{"title":"RF-MEMS switchable inductors for tunable bandwidth BAW filters","authors":"S. Aliouane, A. Kouki, R. Aigner","doi":"10.1109/DTIS.2010.5487536","DOIUrl":"https://doi.org/10.1109/DTIS.2010.5487536","url":null,"abstract":"This paper presents a method for reconfiguring the bandwidth of Bulk Acoustic Wave (BAW) ladder filters by adding switchable inductors to their shunt resonators. Inductance values are controlled by selecting the number of turn in spiral inductor using micro-electro-mechanical (MEMS) switches. For this purpose, a MEMS inductor has been designed, fabricated and characterized in terms of inductance value, quality factor, and resonance frequency. A measurement-based model of this inductor has been implemented in a circuit simulator to build a reconfigurable RF Ladder BAW filter intended for handset applications. The simulation results show that, using this switchable inductor, it is possible to increase the filter bandwidth by up to 25% with an improved out-of-band rejection and without degrading its selectivity.","PeriodicalId":423978,"journal":{"name":"5th International Conference on Design & Technology of Integrated Systems in Nanoscale Era","volume":"148 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133957824","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Concentric Circular Array for DOAs estimation of coherent sources with ESPRIT algorithm","authors":"S. Akkar, F. Harabi, A. Gharsallah","doi":"10.1109/DTIS.2010.5487542","DOIUrl":"https://doi.org/10.1109/DTIS.2010.5487542","url":null,"abstract":"In this paper, a novel antenna array shape to estimate the direction of arrival (DOAs) of coherent sources by the ESPRIT algorithm is proposed. The Spatial Smoothing technique (SS) is applied to remove signals' coherence. The excellent performances of the uniform circular geometry are used to provide a good and uniform DOAs estimation in all of the azimuth coverage. Simulation results show that the use of the spatial smoothing technique with the proposed antenna array shape yields significant improved performance in DOAs estimation compared to the original ESPRIT algorithm especially in highly correlated sources situations.","PeriodicalId":423978,"journal":{"name":"5th International Conference on Design & Technology of Integrated Systems in Nanoscale Era","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130934642","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Trends and challenges of SRAM reliability in the nano-scale era","authors":"Seyab Khan, S. Hamdioui","doi":"10.1109/DTIS.2010.5487565","DOIUrl":"https://doi.org/10.1109/DTIS.2010.5487565","url":null,"abstract":"According to the International Technology Roadmap for Semiconductors (ITRS), embedded Static Random Access Memory (SRAM) will continue to dominate the area of System on Chips (SoCs) approaching 90% in the next 10 years. Therefore, SRAM reliability will have a significant impact on overall SoC reliability. This paper presents state-of-the-art transistor failure mechanisms and their impact on SRAM reliability parameters including cell stability, cell read failures, and cell access time failures. Furthermore, different techniques currently employed in industry, to mitigate the impacts of the failure mechanisms are presented. Finally, based on the current scaling trends reliability challenges of future transistors and embedded SRAM are discussed. The discussion concludes that the reliability challenges in future embedded SRAM will increase significantly.","PeriodicalId":423978,"journal":{"name":"5th International Conference on Design & Technology of Integrated Systems in Nanoscale Era","volume":"58 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124354535","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Adaptive image transfer for wireless sensor networks (WSNs)","authors":"Mohsen Nasri, A. Helali, H. Sghaier, H. Maaref","doi":"10.1109/DTIS.2010.5487597","DOIUrl":"https://doi.org/10.1109/DTIS.2010.5487597","url":null,"abstract":"When using wireless sensor networks for real-time data transmission, some critical points should be considered. Restricted computational power, memory limitations, narrow bandwidth and energy supplied present strong limits in sensor nodes. Therefore, maximizing network lifetime and minimizing energy consumption are always optimization goals. To reduce the energy consumption of the sensor network during image transmission, an energy efficient image compression scheme is proposed. The image compression scheme reduces the required memory. To address the abovementioned concerns, in this paper we describe an approach of image transmission in WSNs, taking advantage of JPEG2000 still image compression standard and using MATLAB and C from Jasper. JPEG2000 provides a practical set of features, not necessarily available in the previous standards. These features were achieved using techniques: the Discrete Wavelet Transform (DWT), and Embedded Block Coding with Optimized Truncation (EBCOT). Performance of the proposed image compression scheme is investigated with respect to image quality and energy consumption. Simulation results are presented and show that the proposed scheme optimizes network lifetime and reduces significantly the amount of required memory by analyzing the functional influence of each parameter of this distributed image compression algorithm.","PeriodicalId":423978,"journal":{"name":"5th International Conference on Design & Technology of Integrated Systems in Nanoscale Era","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114606676","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Statistical modeling for dysphonic classification","authors":"Assia Ghelis, M. Guerti, C. Fredouille","doi":"10.1109/DTIS.2010.5487588","DOIUrl":"https://doi.org/10.1109/DTIS.2010.5487588","url":null,"abstract":"The objective of our work is to develop an automatic system to evaluate Arabic/French dysphonic classification by modeling speech signals using a statistical modeling based on a Gaussian Mixture Model (GMM), which is state of art in speaker recognition. Speakers were conducted at Annaba University Hospital center (CHU) in the ENT service in the presence of a group composed of 8 medical specialists. Results of the experiment show that an automatic system is able to identify dysphonic speakers with an acceptable performance either in French or in Arabic language.","PeriodicalId":423978,"journal":{"name":"5th International Conference on Design & Technology of Integrated Systems in Nanoscale Era","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116866669","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
R. Hamila, F. Saidi, H. Maaref, P. Rodriguez, L. Auvray, Y. Monteil
{"title":"Optical properties of BxInyGa1-x-yAs/GaAs grown by Metal Organic Chemical Vapor deposition for solar cell","authors":"R. Hamila, F. Saidi, H. Maaref, P. Rodriguez, L. Auvray, Y. Monteil","doi":"10.1109/DTIS.2010.5487562","DOIUrl":"https://doi.org/10.1109/DTIS.2010.5487562","url":null,"abstract":"The present invention further includes a method for substantially lattice matching single-crystal III–V semiconductor layers by including boron in the chemical structure of active cells layers in multi-junction solar. Solar photovoltaic devices, i.e., solar cells, are devices capable of converting solar radiation into usable electrical energy. The energy conversion occurs as the photovoltaic-effect which occurs in a cell composed of a p-type semiconductor layer adjacent to an n-type semiconductor layer, here after referred to as p-n junction cell. Solar radiation impinging on a solar cell and absorbed by active region of semiconductor material generates electricity. Therefore, a quaternary material III–V semiconductor BInGaAs has been tested for the application in solar cells [1]. Single layer has been grown lattice matched on GaAs using Metal Organic Chemical Vapor deposition (MOCVD). Optical study has been achieved of B0.0108In0.36Ga0.062As quantum well. At room temperature (300 K) PL study has shown an asymmetric PL band is around 1.19 eV of the emission energies. Based in these experimental results, we have suggested that the band gap energies of BInGaAs QW could be adequate for active cells layers in multijunction solar.","PeriodicalId":423978,"journal":{"name":"5th International Conference on Design & Technology of Integrated Systems in Nanoscale Era","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122013004","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
T. Damak, I. Werda, Mohamed Ali Ben Ayad, N. Masmoudi
{"title":"An efficient zero length prefix algorithm for H.264 CAVLC decoder on TMS320C64","authors":"T. Damak, I. Werda, Mohamed Ali Ben Ayad, N. Masmoudi","doi":"10.1109/DTIS.2010.5487543","DOIUrl":"https://doi.org/10.1109/DTIS.2010.5487543","url":null,"abstract":"In this paper, an efficient DSP-based CAVLC decoding design is proposed. CAVLC decoding module takes the lion chair of our decoder execution time due to its complexity. In order to ameliorate CAVLC implementation, two major steps are proposed: First, we take advantage of DSP architecture by organizing its appropriate internal memory buffer to design a suitable CAVLC decoder architecture. Then, a zero length prefix algorithm (ZLP) is proposed to decode the first syntax element in CAVLC, called CoeffToken. This new algorithm permits amelioration in the CAVLC time execution by up to 20% which leads to an increase in the overall decoder speed by 8 fps. The decoder has been tested with different bitstreams. According to these tests, real time decoding can be obtained on a TMS320C6416 platform running at 720MHz.","PeriodicalId":423978,"journal":{"name":"5th International Conference on Design & Technology of Integrated Systems in Nanoscale Era","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130235025","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Design optimization in SOI-based high sensitivity piezoresistive cantilever devices","authors":"Y. Kebbati, M. Boujrharhe","doi":"10.1109/DTIS.2010.5487599","DOIUrl":"https://doi.org/10.1109/DTIS.2010.5487599","url":null,"abstract":"In this work, the authors present the new design of MEMS high-sensitivity piezoresistive cantilever. The prospect is to develop the tactile sensor for space mission. The finite element method with parametric design, carried out using CoventorWare2008, was applied to obtain the most advantageous performance by optimizing shape and geometrical dimension of both cantilever and piezoresistor. The sensor performance was measured on the basis of output voltage and surface stress sensitivity. Frequency and temperature studies were investigated. An analysis was also conducted on the effects of incorporating various stress concentration region designs at the cantilever. Results show that cantilever with “appropriate” shape and structural holes yields maximum stress which results in maximum sensitivity. A comparison between different devices in terms of dimension and shape: cantilever, piezoresistor, holes are presented.","PeriodicalId":423978,"journal":{"name":"5th International Conference on Design & Technology of Integrated Systems in Nanoscale Era","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126398143","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
F. Firouzi, M. Salehi, A. Azarpeyvand, S. M. Fakhraie, F. Wang
{"title":"Reliability considerations in dynamic voltage and frequency scaling schemes","authors":"F. Firouzi, M. Salehi, A. Azarpeyvand, S. M. Fakhraie, F. Wang","doi":"10.1109/DTIS.2010.5487569","DOIUrl":"https://doi.org/10.1109/DTIS.2010.5487569","url":null,"abstract":"Dynamic voltage and frequency scaling (DVFS) is an effective method for controlling both energy and performance of a system. Since the increasing rate of radiation-induced transient faults depends on operating frequency and supply voltage, DVFM techniques are recently shown to have compromising advantages on electronic system reliability. Therefore, ignoring the effects of voltage scaling on fault rate could considerably decrease the system reliability. In this paper we propose a formula for accurate analytic modeling of the soft error rate of a system in which the frequency and voltage are scaled using a DVFS algorithm. The simulation experiments show that, compared with other published models, the results using proposed model are 30% closer to the results from SER estimation algorithm which considers electrical and logical masking for ISCAS85' circuits.","PeriodicalId":423978,"journal":{"name":"5th International Conference on Design & Technology of Integrated Systems in Nanoscale Era","volume":"114 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114232317","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"RESURF nLDMOSFET in 0.351µm BiCMOS technology-characterization and modeling","authors":"M. Abouelatta-Ebrahim, C. Gontrand, A. Zekry","doi":"10.1109/DTIS.2010.5487564","DOIUrl":"https://doi.org/10.1109/DTIS.2010.5487564","url":null,"abstract":"In this paper, an nLDMOS transistor is developed by slight modifications of the base process steps of 0.35µm BiCMOS technology. Extra two masks are used for the formation of the body region (LB-PWELL) and the drift region with slightly added thermal budget and without resorting to high-tilt implants. The proposed device has a breakdown voltage independent of the epitaxial layer thickness. The specific ON-resistance (RON,SP) and the breakdown voltage (BV) are 1.5 mΩ.cm2 and 60V, respectively, so, the device can typically be operated around 42V supply voltage, which is suitable for the new automotive applications. The maximum drain current obtained at VGS of 3.3V is 0.42 mA/µm. A simple subcircuit model for the entire device is built using a two module approach, one for the intrinsic MOS area and the other for the drift region. The PSpice model parameters of the intrinsic MOS part are extracted using a system that links the ICCAP extraction tool with the results of the ISE-TCAD tools. The simulation results using the PSpice model are compared to the results provided by ISE-TCAD tools, and the accuracy at room temperature is less than 5% for the whole voltage domain.","PeriodicalId":423978,"journal":{"name":"5th International Conference on Design & Technology of Integrated Systems in Nanoscale Era","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121083612","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}