Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)最新文献_第8页

Study and mechanism of static scanning laser fault isolation on embed SRAM function fail 嵌入式SRAM功能故障静态扫描激光故障隔离机制研究

Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Pub Date : 2014-09-18 DOI: 10.1109/IPFA.2014.6898202

C. Chen, H. Ng, G. Ang, J. Lam, Z. Mai

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引用次数: 2

Failure analysis of Zn-Mo particle in the molding compound causing gate-source short in non-passivated MOSFET device 非钝化MOSFET器件中成型化合物中Zn-Mo颗粒导致栅源短路的失效分析

Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Pub Date : 2014-09-18 DOI: 10.1109/IPFA.2014.6898140

C. K. Lau, C. H. Tan

引用次数: 1

Failure analysis of off-state leakage in high-voltage word-line decoder circuit of memory device 存储设备高压字行译码电路失态漏电故障分析

Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Pub Date : 2014-09-18 DOI: 10.1109/IPFA.2014.6898183

K. Lai, A. Teng, C. Tu, T. Chang, Julia Hsueh, M.Y. Lee, A. Kuo, Y. Chao, Scott Hu, U. J. Tzeng, C.Y. Lu

引用次数: 1

Cluster matching in time resolved imaging for VLSI analysis 超大规模集成电路分析中时间分辨成像的聚类匹配

Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Pub Date : 2014-09-18 DOI: 10.1109/IPFA.2014.6898157

S. Chef, S. Jacquir, P. Perdu, K. Sanchez, S. Binczak

引用次数: 4

Single bit cell SRAM failure due to titanium particle 钛颗粒导致的单比特单元SRAM故障

Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Pub Date : 2014-09-18 DOI: 10.1109/IPFA.2014.6898134

Rachel Siew, W. F. Kho

引用次数: 1

Bipolar resistive switching in different plant and animal proteins 不同植物和动物蛋白的双极电阻开关

Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Pub Date : 2014-09-18 DOI: 10.1109/IPFA.2014.6898184

A. Bag, M. K. Hota, S. Mallik, C. Maiti

引用次数: 3

Understanding of self-heating enhanced degradation in pLDMOSFETs by MR-DCIV method 用MR-DCIV方法了解pldmosfet的自热增强降解

Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Pub Date : 2014-09-18 DOI: 10.1109/IPFA.2014.6898175

Yandong He, Ganggang Zhang, Xing Zhang

引用次数: 0

Study on the high via resistance by TEM failure analysis 用透射电镜对高过孔电阻失效分析研究

Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Pub Date : 2014-09-18 DOI: 10.1109/IPFA.2014.6898200

Binghai Liu, E. Er, S. Zhao, C. Chen, A. G. Boon, Kunihiko Takahashi, C. Subbu, J. Lam

引用次数: 0

Finding a new type of in-line failure mechanism “Floating Antenna Effect” and its solution 发现了一种新型的在线失效机制“浮动天线效应”及其解决方法

Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Pub Date : 2014-06-01 DOI: 10.1109/IPFA.2014.6898180

Yutian Zhang, Junzhi Sang, Yun Xu, Zhimin Zeng

引用次数: 0

Palladium-copper inter-diffusion during copper activation for electroless Nickel plating process on Copper power metal 铜动力金属化学镀镍过程中铜活化过程中钯铜相互扩散

Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Pub Date : 2014-06-01 DOI: 10.1109/IPFA.2014.6898185

Poo Khai Yee, Wan Tatt Wai, Yong Foo Khong

引用次数: 1