{"title":"芯片级互连、基板和封装寄生的有效建模技术","authors":"P. Feldmann, S. Kapur, D. Long","doi":"10.1145/307418.307536","DOIUrl":null,"url":null,"abstract":"Modern IC design requires accurate analysis and modeling of chip-level interconnect, the substrate and package parasitics. Traditional approaches for such analyses are computationally expensive. In this paper we discuss some recent novel schemes for extraction and reduced order modeling that help overcome this computational bottleneck.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"2224 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Efficient techniques for modeling chip-level interconnect, substrate and package parasitics\",\"authors\":\"P. Feldmann, S. Kapur, D. Long\",\"doi\":\"10.1145/307418.307536\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Modern IC design requires accurate analysis and modeling of chip-level interconnect, the substrate and package parasitics. Traditional approaches for such analyses are computationally expensive. In this paper we discuss some recent novel schemes for extraction and reduced order modeling that help overcome this computational bottleneck.\",\"PeriodicalId\":442382,\"journal\":{\"name\":\"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)\",\"volume\":\"2224 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/307418.307536\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/307418.307536","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Efficient techniques for modeling chip-level interconnect, substrate and package parasitics
Modern IC design requires accurate analysis and modeling of chip-level interconnect, the substrate and package parasitics. Traditional approaches for such analyses are computationally expensive. In this paper we discuss some recent novel schemes for extraction and reduced order modeling that help overcome this computational bottleneck.