Glitch power minimization by gate freezing

L. Benini, G. Micheli, A. Macii, E. Macii, M. Poncino, R. Scarsi
{"title":"Glitch power minimization by gate freezing","authors":"L. Benini, G. Micheli, A. Macii, E. Macii, M. Poncino, R. Scarsi","doi":"10.1145/307418.307481","DOIUrl":null,"url":null,"abstract":"This paper presents a technique for glitch power minimization in combinational circuits. The total number of glitches is reduced by replacing some existing gates with functionally equivalent ones (called F-gates) that can be \"frozen\" by asserting a control signal. A frozen gate cannot propagate glitches to its output. An important feature of the proposed method is that it can be applied in-place directly to layout-level descriptions; therefore, it guarantees very predictable results and minimizes the impact of the transformation on circuit size and speed.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/307418.307481","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11

Abstract

This paper presents a technique for glitch power minimization in combinational circuits. The total number of glitches is reduced by replacing some existing gates with functionally equivalent ones (called F-gates) that can be "frozen" by asserting a control signal. A frozen gate cannot propagate glitches to its output. An important feature of the proposed method is that it can be applied in-place directly to layout-level descriptions; therefore, it guarantees very predictable results and minimizes the impact of the transformation on circuit size and speed.
通过栅极冻结使故障功率最小化
本文提出了一种组合电路中小故障功率最小化的技术。通过将现有的一些门替换为功能相当的门(称为f门),可以通过断言控制信号来“冻结”,从而减少了故障的总数。一个冻结门不能传播小故障到它的输出。该方法的一个重要特征是可以直接就地应用于布局级描述;因此,它保证了非常可预测的结果,并最大限度地减少了转换对电路尺寸和速度的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信