{"title":"空间应用用塑料封装晶体管和微电路的辐射评价","authors":"J. Gorelick, S. McClure, C. Swink","doi":"10.1109/REDW.1999.816063","DOIUrl":null,"url":null,"abstract":"Radiation test results demonstrate the viability of selected PEMs devices for space use. The majority of the devices selected for evaluation are commercial equivalents of devices currently used on a number of satellites. Materials evaluations and charging experiments were also performed.","PeriodicalId":447869,"journal":{"name":"1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-07-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Radiation evaluation of plastic encapsulated transistors and microcircuits for use in space applications\",\"authors\":\"J. Gorelick, S. McClure, C. Swink\",\"doi\":\"10.1109/REDW.1999.816063\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Radiation test results demonstrate the viability of selected PEMs devices for space use. The majority of the devices selected for evaluation are commercial equivalents of devices currently used on a number of satellites. Materials evaluations and charging experiments were also performed.\",\"PeriodicalId\":447869,\"journal\":{\"name\":\"1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-07-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/REDW.1999.816063\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW.1999.816063","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Radiation evaluation of plastic encapsulated transistors and microcircuits for use in space applications
Radiation test results demonstrate the viability of selected PEMs devices for space use. The majority of the devices selected for evaluation are commercial equivalents of devices currently used on a number of satellites. Materials evaluations and charging experiments were also performed.