L. Benini, G. Micheli, A. Macii, E. Macii, M. Poncino, R. Scarsi
{"title":"Glitch power minimization by gate freezing","authors":"L. Benini, G. Micheli, A. Macii, E. Macii, M. Poncino, R. Scarsi","doi":"10.1145/307418.307481","DOIUrl":null,"url":null,"abstract":"This paper presents a technique for glitch power minimization in combinational circuits. The total number of glitches is reduced by replacing some existing gates with functionally equivalent ones (called F-gates) that can be \"frozen\" by asserting a control signal. A frozen gate cannot propagate glitches to its output. An important feature of the proposed method is that it can be applied in-place directly to layout-level descriptions; therefore, it guarantees very predictable results and minimizes the impact of the transformation on circuit size and speed.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/307418.307481","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11
Abstract
This paper presents a technique for glitch power minimization in combinational circuits. The total number of glitches is reduced by replacing some existing gates with functionally equivalent ones (called F-gates) that can be "frozen" by asserting a control signal. A frozen gate cannot propagate glitches to its output. An important feature of the proposed method is that it can be applied in-place directly to layout-level descriptions; therefore, it guarantees very predictable results and minimizes the impact of the transformation on circuit size and speed.