Alpha, Heavy Ion and Neutron Test Results On 90nm ST BCD-CMOS technology

Abstract

This paper presents design, implementation, test methodology and results for radiation qualification on 90nm ST BCD CMOS technology platform. The radiation test is performed with alpha particles, heavy ions and neutron. The results obtained are analyzed and correlated with CAD data. Further the effectiveness of prominent radiation hardening techniques is also studied which can make the technology usable for very low error rate applications such as automotive, medical and space.