2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)最新文献_第2页

Total Dose and Single-Event Effects Test Results of the Intersil ISL 70x00SEH Current Sense Amplifier Intersil ISL 70x00SEH电流检测放大器的总剂量和单事件效应试验结果

2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2020-10-01 DOI: 10.1109/RADECS50773.2020.9857707

W. H. Newman, N. V. van Vonno, K. Bernard, D. Wackley, L. Pearce, E. Thomson

引用次数: 0

Alpha, Heavy Ion and Neutron Test Results On 90nm ST BCD-CMOS technology 90nm ST BCD-CMOS工艺的α、重离子和中子测试结果

2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2020-10-01 DOI: 10.1109/RADECS50773.2020.9857678

A. Jain, A. Veggetti, D. Crippa, A. Benfante, S. Gerardin, M. Bagatin, C. Cazzaniga

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Radiation Responses of Fiber Random Gratings 光纤随机光栅的辐射响应

2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2020-10-01 DOI: 10.1109/RADECS50773.2020.9857691

T. Blanchet, A. Morana, E. Marin, Y. Ouerdane, A. Boukenter, C. Hnatovsky, P. Lu, S. Mihailov, S. Girard

{"title":"Radiation Responses of Fiber Random Gratings","authors":"T. Blanchet, A. Morana, E. Marin, Y. Ouerdane, A. Boukenter, C. Hnatovsky, P. Lu, S. Mihailov, S. Girard","doi":"10.1109/RADECS50773.2020.9857691","DOIUrl":"https://doi.org/10.1109/RADECS50773.2020.9857691","url":null,"abstract":"Fiber Bragg Gratings (FBGs) present numerous advantages for strain or temperature monitoring as the multiplexing ability or the high acquisition rate of interrogators. However, one FBG of the usual types cannot discriminate between temperature and strain. The new Fiber Random Gratings (FRG) present a large spectrum as opposite to the usual Bragg peak and the whole spectrum shifts varying the temperature or strain. By separating this large spectral band into smaller domains and by monitoring the response of each domain to temperature and strain, discriminating the temperature and strain contributions becomes feasible with a unique sensor. In this abstract, we study for the first time the radiation response of a type I FRG inscribed into a Ge-doped fiber with a fs-laser. Its thermal stability was checked by performing 3 cycles between $20^{circ}mathrm{C}$ and $60^{circ}mathrm{C}$ with 2 hours lasting step of $10^{circ}mathrm{C}$. This grating was irradiated at room temperature (RT) under X-rays, at a dose rate of 1 $mathbf{Gy}(mathbf{SiO}_{2})/mathbf{s}$ up to the dose of 225 kGy. We observed a spectrum shift of approximatively 15 pm, independently of the spectral region, at the maximal dose, which represents an error of $sim 1^{circ}mathrm{C}$ if the grating is used as a temperature sensor. The responses of several other RFBGs inscribed in different conditions will be added for the conference and final paper.","PeriodicalId":371838,"journal":{"name":"2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"300 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133170078","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Heavy Ion and Proton Induced Single Event Effects on Microchip RT PolarFire FPGA 重离子和质子诱导的单事件效应对Microchip RT PolarFire FPGA的影响

2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2020-10-01 DOI: 10.1109/RADECS50773.2020.9857704

N. Rezzak, J.J. Wang, R. Chipana, C. Lao, G. Bakker, F. Hawley, E. Hamdy

引用次数: 1

A Novel Propagation Model for Heavy-Ions Induced Single Event Transients on 65nm Flash-based FPGAs 基于65nm闪存的fpga上重离子诱导单事件瞬态的新传播模型

2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2020-10-01 DOI: 10.1109/RADECS50773.2020.9857686

B. Du, M. Colucci, S. Francola, L. Aranci, E. Artina, N. Ratti, E. Picardi, R. Mancini, V. Piloni, S. Azimi, L. Sterpone

引用次数: 1

Total Ionizing Dose Hardness Enhancement at Room Temperature in CMOS 0.25µm Technology CMOS 0.25µm技术室温下总电离剂量硬度增强

2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2020-10-01 DOI: 10.1109/RADECS50773.2020.9857680

G. Cussac, L. Artola, T. Nuns, S. Ducret

引用次数: 0

Total Ionizing Dose Response of Commercial Off-The-Shelf Microcontrollers and Operational Amplifiers 商用现成微控制器和运算放大器的总电离剂量响应

2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2020-10-01 DOI: 10.1109/RADECS50773.2020.9857725

J. Armani, S. Blairon, Alejandro Ureña-Acuña

引用次数: 0

SEE Testing on commercial power MOSFETs 商用功率mosfet的SEE测试

2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2020-10-01 DOI: 10.1109/RADECS50773.2020.9857706

P. Fernandez-Martínez, Athina Papadopoulou, S. Danzeca, G. Foucard, R. García Alía, M. Kastriotou, C. Cazzaniga, Giorgos Tsiligiannis, R. Gaillard

引用次数: 0

Compendium of Single Event Effects Test Results for Selected Integrated Circuits 选定集成电路单事件效应试验结果汇编

2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2020-10-01 DOI: 10.1109/RADECS50773.2020.9857696

S. C. Witczak, Jeremiah J. Horner, James Hack, N.P. Goldstein, Paul Dudek, Brainton Song, S. Messenger, Glen E. Macejik, Thomas J. Knight

引用次数: 0

Electron induced SEU and MBU sensitivity of 20-nm planar and 16-nm FinFET SRAM-based FPGA 基于20纳米平面和16纳米FinFET sram的FPGA的电子诱导SEU和MBU灵敏度

2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2020-10-01 DOI: 10.1109/RADECS50773.2020.9857681

G. Augustin, M. Mauguet, N. Andrianjohany, N. Sukhaseum, N. Chatry, F. Bezerra

{"title":"Electron induced SEU and MBU sensitivity of 20-nm planar and 16-nm FinFET SRAM-based FPGA","authors":"G. Augustin, M. Mauguet, N. Andrianjohany, N. Sukhaseum, N. Chatry, F. Bezerra","doi":"10.1109/RADECS50773.2020.9857681","DOIUrl":"https://doi.org/10.1109/RADECS50773.2020.9857681","url":null,"abstract":"The electron induced SEU risk on Earth missions is usually considered as negligible, though previous works have demonstrated that electrons could trigger SEU in CMOS devices. In fact, the high energy electron fluxes are too low in Earth space environment to represent a real threat, from the SEE point of view, in currently used device technologies for space applications. Nevertheless, the increasing use of highly integrated CMOS technologies raises the question of the SEU electron sensitivity in the most recent technology nodes. Moreover, if the SEU sensitivity becomes significant in sub-28-nm devices, the system reliability may also be affected by the MBU risk. This work investigates about the electron induced SEU sensitivity of recent CMOS technologies. The related question of the MBU risk due to electrons in space environment is also studied. The devices exposed to electron beams are SRAM-based Xilinx FPGA manufactured in 20-nm planar and 16-nm FinFET technologies. Detailed 3D device circuit models were done with TRADCARE®. This tool was also used as interface to GEANT4 for forward Monte-Carlo simulations. An SRAM cell electrical layout was also implemented in TRADCARE to consider the electrical behaviour of the circuit. The TRADCARE/GEANT4 calculation outputs were used to explain and discuss the experimental sensitivities observed under 18 MeV electron beam.","PeriodicalId":371838,"journal":{"name":"2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126712122","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0