{"title":"At-speed boundary-scan interconnect testing in a board with multiple system clocks","authors":"Jongchul Shin, H. Kim, Sungho Kang","doi":"10.1145/307418.307546","DOIUrl":"https://doi.org/10.1145/307418.307546","url":null,"abstract":"As an at-speed solution to board-level interconnect testing, an enhanced boundary-scan architecture utilizing a combination of slightly modified boundary-scan cells and a user-defined register is proposed. Test methods based on the new architecture can accomplish cost-effective at-speed testing and propagation delay measurements on board-level interconnects. Particularly when the board under test has multiple domains of interconnects controlled by different clock speeds, our at-speed solution is much more efficient than other previous works.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123307041","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Radetzki, Ansgar Stammermann, W. Putzke-Röming, W. Nebel
{"title":"Data type analysis for hardware synthesis from object-oriented models","authors":"M. Radetzki, Ansgar Stammermann, W. Putzke-Röming, W. Nebel","doi":"10.1145/307418.307550","DOIUrl":"https://doi.org/10.1145/307418.307550","url":null,"abstract":"Object-oriented modeling of hardware promises to help deal with design complexity through higher abstraction and better support for reuse. Whereas simulation of such models is rather easy to achieve, synthesis turns out to require the application of quite sophisticated techniques. In this paper, we devise a solution of the foremost problem, optimized synthesis of object-oriented data types. The outlined algorithms have been implemented for an object-oriented dialect of VHDL and may also contribute, possibly in a co-design context, to synthesis from languages such as C++ or Java. We explain our synthesis methods and show their impact with the example of a microprocessor model.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128706299","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
B. Tabbara, M. Sgroi, A. Sangiovanni-Vincentelli, E. Filippi, L. Lavagno
{"title":"Fast hardware-software co-simulation using VHDL models","authors":"B. Tabbara, M. Sgroi, A. Sangiovanni-Vincentelli, E. Filippi, L. Lavagno","doi":"10.1145/307418.307511","DOIUrl":"https://doi.org/10.1145/307418.307511","url":null,"abstract":"We describe a technique for hardware-software co-simulation that is almost cycle-accurate, and does nor require the use of interprocess communication for a C language interface for the software components. Software is modeled by using behavioral VHDL constructs, annotated with timing information derived from basic block-level timing estimates. Hardware is also modeled in VHDL, and can be either pre-existing intellectual property or synthesized to RTL from a functional specification. Execution of the VHDL processes modeling software tasks is coordinated by a process emulating the target RTOS behavior. The effects of changing the hardware/software partition can be quickly estimated by changing a process parameter defining its target implementation and the processor on which it is running.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128728850","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Lun Ye, Foong-Charn Chang, P. Feldmann, R. Chadha, Nagaraj Ns, F. Cano
{"title":"Chip-level verification for parasitic coupling effects in deep-submicron digital designs","authors":"Lun Ye, Foong-Charn Chang, P. Feldmann, R. Chadha, Nagaraj Ns, F. Cano","doi":"10.1145/307418.307583","DOIUrl":"https://doi.org/10.1145/307418.307583","url":null,"abstract":"Interconnect parasitics are playing a dominant role in determining chip performance and functionality in deep-submicron designs. This problem is compounded by increasing chip frequencies and design complexity. As parasitic coupling capacitances are a significant portion of total capacitance in deep-submicron designs, verification of both performance and functionality assumes greater importance. This paper describes techniques for the modeling and analysis of parasitic coupling effects for large VLSI designs. Analysis results from a controlled experimental setup are presented to show the need for accurate cell models. Results from application of these techniques on a lending edge Digital Signal Processor (DSP) design are presented. Accuracy comparison with detailed SPICE-level analysis is included.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121565578","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Efficient techniques for modeling chip-level interconnect, substrate and package parasitics","authors":"P. Feldmann, S. Kapur, D. Long","doi":"10.1145/307418.307536","DOIUrl":"https://doi.org/10.1145/307418.307536","url":null,"abstract":"Modern IC design requires accurate analysis and modeling of chip-level interconnect, the substrate and package parasitics. Traditional approaches for such analyses are computationally expensive. In this paper we discuss some recent novel schemes for extraction and reduced order modeling that help overcome this computational bottleneck.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"2224 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130172077","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Eui-Young Chung, L. Benini, A. Bogliolo, Yung-Hsiang Lu, G. Micheli
{"title":"Dynamic power management for nonstationary service requests","authors":"Eui-Young Chung, L. Benini, A. Bogliolo, Yung-Hsiang Lu, G. Micheli","doi":"10.1145/307418.307456","DOIUrl":"https://doi.org/10.1145/307418.307456","url":null,"abstract":"Dynamic power management is a design methodology aiming at reducing power consumption of electronic systems, by performing selective shutdown of the idle system resources. The effectiveness of a power management scheme depends critically on an accurate modeling of the environment, and on the computation of the control policy. This paper presents two methods for characterizing nonstationary service requests by means of a prediction scheme based on sliding windows. Moreover; it describes how control policies for nonstationary models can be derived.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125515080","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Parametric fault diagnosis for analog systems using functional mapping","authors":"S. Cherubal, A. Chatterjee","doi":"10.1145/307418.307489","DOIUrl":"https://doi.org/10.1145/307418.307489","url":null,"abstract":"We propose a new Simulation-After-Test (SAT) methodology for accurate diagnosis of circuit parameters in large analog circuits. Our methodology is based on constructing a non-linear regression model using prior circuit simulation, which relates a set of measurements to the circuit's internal parameters. First, we give algorithms to select measurements that give all the diagnostic information about the Circuit-Under-Test (CUT). From these selected measurements, we solve for the internal parameters of the circuit using iterative numerical techniques. The methodology has been applied to several mixed-signal test benchmark circuits and has applications in process debugging for mixed-signal integrated circuits (ICs) as well troubleshooting and repair of board level systems.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127633187","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Polynomial methods for allocating complex components","authors":"James Smith, G. Micheli","doi":"10.1145/307418.307492","DOIUrl":"https://doi.org/10.1145/307418.307492","url":null,"abstract":"Methods for performing component matching by expressing an arithmetic specification and a bit-level description of an implementation as word-level polynomials have been demonstrated for combinational circuits. This representation allows the functionality of a specification and existing implementation to be compared. We present extensions to this basic method that allow polynomial models to be constructed for circuits that employ sequential elements as well as feedback. Furthermore, we derive a means of approximating the functionality of nonpolynomial functions and determining a bound on the error of this approximation. These methods are used to synthesize an infinite impulse response filter from a library of potential implementations.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130127132","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"CRUSADE: hardware/software co-synthesis of dynamically reconfigurable heterogeneous real-time distributed embedded systems","authors":"Bharat P. Dave","doi":"10.1145/307418.307461","DOIUrl":"https://doi.org/10.1145/307418.307461","url":null,"abstract":"Dynamically reconfigurable embedded systems offer potential for higher performance as well as adaptability to changing system requirements at low cost. Such systems employ run-time reconfigurable hardware components such as field programmable gate arrays (FPGAs) and complex programmable logic devices (CPLDs). In this paper, we address the problem of hardware/ software co-synthesis of dynamically reconfigurable embedded systems. Our co-synthesis system, CRUSADE, takes as an input embedded system specifications in terms periodic acyclic task graphs with rate constraints and generates dynamically reconfigurable heterogeneous distributed hardware and software architecture meeting real-time constraints while minimizing the system hardware cost. We identify the group of tasks for dynamic reconfiguration of programmable devices and synthesize an efficient programming interface for reconfiguring reprogrammable devices. Real-time systems require that the execution time for tasks mapped to reprogrammable devices are managed effectively such that real-time deadlines are not exceeded. To address this, we propose a technique to effectively manage delay in reconfigurable devices. Our approach guarantees that the real-time task deadlines are always met. To the best of our knowledge, this is the first co-synthesis algorithm which targets dynamically reconfigurable embedded systems. We also show how our co-synthesis algorithm can be easily extended to consider fault-detection and fault-tolerance. Application of CRUSADE and its fault tolerance extension, CRUSADE-FT to several real-life large examples (up to 7400 tasks) from mobile communication network base station, video distribution router, a multi-media system, and synchronous optical network (SONET) and asynchronous transfer mode (ATM) based telecom systems shows that up to 56% system cost savings can be realized.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126671076","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Functional verification methodology for microprocessors using the Genesys test-program generator. Application to the x86 microprocessors family","authors":"L. Fournier, Yaron Arbetman, M. Levinger","doi":"10.1145/307418.307540","DOIUrl":"https://doi.org/10.1145/307418.307540","url":null,"abstract":"Even though the importance of microprocessor design verification is widely acknowledged, no rigorous methodology is being commonly followed for its realization. This paper attempts to delineate such a methodology, and shows how it is promoted by Genesys, an automatic pseudo-random test-program generator. The methodology relies on a verification plan which induces smart sets of tests that carry out the verification tasks. The paper reports on an application of this methodology, using Genesys, to verify an x86 design and describes, in particular, how this methodology could have helped to avoid known escape bugs, such as the recent two infamous Pentium Floating Point bugs.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134490518","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}