V. Ranganatha, R. Sunda
{"title":"基于核心的片上系统的系统级可测试性问题","authors":"V. Ranganatha, R. Sunda","doi":"10.1109/VLSID.2001.10017","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":382435,"journal":{"name":"VLSI design (Print)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"System Level Testability Issues of Core Based System-on-a-Chip\",\"authors\":\"V. Ranganatha, R. Sunda\",\"doi\":\"10.1109/VLSID.2001.10017\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":382435,\"journal\":{\"name\":\"VLSI design (Print)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"VLSI design (Print)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSID.2001.10017\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"VLSI design (Print)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSID.2001.10017","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0