Path delay fault testing of ICs with embedded intellectual property blocks

Abstract

In this paper we show that the already known method of using multiplexers for making the inputs and outputs of the embedded blocks accessible by the primary ports of the integrated circuit (IC) can be used for path delay fault testing of the IC. We show that the testing of the IC for path delay faults can be reduced to the testing of each block. Intellectual property (IP) blocks are treated as black boxes. The number of circuit paths that must be tested is almost equal to the sum of the paths that must be tested for each block.