Ruchira Kamdar, Seetharam Gundurao, R. Joshi, N. S. Murty
{"title":"IBM's Blue Logic Design Methodology-Circuits and Physical Design","authors":"Ruchira Kamdar, Seetharam Gundurao, R. Joshi, N. S. Murty","doi":"10.1109/VLSID.2001.10013","DOIUrl":"https://doi.org/10.1109/VLSID.2001.10013","url":null,"abstract":"As the dimensions of ULSI circuits shrink to 0.12 micron and below, to achieve the highest device performance and density many challenges are to be met in designing circuits with performance driven physical design and the wirability of sea of transistors of the order of 100 million. This particular tutorial intends to cover advances in technology, relevant circuit techniques, synthesis and physical design methodology.","PeriodicalId":382435,"journal":{"name":"VLSI design (Print)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132924997","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Low-Power Mobile Wireless Communication System Design: Protocols, Architectures, and Design Methodologies","authors":"A. Raghunathan, S. Dey","doi":"10.1109/VLSID.2001.10011","DOIUrl":"https://doi.org/10.1109/VLSID.2001.10011","url":null,"abstract":"The demand for ubiquitous information access and manipulation (anytime, anywhere computing and communications) has created significant challenges and opportunities for the semiconductor industry. The revenue from wireless voice/data handsets is expected to exceed that from PCs in the near future, and the use of wireless internet access is expected to overtake fixed internet access in the next few years.","PeriodicalId":382435,"journal":{"name":"VLSI design (Print)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122393972","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
J. Sivagnaname, H. Ngo, K. Nowka, R. Montoye, Richard B. Brown
{"title":"Gate-Induced Barrier Field Effect Transistor (GBFET) - A New Thin Film Transistor for Active Matrix Liquid Crystal Display Systems","authors":"J. Sivagnaname, H. Ngo, K. Nowka, R. Montoye, Richard B. Brown","doi":"10.1109/VLSID.2006.93","DOIUrl":"https://doi.org/10.1109/VLSID.2006.93","url":null,"abstract":"Using two-dimensional simulation, we report a new gate-induced barrier field effect transistor (GBFET) which exhibits at least three orders of magnitude less OFF state leakage current when compared to a conventional poly-Si TFT. We demonstrate that the GBFET is completely free of pseudo-subthreshold conduction making it a very attractive device for active matrix liquid crystal display systems.","PeriodicalId":382435,"journal":{"name":"VLSI design (Print)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126487019","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"System Level Testability Issues of Core Based System-on-a-Chip","authors":"V. Ranganatha, R. Sunda","doi":"10.1109/VLSID.2001.10017","DOIUrl":"https://doi.org/10.1109/VLSID.2001.10017","url":null,"abstract":"","PeriodicalId":382435,"journal":{"name":"VLSI design (Print)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129054139","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The New Electronics Industry","authors":"Thomas J. Engibou","doi":"10.1109/VLSID.1996.10019","DOIUrl":"https://doi.org/10.1109/VLSID.1996.10019","url":null,"abstract":"","PeriodicalId":382435,"journal":{"name":"VLSI design (Print)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129735963","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Chandrakasan, K. Keutzer, A. Khandekar, S. Maskara, B. D. Pradhan, M. Srivastava
{"title":"Mobile Communications: Demands on VLSI Technology, Design and CAD","authors":"A. Chandrakasan, K. Keutzer, A. Khandekar, S. Maskara, B. D. Pradhan, M. Srivastava","doi":"10.1109/VLSID.1996.10016","DOIUrl":"https://doi.org/10.1109/VLSID.1996.10016","url":null,"abstract":"Low-power wireless system design requires optimization at all levels of the design abstraction. Sub-1V operation is the key to lowpower design and requires modification of the process technology (e.g., multiple threshold devices, variable threshold devices using bulk biasing or dual-gate SO1 technology, etc.), circuit optimization, and architecture optimization. The CAD tool requirements for these new technologies will be discussed. High-efficiency DC-DC converters are critical for low-voltage and low (and variable) current load operation. Architectural power estimation tools, which accurately model switching activity and interconnect, are the key to fast and efficient exploration of the design space. A systematic approach to low-power design can result in orders of magnitude power reduction.","PeriodicalId":382435,"journal":{"name":"VLSI design (Print)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122035842","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Optimization and Analysis Techniques for the Deep Submicron Regime","authors":"N. Menezes, S. Sapatnekar","doi":"10.1109/VLSID.2001.10019","DOIUrl":"https://doi.org/10.1109/VLSID.2001.10019","url":null,"abstract":"Scaling in the deep submicron (DSM) regime has fundamentally altered the primary issues affecting VLSI design. The emergence of DSM-related problems has resulted in a proliferation of design techniques that attempt to alleviate these newer effects in current flows. However, future design methodologies would be required to undergo a paradigm shift to comprehensively address these problems. A few of these newer problems are listed below:","PeriodicalId":382435,"journal":{"name":"VLSI design (Print)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127062189","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Embedded Memories in System Design: Technology, Application, Design and Tools","authors":"D. Keitel-Schulz, N. Wehn, F. Catthoor, P. Panda","doi":"10.1109/VLSID.2001.10005","DOIUrl":"https://doi.org/10.1109/VLSID.2001.10005","url":null,"abstract":"First, background will be provided on embedded DRAM process, circuit and market issues. The term system-on-silicon has been used to denote the integration of random logic, processor cores, SRAMs, ROMs, and analog components on the same die. But up to recently, one major component had been missing: high-density DRAMs. Today's technologies allow the integration of significant amounts of DRAM memory for applications such as data buffering, picture storage, and program/data storage. In quarter-micron technology, chips with up to 128 Mbit of DRAM and 500 kgates of logic are eminently feasible. This enlarges the system design space tremendously since system architects are no more restricted to standard commodity DRAMs. We will discuss the market for embedded DRAM applications as well as the associated challenges.","PeriodicalId":382435,"journal":{"name":"VLSI design (Print)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116998396","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}