen, D. Gingrich, N.J. Buchanan, P. W. Green","doi":"10.1109/REDW.1999.816052","DOIUrl":"https://doi.org/10.1109/REDW.1999.816052","url":null,"abstract":"We have measured the effects of total ionizing dose on Xilinx XC4036X FPGAs. The FPGAs were irradiated at a dose rate of about, 0.5 krad/hr. An average total dose of 39 krad(Si) and 16 krad(Si) were absorbed by the XL-series and XLA-series FPGAs, respectively, before the power supply current increased.","PeriodicalId":447869,"journal":{"name":"1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-07-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125919390","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Saidoh, M. Fukuda, K. Arakawa, S. Tajima, H. Sunaga, K. Yotsumoto, T. Kamiya, R. Tanaka, T. Hirao, I. Nashiyama, T. Ohshima, H. Itoh, S. Okada, N. Nemoto, S. Kuboyama, S. Matsuda
{"title":"The irradiation facilities for the radiation tolerance testing of semiconductor devices for space use in Japan","authors":"M. Saidoh, M. Fukuda, K. Arakawa, S. Tajima, H. Sunaga, K. Yotsumoto, T. Kamiya, R. Tanaka, T. Hirao, I. Nashiyama, T. Ohshima, H. Itoh, S. Okada, N. Nemoto, S. Kuboyama, S. Matsuda","doi":"10.1109/REDW.1999.816066","DOIUrl":"https://doi.org/10.1109/REDW.1999.816066","url":null,"abstract":"Irradiation facilities for the radiation tolerance testing of semiconductor devices for space use in Japan are described, which cover different radiation qualities, such as gamma-rays, electron beams and ion beams. Among them a stress is put on the facilities for the single-event phenomena (SEP) testing using ion beams with wide LET ranges as well as for the microscopic analysis of SEP using a microbeam of 1 /spl mu/m diameter.","PeriodicalId":447869,"journal":{"name":"1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-07-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124663288","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Device SEE susceptibility update: 1996-1998","authors":"J. Coss, T. Miyahira, L. Selva, G. Swift","doi":"10.1109/REDW.1999.816058","DOIUrl":"https://doi.org/10.1109/REDW.1999.816058","url":null,"abstract":"This eighth Compendium continues the previous work of Nichols, et al., on single event effects (SEE) first published in 1985. Because the Compendium has grown so voluminous, this update only presents data not published in previous compendia.","PeriodicalId":447869,"journal":{"name":"1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-07-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127896291","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Electron induced scintillation testing of commercially available optical fibers for space flight","authors":"M. Ott","doi":"10.1109/REDW.1999.816065","DOIUrl":"https://doi.org/10.1109/REDW.1999.816065","url":null,"abstract":"A test to verify the performance of several commercial and military optical fibers available on the market today was conducted, via usage of an electron accelerator, to monitor radiation induced scintillation or luminescence. The test results showed that no significant effects could be detected with the PMT (Photomultiplier Tube) system used, above a noise floor of 50 photons/sec that were due to optical fiber scintillation. Although some data appeared to show events taking place, noise scan results have correlated these events to arcing inside the electron accelerator facility. This test was to simply characterize for space flight, which optical fiber candidates were the largest scintillators among the eighteen optical fiber candidates tested.","PeriodicalId":447869,"journal":{"name":"1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114701129","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
P. Layton, H. Anthony, R. Boss, N. Hall, P. Hsu, C. Land, F. Meraz, C. LePage-Woodie, J. LuY., D. Strobel
{"title":"Radiation testing results of COTS based space microcircuits","authors":"P. Layton, H. Anthony, R. Boss, N. Hall, P. Hsu, C. Land, F. Meraz, C. LePage-Woodie, J. LuY., D. Strobel","doi":"10.1109/REDW.1999.816057","DOIUrl":"https://doi.org/10.1109/REDW.1999.816057","url":null,"abstract":"Single Event Effects and Total Ionizing dose data collected by SEi for Commercial off the Shelf (COTS) microcircuits are presented. The data was collected for evaluation of these devices for commercial space programs.","PeriodicalId":447869,"journal":{"name":"1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125017979","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}