{"title":"Specification and validation of distributed IP-based designs with JavaCAD","authors":"M. Dalpasso, A. Bogliolo, L. Benini","doi":"10.1145/307418.307588","DOIUrl":"https://doi.org/10.1145/307418.307588","url":null,"abstract":"This paper presents JavaCAD, a new Java-based CAD framework for the design, validation and simulation of systems using third-party components with reciprocal intellectual property (IP) protection. The designer can use remote components with a dedicated and secure Internet protocol, that guarantees IP protection and supports a smooth transition between component evaluation and purchase.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134053183","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The heterogeneous structure problem in hardware/software codesign: a macroscopic approach","authors":"J. A. Maestro, D. Mozos, R. Hermida","doi":"10.1145/307418.307464","DOIUrl":"https://doi.org/10.1145/307418.307464","url":null,"abstract":"As the codesign problems become more and more complex, characterizing the scheduling and allocation details of the tasks with macroscopic magnitudes which are easy to handle, can help to solve them in an efficient way.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115003572","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"An efficient reuse system for digital circuit design","authors":"A. Reutter, W. Rosenstiel","doi":"10.1145/307418.307444","DOIUrl":"https://doi.org/10.1145/307418.307444","url":null,"abstract":"In this paper a complete reuse system for digital circuit design is presented. Thereby 'design for reuse' and 'design by reuse' aspects are considered. In particular a repository for IPs with special emphasis on classification and selection, web integration and IP protection is developed. By practising intra-company reuse with our system the efficiency and performance of reuse is demonstrated.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124240565","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
L. Benini, G. Micheli, A. Macii, E. Macii, M. Poncino, R. Scarsi
{"title":"Glitch power minimization by gate freezing","authors":"L. Benini, G. Micheli, A. Macii, E. Macii, M. Poncino, R. Scarsi","doi":"10.1145/307418.307481","DOIUrl":"https://doi.org/10.1145/307418.307481","url":null,"abstract":"This paper presents a technique for glitch power minimization in combinational circuits. The total number of glitches is reduced by replacing some existing gates with functionally equivalent ones (called F-gates) that can be \"frozen\" by asserting a control signal. A frozen gate cannot propagate glitches to its output. An important feature of the proposed method is that it can be applied in-place directly to layout-level descriptions; therefore, it guarantees very predictable results and minimizes the impact of the transformation on circuit size and speed.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123467803","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"OpenJ: an extensible system level design language","authors":"Jianwen Zhu, D. Gajski","doi":"10.1145/307418.307547","DOIUrl":"https://doi.org/10.1145/307418.307547","url":null,"abstract":"There is an increasing research interest in system level design languages which can carry designers from specification to implementation of a system-on-a-chip. Unfortunately two of the most important goals in designing such a language, are at odds with each other: heterogeneity requires components of the system to be captured precisely by domain specific models to simplify analysis and synthesis; simplicity requires a consistent notation to avoid confusion. In this paper, we focus on our effort in resolving this dilemma in an extensible language called OpenJ. In contrast to the conventional monolithic languages, OpenJ has a layered structure consisting of the kernel layer which is essentially an object oriented language designed to be simple, modular and polymorphic; the open layer which exports parameterizable language constructs; the domain layer which precisely captures the computational models essential for embedded systems. The domain layer can be provided by vendors via a common protocol defined by an open layer which enables the supersetting or/and subsetting of the kernel. A compiler has been built for this language and experiments are conducted for popular models such as synchronous, discrete event and dataflow.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128633539","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Emulation of a fast reactive embedded system using a real time operating system","authors":"K. Weiß, Thorsten Steckstor, W. Rosenstiel","doi":"10.1145/307418.307463","DOIUrl":"https://doi.org/10.1145/307418.307463","url":null,"abstract":"This paper presents the emulation of an embedded system with hard real-time constraints and response times of about 220 /spl mu/s. We show that for such fast reactive systems, the software overhead of a real time operating system becomes a limiting factor. We analyze the influence of novel microcontroller features, e.g., different on-chip caches, which tend to accelerate execution, but make it less predictable. These investigations have been conducted using our own emulation environment called SPYDER-CORE-P1.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125308987","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"C for system level design","authors":"G. Arnout","doi":"10.1145/307418.307528","DOIUrl":"https://doi.org/10.1145/307418.307528","url":null,"abstract":"Few people disagree with the fact that today about 80% of a system is software running on a \"platform\" of general purpose or custom processors (CPU and/or DSP) tightly coupled with unique dedicated hardware. This makes C (or C++) an obvious candidate for a system level design language. Without good hardware/software partitioning tools and support for C-based hardware design, the software content may have to increase by necessity. With the right hardware support a system team has the flexibility to make cost, performance, power trade-offs and decide later in the game how much of the system is software and how much is hardware. Another issue is legacy software and hardware. Legacy C software is well understood but legacy hardware is usually only available as RTL (Verilog or VHDL) at best. Therefore the ideal system level design language is C (or C++) based, accommodates hardware design but also co-exists with the vast legacy of Verilog and VHDL based re-usable hardware. CoWare N2C is practical solution, used in real life design around the world, that a) preserves the C software development paradigm for software people, b) adds the necessary clocking to C to enable hardware designers to move C functionality into a hardware architecture, and c) co-exists C for co-design and co-simulation) with existing hardware in Verilog or VHDL.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"248 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125406167","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
R. Cmar, L. Rijnders, P. Schaumont, S. Vernalde, I. Bolsens
{"title":"A methodology and design environment for DSP ASIC fixed point refinement","authors":"R. Cmar, L. Rijnders, P. Schaumont, S. Vernalde, I. Bolsens","doi":"10.1145/307418.307503","DOIUrl":"https://doi.org/10.1145/307418.307503","url":null,"abstract":"Complex signal processing algorithms are specified in floating point precision. When their hardware implementation requires fixed point precision, type refinement is needed. The paper presents a methodology and design environment for this quantization process. The method uses independent strategies for fixing MSB and LSB weights of fixed point signals. It enables short design cycles by combining the strengths of both analytical and simulation based methods.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114543161","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Interpretable symbolic small-signal characterization of large analog circuits using determinant decision diagrams","authors":"S. Tan, C. Shi","doi":"10.1145/307418.307543","DOIUrl":"https://doi.org/10.1145/307418.307543","url":null,"abstract":"A new approach is proposed to generate interpretable symbolic expressions of small-signal characteristics for large analog circuits. The approach is based on a complete, exact, yet compact representation of symbolic expressions via determinant decision diagrams (DDDs). We show that two key tasks of generating interpretable symbolic expressions-term de-cancellation and term simplification-can be performed in linear time in terms of the number of DDD vertices. With the number of DDD vertices many-orders-of-magnitude less than the number of product terms, the proposed approach has been shown to be much more efficient than other start-of-the-art approaches.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128983396","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
D. Nikolos, H. T. Vergos, T. Haniotakis, Y. Tsiatouhas
{"title":"Path delay fault testing of ICs with embedded intellectual property blocks","authors":"D. Nikolos, H. T. Vergos, T. Haniotakis, Y. Tsiatouhas","doi":"10.1145/307418.307468","DOIUrl":"https://doi.org/10.1145/307418.307468","url":null,"abstract":"In this paper we show that the already known method of using multiplexers for making the inputs and outputs of the embedded blocks accessible by the primary ports of the integrated circuit (IC) can be used for path delay fault testing of the IC. We show that the testing of the IC for path delay faults can be reduced to the testing of each block. Intellectual property (IP) blocks are treated as black boxes. The number of circuit paths that must be tested is almost equal to the sum of the paths that must be tested for each block.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129429023","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}