{"title":"Efficient techniques for modeling chip-level interconnect, substrate and package parasitics","authors":"P. Feldmann, S. Kapur, D. Long","doi":"10.1145/307418.307536","DOIUrl":null,"url":null,"abstract":"Modern IC design requires accurate analysis and modeling of chip-level interconnect, the substrate and package parasitics. Traditional approaches for such analyses are computationally expensive. In this paper we discuss some recent novel schemes for extraction and reduced order modeling that help overcome this computational bottleneck.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"2224 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/307418.307536","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9
Abstract
Modern IC design requires accurate analysis and modeling of chip-level interconnect, the substrate and package parasitics. Traditional approaches for such analyses are computationally expensive. In this paper we discuss some recent novel schemes for extraction and reduced order modeling that help overcome this computational bottleneck.