Radiation testing results of COTS based space microcircuits

1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463) Pub Date : 1900-01-01 DOI:10.1109/REDW.1999.816057

P. Layton, H. Anthony, R. Boss, N. Hall, P. Hsu, C. Land, F. Meraz, C. LePage-Woodie, J. LuY., D. Strobel

引用次数: 0

Abstract

Single Event Effects and Total Ionizing dose data collected by SEi for Commercial off the Shelf (COTS) microcircuits are presented. The data was collected for evaluation of these devices for commercial space programs.

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基于COTS的空间微电路辐射测试结果

介绍了SEi收集的商用现货微电路的单事件效应和总电离剂量数据。收集这些数据是为了评估这些用于商业空间计划的设备。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)

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