Radiation evaluation of plastic encapsulated transistors and microcircuits for use in space applications

1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463) Pub Date : 1999-07-12 DOI:10.1109/REDW.1999.816063

J. Gorelick, S. McClure, C. Swink

引用次数: 6

Abstract

Radiation test results demonstrate the viability of selected PEMs devices for space use. The majority of the devices selected for evaluation are commercial equivalents of devices currently used on a number of satellites. Materials evaluations and charging experiments were also performed.

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空间应用用塑料封装晶体管和微电路的辐射评价

辐射测试结果证明了所选PEMs设备在空间使用的可行性。选择进行评价的大多数设备是目前在若干卫星上使用的设备的商业等价物。并进行了材料评价和充电实验。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)

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