Device SEE susceptibility update: 1996-1998

1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463) Pub Date : 1999-07-12 DOI:10.1109/REDW.1999.816058

J. Coss, T. Miyahira, L. Selva, G. Swift

引用次数: 11

Abstract

This eighth Compendium continues the previous work of Nichols, et al., on single event effects (SEE) first published in 1985. Because the Compendium has grown so voluminous, this update only presents data not published in previous compendia.

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设备SEE敏感性更新:1996-1998

这第八本纲要延续了Nichols等人1985年首次发表的关于单事件效应(SEE)的工作。由于《汇编》已经变得如此庞大，这次更新只提供以前的汇编中未发表的数据。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)

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