{"title":"High power density and power added efficiency of Al/sub 0.5/In/sub 0.5/P/InGaAs doped-channel HFETs","authors":"H. Chiu, S.C. Yang, Y. Chan, J. Kuo","doi":"10.1109/ICIPRM.2001.929089","DOIUrl":"https://doi.org/10.1109/ICIPRM.2001.929089","url":null,"abstract":"Al/sub 0.5/In/sub 0.5/P/In/sub 0.15/Ga/sub 0.85/As doped-channel HFETs (DCFETs) demonstrate a high breakdown voltage, a high power density, and a high linearity for microwave power device applications due to the improvement of a larger /spl Delta/E/sub c/ (0.45 eV) and a wide bandgap AlInP Schottky layer. The device, biased at V/sub ds/=3.0 V and operated at 2.4 GHz, provided an output power density of 209 mW/mm, a power-added efficiency of 59% and a linear power gain of 17 dB. Two-tone measurement reveals that the 3rd-order inter-modulation at an input power of 0 dBm is -29 dBc and the output intercept point (OIP/sub 3/) is 30.4 dBm for devices with a 1 mm-wide gate.","PeriodicalId":403484,"journal":{"name":"Conference Proceedings. 2001 International Conference on Indium Phosphide and Related Materials. 13th IPRM (Cat. No.01CH37198)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114695051","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
H. Kunzel, R. Gibis, R. Kaiser, S. Malchow, S. Schelhase
{"title":"Status of InP-based metal organic MBE with reference to conventional MBE and MOVPE","authors":"H. Kunzel, R. Gibis, R. Kaiser, S. Malchow, S. Schelhase","doi":"10.1109/ICIPRM.2001.929208","DOIUrl":"https://doi.org/10.1109/ICIPRM.2001.929208","url":null,"abstract":"The applicability of selective area MOMBE for the monolithic integration of optoelectronic devices has been demonstrated. Selective deposition, either selective area or selective infill growth, was successfully applied to accomplish butt-coupling of active laser-type and passive or electro-optic waveguide-type devices in different laboratories. Regarding butt-joints MOMBE basically offers distinct advantages because its growth habit is virtually independent of geometrical mask pattern effects due to the absence of gas-phase related diffusion effects resulting in a simplified deposition process. Development of an optimized MOMBE growth process resulted in vertical sidewalls in combination with uniform material properties up to lateral growth interfaces thus avoiding MOVPE related deficiencies like enhanced growth rates near masked areas limiting compactness of PIC design. Nevertheless, this gain available by MOMBE is contrasted by the enhanced complexity of MOMBE arising from the combination of technical, i.e. need of UHV conditions, and chemical, use of metalorganic sources, challenges.","PeriodicalId":403484,"journal":{"name":"Conference Proceedings. 2001 International Conference on Indium Phosphide and Related Materials. 13th IPRM (Cat. No.01CH37198)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123799839","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Ultrafast optical pulse compression using a semiconductor nonlinear Bragg reflector","authors":"K. Ogawa, Y. Matsui","doi":"10.1109/ICIPRM.2001.929182","DOIUrl":"https://doi.org/10.1109/ICIPRM.2001.929182","url":null,"abstract":"Femtosecond optical pulse compression in a single-path reflection geometry using an InGaAs quantum well/InP/InGaAsP nonlinear Bragg reflector is demonstrated at a wavelength of 1500 nm. Reflected optical pulses from the nonlinear Bragg reflector was compressed due to soliton-like self-pulse-shaping process. Residual group velocity of the reflected pulses is compensated by a dispersive delay line and sub-100-fs pulse compression is realised.","PeriodicalId":403484,"journal":{"name":"Conference Proceedings. 2001 International Conference on Indium Phosphide and Related Materials. 13th IPRM (Cat. No.01CH37198)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121930666","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Selective MOVPE of microarray waveguide for densely integrated photonic devices","authors":"S. Sudo, K. Kudo, K. Mori, T. Sasaki","doi":"10.1109/ICIPRM.2001.929140","DOIUrl":"https://doi.org/10.1109/ICIPRM.2001.929140","url":null,"abstract":"We studied the mask interference effect in selective metal-organic vapor-phase epitaxy (MOVPE) of a microarray optical waveguide. We investigated the characteristics of waveguides having mask interference effects. Based on the experimental results, we developed a method of simulating the characteristics of a microarray waveguide that uses the mask interference constant, which depends on growth pressure. The simulation can account for the experimental results under different growth pressures and should be very useful for designing the microarray waveguides. In particular, we can use it to control the PL-wavelength profile of the microarray waveguide grown under atmospheric pressure, which is important for fabricating densely integrated photonic devices.","PeriodicalId":403484,"journal":{"name":"Conference Proceedings. 2001 International Conference on Indium Phosphide and Related Materials. 13th IPRM (Cat. No.01CH37198)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129445672","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
J. Wiedmann, K. Ebihara, H. Kim, K. Matsui, S. Tamura, B. Chen, S. Arai
{"title":"Deeply etched 1.55 /spl mu/m wavelength distributed-reflector lasers with vertical grating","authors":"J. Wiedmann, K. Ebihara, H. Kim, K. Matsui, S. Tamura, B. Chen, S. Arai","doi":"10.1109/ICIPRM.2001.929008","DOIUrl":"https://doi.org/10.1109/ICIPRM.2001.929008","url":null,"abstract":"A new type of distributed-reflector (DR) laser with a vertically aligned grating (VG) is proposed and was fabricated using CH/sub 4//H/sub 2/ reactive ion etching (RIE) without any regrowth. On the rear facet, a 15-element semiconductor/benzocyclobutene (BCB) distributed Bragg reflector (DBR) was used to increase the output efficiency and to decrease the threshold current. The threshold current was as low as 12 mA and the differential quantum efficiency as high as 42% from the front cleaved facet under room temperature operation for 220-/spl mu/m-long cavity and 6-/spl mu/m-wide stripe devices. GaInAsP VG-DR lasers with a fifth order grating (/spl Lambda/=1200 nm) showed quasi single-mode operation with an SMSR of 35 dB.","PeriodicalId":403484,"journal":{"name":"Conference Proceedings. 2001 International Conference on Indium Phosphide and Related Materials. 13th IPRM (Cat. No.01CH37198)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129082711","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
T. Hussain, B. Shi, C. Nguyen, M. Madhav, M. Sokolich
{"title":"A numerical analysis to study the effects of process related variations in the extrinsic base design on dc current gain of InAlAs/InGaAs/InP DHBTs","authors":"T. Hussain, B. Shi, C. Nguyen, M. Madhav, M. Sokolich","doi":"10.1109/ICIPRM.2001.929096","DOIUrl":"https://doi.org/10.1109/ICIPRM.2001.929096","url":null,"abstract":"The 2-D simulation program DESSIS was used to simulate InAlAs/InGaAs/InP DHBTs and compare the calculated Gummel plots with measurements from experimental devices employing the same structure. The simulations show that a combination of bulk recombination in the intrinsic device and lateral diffusion of minority carriers to the base contact limit the peak gain of these DHBTs; the lateral diffusion of minority carriers is strongly related to both the lateral and vertical placement of the base contact. For an emitter-edge to base-contact distance, W/sub bl/, as low as 200 nm the lateral diffusion component of the base contact is essentially negligible and peak gain is limited largely by bulk recombination. Conversely, for short W/sub bl/ of 20 nm, which would be typical of self-aligned devices, lateral diffusion is the dominant part of base current and hence, the major factor limiting peak gain. The presence of a residual spacer layer in the extrinsic device is shown to accentuate the gain degradation through enhanced space charge recombination and lateral electron diffusion.","PeriodicalId":403484,"journal":{"name":"Conference Proceedings. 2001 International Conference on Indium Phosphide and Related Materials. 13th IPRM (Cat. No.01CH37198)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129829068","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
T. Hirano, A. Ito, T. Sato, F. Ishikawa, H. Hasegawa
{"title":"Electrochemical formation of self-assembled nanopore arrays as templates for MBE growth of InP-based quantum wires and dots","authors":"T. Hirano, A. Ito, T. Sato, F. Ishikawa, H. Hasegawa","doi":"10.1109/ICIPRM.2001.929137","DOIUrl":"https://doi.org/10.1109/ICIPRM.2001.929137","url":null,"abstract":"In this study, attempts were made to optimize the parameters of the electrochemical process to form uniform nanopore arrays in order to utilize them as templates for MBE growth of InP-based quantum wires and quantum dots. Template parameters such as the pore depth, diameter and period were strongly dependent on anodization conditions. Especially, in the pulsed anodization mode, the pore depth could be well controlled in the nanometer range by changing the number of applied pulses. InGaAs MBE growth was attempted using the nanopore templates. Growth of InGaAs in pores took place to a substantial depth of about 100-200 nm. The measured PL spectrum had a new peak at about 1.2 eV in addition to the PL emission from the InP substrate and that of the InGaAs top layer. The new peak was tentatively assigned to be from InGaAs quantum wire arrays embedded in InP pores with a possible alloy composition change.","PeriodicalId":403484,"journal":{"name":"Conference Proceedings. 2001 International Conference on Indium Phosphide and Related Materials. 13th IPRM (Cat. No.01CH37198)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129917815","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Epitaxial growth and amphoteric doping on GaAs (n11)A-oriented substrates","authors":"P. Vaccaro","doi":"10.1109/ICIPRM.2001.929015","DOIUrl":"https://doi.org/10.1109/ICIPRM.2001.929015","url":null,"abstract":"Silicon is widely used as an n-type dopant in GaAs growth by molecular beam epitaxy. However, silicon atoms can be incorporated as acceptors when the substrate is GaAs (n11)A-oriented and n=<3. Moreover, the conduction type can be controlled by adjusting substrate temperature and V/III flux ratio during the growth. Lateral p-n junctions formed at the intersection of different surface orientations can be obtained on patterned substrates. Surface orientations and crystal growth dynamics show a complex interplay that determines the properties of the junctions. Various types of devices based on these lateral p-n junctions, such as light emitting diodes, laser diodes, photodetectors, tunnel diodes and transistors have been proposed and realized. These devices show many peculiarities, and some of them could be advantageous as compared to conventional structures.","PeriodicalId":403484,"journal":{"name":"Conference Proceedings. 2001 International Conference on Indium Phosphide and Related Materials. 13th IPRM (Cat. No.01CH37198)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126884042","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Semiconductor photonic waveguide structures made by a reactive beam etching technique","authors":"S. Oku, Y. Shibata","doi":"10.1109/ICIPRM.2001.929022","DOIUrl":"https://doi.org/10.1109/ICIPRM.2001.929022","url":null,"abstract":"A Br/sub 2/-N/sub 2/ reactive beam etching technique that produces smooth and vertical sidewall etching shapes has been developed and applied to the construction of semiconductor photonic waveguide devices. The low-loss and polarization-insensitive deep-ridge waveguides made by the etching technique have been used to form high performance multimode interference couplers and arrayed waveguide grating filters. Deeply etched submicrometer wide grooves were demonstrated as the surface grating for DFB lasers, which were made without a regrowth process.","PeriodicalId":403484,"journal":{"name":"Conference Proceedings. 2001 International Conference on Indium Phosphide and Related Materials. 13th IPRM (Cat. No.01CH37198)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125263193","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Effects of the barrier height on optical anisotropy of [110]-oriented strained quantum wells","authors":"Y. Kajikawa","doi":"10.1109/ICIPRM.2001.929056","DOIUrl":"https://doi.org/10.1109/ICIPRM.2001.929056","url":null,"abstract":"We theoretically investigate the polarization anisotropies of the interband transitions in strained quantum wells (QWs) grown on [110]-oriented substrates. We adopt the six-band effective-mass theory in which the spin-orbit split-off (SO) bands are included. The polarization-dependent optical matrix elements at the Brillouin zone center in Ga/sub x/In/sub 1-x/P/Al/sub 0.5/In/sub 0.5/P QWs having various well widths grown on [110]GaAs are calculated as functions of Ga content x. Furthermore, the calculation is performed assuming various barrier heights. In is shown that the SO band in the barrier layer has the critical influence on the behavior of the anisotropy of the optical matrix elements when the well width is narrow.","PeriodicalId":403484,"journal":{"name":"Conference Proceedings. 2001 International Conference on Indium Phosphide and Related Materials. 13th IPRM (Cat. No.01CH37198)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125609812","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}